Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 2326 - 2350 of 2915

Metrology for the Electrical Characterization of Semiconductor Nanowires

November 1, 2008
Author(s)
Curt A. Richter, Hao Xiong, Xiaoxiao Zhu, Wenyong Wang, Vincent M. Stanford, Woong-Ki Hong, Takhee Lee, D. E. Ioannou, Qiliang Li
Nanoelectronic devices based upon self-assembled semiconductor nanowires are excellent research tools for investigating the behavior of structures with sub-lithographic features as well as a promising basis for future information processing technologies

Uncertainties in Scaling Factors for ab Initio Vibrational Frequencies

September 1, 2005
Author(s)
Karl K. Irikura, Russell D. Johnson III, Raghu N. Kacker
Vibrational frequencies determined from ab initio calculations are often scaled by empirical factors. An empirical scaling factor partially compensates for the errors arising from vibrational anharmonicity and incomplete treatment of electron correlation

Boundary Lubricated Wear

July 15, 2005
Author(s)
Stephen M. Hsu, R G. Munro, M C. Shen, Richard S. Gates
This chapter reviews the fundamental nature of wear under lubricated conditions and presents a comprehensive view of our current understanding of the wear processes under boundary lubrication conditions. Wear under lubricated conditions can be classified

Water Distribution Within Immersed Polymer Films

February 1, 2005
Author(s)
B D. Vogt, Christopher Soles, Vivek Prabhu, Sushil K. Satija, Eric K. Lin, Wen-Li Wu
The emergence of immersion lithography as a potential alternative for the extension of current lithography tools will require a fundamental understanding of the interactions between the photoresist and the immersion liquid such as water. The water

Quantum-Based Microwave Power Measurements: Proof-of-Concept Experiment

August 1, 2004
Author(s)
Thomas P. Crowley, E. A. Donley, T P. Heavner
An initial proof-of-concept experiment to measure microwave power based on quantum-mechanical principles is presented. Ground state cesium atoms exposed to 9.192631770 GHz microwave oscillate between two hyperfine states at a rate that is proportional to

Quantum-Based Microwave Power Measurements: Proof-Of-Concept Experiment

August 1, 2004
Author(s)
Thomas P. Crowley, E. A. Donley, T P. Heavner
An initial proof-of-concept experiment to measure microwave power based on quantum-mechanical principles is presented. Ground state cesium atoms exposed to 9.192631770 GHz microwave oscillate between two hyperfine states at a rate that is proportional to

Measuring residual resistivity ratio of high-purity Nb

July 27, 2004
Author(s)
Loren F. Goodrich, Theodore C. Stauffer, Jolene Splett, Dominic F. Vecchia
We compared methods of measuring the residual resistivity ratio (RRR) of high-purity Nb using transport current. Our experimental study is intended to answer some fundamental questions about the best measurement for RRR and the biases that may exist among

Detection of Trace Water in Phosphine with Cavity Ring-down Spectroscopy

January 1, 2003
Author(s)
Susan Y. Lehman, Kristine A. Bertness, Joseph T. Hodges
Water is a detrimental impurity even at concentrations of 10 nmol/mol or less in source gases for compound semiconductor epitaxial growth. Oxygen complexes from water incorporation cause degraded luminescent efficiency and reduced minority carrier

Fluorescence Intermittency in Single InP Quantum Dots

October 1, 2001
Author(s)
M Kuno, D P. Fromm, Alan Gallagher, David Nesbitt, O I. Micic, A J. Nozik
Fluorescence kinetics of isolated colloidal InP quantum dots (Qds) are investigated for the first time via confocal single molecule microscopyFluorescenceintermittency or blinking is observed in all QD's sampled, characterized by abrupt chanc,yes between

NIST Recommended Practice Guide: Particle Size Characterization

January 1, 2001
Author(s)
Ajitkumar Jillavenkatesa, Lin-Sien H. Lum, Stanley Dapkunas
This guide is a compilation of essential facts and some fundamental information about commonly used techniques of particle size analysis in the ceramics industry. The guide is designed for the non- expert who may have some or little previous knowledge

Chlorination in Combustion Systems

December 1, 2000
Author(s)
Wing Tsang, Valeri I. Babushok
This paper is concerned with the formation of polychorinated organics in the gas phase in combustion systems. The results are derived from simulation studies with inputs from the fundamental kinetics of single step thermal gas phase reactions. Attention is
Displaying 2326 - 2350 of 2915
Was this page helpful?