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NIST Authors in Bold

Displaying 576 - 600 of 2904

Isotopic Ratio Measurements by Time-of-Flight Secondary Ion Mass Spectrometry

July 1, 2001
Author(s)
Albert J. Fahey, S R. Messenger
… Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is often considered … synonymous with SIMS in the static limit where the ion fluence on the sample surface is so low that damage is … been ruled out. However, the high spatial resolution Ga+ ion beams typically used in ToF-SIMS make it a potentially …

Preparation of entangled states through Hilbert space engineering

September 28, 2016
Author(s)
Yiheng Lin, John P. Gaebler, Florentin Reiter, Ting R. Tan, Ryan S. Bowler, Yong Wan, Adam C. Keith, Emanuel Knill, Kevin Coakley, Dietrich Leibfried, David J. Wineland, Scott Glancy
… such as fluctuations in laser intensity and frequency, and ion-motion frequencies. …

Ultrashallow Depth Profiling with Time-of-flight Secondary Ion Mass Spectrometry

January 1, 1994
Author(s)
J. Bennett, John A. Dagata
… Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is an efficient, sensitive … of TOF-SIMS ultrashallow depth profiling is demonstrated ion GaAs substrates that were passivated with P2S5 solutions … Ultrashallow Depth Profiling with Time-of-flight Secondary Ion Mass Spectrometry …

Tunnel junction sensors for HCI-surface measurements at low kinetic energies

January 25, 2013
Author(s)
Joshua M. Pomeroy, Russell E. Lake
… created by particle surface interactions. Highly charged ion (HCI) produced nanofeatures have been the focus of our … due a direct vacuum connection to the NIST electron beam ion trap (EBIT). Using these sensors, we have been able to … Highly charged ions, electron beam ion trap, tunnel junction sensors, stopping power …

An Unconventional Tradespace of Focused-Ion-Beam Machining

June 20, 2022
Author(s)
Andrew Madison, John S. Villarrubia, Kuo-Tang Liao, Joshua Schumacher, Kerry Siebein, Robert Ilic, James Alexander Liddle, Samuel M. Stavis
… focused-ion-beam machining, resolution, throughput, chromia, silica … An Unconventional Tradespace of Focused-Ion-Beam Machining …

Effects of an Oscillating Electric Field on and Dipole Moment Measurement of a Single Molecular Ion

May 31, 2023
Author(s)
Alejandra Collopy, Julian Schmidt, Dietrich Leibfried, David Leibrandt, Chin-wen Chou
… (rf) electric field experienced by a molecular ion in an rf Paul trap, a leading systematic in the … uncertainty of the field-free rotational transition. The ion is deliberately displaced to sample different known rf … comb which probes rotational transitions in the molecular ion. With improved coherence of the comb laser, a fractional …

Coherently displaced oscillator quantum states of a single trapped atom

June 11, 2019
Author(s)
Katherine C. McCormick, Jonas Keller, David J. Wineland, Andrew C. Wilson, Dietrich Leibfried
… harmonic oscillator number states of a harmonically bound ion can be coupled to two internal states of the ion by a laser-induced motional sideband interaction. The … detuning of the displacement drive with respect to the ion's motional frequency. We precisely characterize the …

Uranium Ion Yields from Monodisperse Uranium Oxide Particles

February 24, 2016
Author(s)
Nicholas E. Sharp, John D. Fassett, David S. Simons
… Secondary ion mass spectrometry (SIMS) plays an important role in … isotopic measurements. The influence of primary ion beam species and polarity on U+ sample utilization … [2]. However, the effect of sample substrate on uranium ion production efficiency and sputtering profile has not been …

The NIST EBIT; A Progress Report

January 1, 1993
Author(s)
John D. Gillaspy, J R. Roberts, Craig M. Brown, Uri Feldman
… (1993 publication) The invention of the Electron Beam Ion Trap (EBIT) at Livermore has marked the emergence of a … atoms, EBIT, electron beam ion trap, highly charged atoms …

High-Resolution Structural Study of Zinc Ion Incorporation at the Calcite Cleavage Surface

October 12, 2021
Author(s)
L Cheng, N Sturchio, Joseph Woicik, K Kemner, P Lyman, Michael Bedzyk
… used to determine the atomic-scale structure of the Zn 2+ ion incorporated at the CaCO 3 (1014) surface by adsorption … Zn-O nearest-neighbor distance. Relaxation of the Zn 2+ ion in the out-of-plane direction is indicated by the … High-Resolution Structural Study of Zinc Ion Incorporation at the Calcite Cleavage Surface …

Exfoliated transition metal dichalcogenide (TMD) nanosheets for supercapacitor and sodium ion battery applications

August 14, 2019
Author(s)
Jonathan Turley, Santanu Mukherjee, Elisabeth Mansfield, Jason Holm, Lamuel David, Gurpreet Singh
… regarding the safety, flammability and hazards posed by Li-ion systems has led to the research of alternative rechargeable metal-ion electrochemical storage technologies. Among the most notable of these are the Na-ion supercapacitors and batteries, motivated in part because …

Measurement of the 2P1/2-2P3/2 fine structure splitting in fluorine-like Kr, W, Re, Os and Ir

September 2, 2020
Author(s)
Galen O'Neil, Samuel C. Sanders, Paul Szypryt, Dipti Goyal, Amy Gall, Yang Yang, Samuel M. Brewer, William Doriese, Joseph Fowler, Daniel Swetz, Joseph Tan, Joel Ullom, Andrey V. Volotka, Endre Takacs, Yuri Ralchenko
… energy in F-like ions using the NIST electron beam ion trap and extreme-ultraviolet and x-ray spectrometers. … electrodynamics, fine structure splitting, electron beam ion trap, x-ray spectrometers …

Quantum information processing and multiplexing with trapped ions

January 1, 2003
Author(s)
David J. Wineland, Dietrich G. Leibfried, B. L. DeMarco, V Meyer, M A. Rowe, A Ben kish, Murray D. Barrett, Joseph W. Britton, J Hughes, Wayne M. Itano, Branislav M. Jelenkovic, Christopher Langer, D Lucas, Till P. Rosenband
… quantum-state synthesis and control of trapped atomic ions. This work has the overall goal of performing … information processing and multiplexing with trapped ions …

Towards quantum information with trapped ions at NIST

January 1, 2003
Author(s)
Dietrich G. Leibfried, B. L. DeMarco, V Meyer, M A. Rowe, A Ben-kish, Murray D. Barrett, Joseph W. Britton, J Hughes, Wayne M. Itano, Branislav M. Jelenkovic, Christopher Langer, D Lucas, Till P. Rosenband, David J. Wineland
… quantum-state synthesis and the control of trapped atomic ions. This work has the overall goal of performing … Towards quantum information with trapped ions at NIST …

Overview of Recent Atomic Spectroscopy At The NIST EBIT

May 5, 2012
Author(s)
John Gillaspy
Seven papers published by the NIST EBIT spectroscopy team and collaborators from mid-2009 to mid-2011 are summarized. Previous discussions of the D-lines in Na-like ions and the Lyman-alpha lines in H-like ions are updated with new information. Nine issues

Phase-coherent detection of an optical dipole force by Doppler velocimetry

May 10, 2011
Author(s)
Michael J. Biercuk, Hermann Uys, Joseph W. Britton, Aaron Vandevender, John J. Bollinger
… Doppler detection of optical dipole forces using large ion crystals in a Penning trap. The technique is based on … in 9Be+ near 313 nm and the center-of-mass (COM) ion motional mode. The optical dipole force is tuned to … detailed characterization of motional modes in complex ion crystals and provides frequency discrimination below the …
Displaying 576 - 600 of 2904
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