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Displaying 101 - 125 of 1184

Local structural distortions in strained BaSrTiO3 thin films

September 28, 2017
Author(s)
Joseph C. Woicik, Eric L. Shirley, Keith Gilmore, K E. Andersen, C S. Hellberg
The local atomic structures in Ba0.5Sr0.5TiO3 thin films grown on MgO(001) substrates have been determined by density functional theory calculations and Ti K-edge x-ray absorption fine-structure measurements. Films with either c > a or c

Effect of Collagen in Calcium Phosphate Cement on Mechanical and Cellular Properties

December 23, 2008
Author(s)
Jennifer L. Moreau, Michael Weir, Hockin D. Xu
… with 0 % collagen, to (430 103) J/m2 for CPC containing 4.05 % collagen (p < 0.05), at a CPC powder to liquid (P/L) ratio of 2.5. At P/L = … (22.2 3.8) J/m2 without collagen, to (381 119) J/m2 with 4.05 % collagen (p < 0.05). At P/L of 3 and 2.5, collagen …

Modal Reconstruction of Aspheric Surfaces from Experimental Second Derivatives

January 1, 2005
Author(s)
Nadia Machkour-Deshayes, Ulf Griesmann, Byoung C. Kim
A method for the measurement of precise aspheric optical surfaces based on measurements of the second derivatives of the surface is evaluated. A compact phase-measuring interferometer is used to determine the second derivatives of a surface on a survey

An International Comparison of 50/60 Hz Power (1996-1999)

April 1, 2001
Author(s)
Nile M. Oldham, Thomas L. Nelson, R. Bergeest, G. Ramm, R. Carranza, A. C. Corney, M. Gibbes, Gregory Kyriazis, H. Laiz, L. X. Liu, Z. Lu, U. Pogliano, K. E. Rydler, E. Shapiro, E. So, M. Temba, P. Wright
An international comparison of 50/60 Hz power is described. The traveling standard was an electronic power transducer which was tested at 120 volts, 5 amperes, 53 hertz, at five power factors (1.0, 0.5 lead, 0.5 lag, 0.0 lead, and 0.0 lag). Fifteen

International Comparison of 50/60 Hz Power (1996-1999)

May 1, 2000
Author(s)
Nile M. Oldham, Thomas L. Nelson, R. Bergeest, R. Carranza, M. Gibbes, K Jones, Gregory Kyriazis, H. Laiz, L. Liu, Z. Lu, U. Pogliano, K. E. Rydler, E. Shapiro, E. So, M. Temba, P. Wright
An International Comparison of 50/60 Hz Power is described. The traveling standard was an electronic power transducer which was tested at 120 volts, 5 amperes, 53 hertz, at five power factors (1.0, 0.5 lead, 0.5 lag, 0.0 lead, and 0.0 lag). Fifteen

Proton and Ammonia Intercalation into Layered Iron Chalcogenides

June 25, 2018
Author(s)
Xiuquan Zhou, Brandon Wilfong, Sz-Chian Liou, Halyna Hodovanets, Craig Brown, Efrain E. Rodriguez
Structurally related to the iron-based superconductors, two new intercalated iron chalcogenides (H 0.5NH 3)Fe 2Ch 2 where Ch = S, Se have been prepared. By topochemical conversion, the protons were exchanged by lithium to form (Li 0.5NH 3)Fe 2Ch 2

Effect of Nitrogen on Band Alignment in HfSiON Gate Dielectrics

November 22, 2005
Author(s)
Safak Sayan, Nhan V. Nguyen, James R. Ehrstein, James J. Chambers, Mark R. Visokay, Manuel Quevedo-Lopez, Luigi Colombo, T Yoder, Igor Levin, Daniel Fischer, M Paunescu, Ozgur Celik, Eric Garfunkel
We have studied the band alignment of HfSiO and HfSiON films by soft x-ray photoemission (SXPS), oxygen K-edge x-ray absorption (XAS), and spectroscopic ellipsometry. Nitridation of HfSiO reduced the band gap by 1.50+- 0.05eV and the valence and conduction

Structural and Dynamical Trends in Alkali-Metal Silanides Characterized by Neutron-Scattering Methods

September 2, 2016
Author(s)
Wan Si NMN Tang, Mirjana NMN Dimitrievska, Jean-Noel Chotard, Wei Zhou, Raphael Janot, Alexander V. Skripov, Terrence J. Udovic
Structural, vibrational, and dynamical properties of the mono- and mixed-alkali silanides (MSiH 3, where M=K, Rb, Cs, K 0.5Rb 0.5Cs 0.5, and Rb 0.5Cs 0.5) were investigated by various neutron experiments, including neutron powder diffraction (NPD), neutron

Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining

August 1, 2000
Author(s)
Howard W. Yoon, Matthew A. Davies, Timothy J. Burns, Michael Kennedy
A critical parameter in predicting tool wear during machining and in accurate computer simulations of machining is the spatially-resolved temperature at the tool-chip interface. We describe the development and the calibration of a nearly diffraction

Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining

April 1, 2000
Author(s)
Michael Kennedy, Matthew A. Davies, Howard W. Yoon, Timothy J. Burns
A critical parameter in predicting tool wear during machining and in accurate computer simulations of machining is the spatially-resolved temperature at the tool-chip interface. We describe the development and the calibration of a nearly diffraction
Displaying 101 - 125 of 1184
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