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Displaying 951 - 975 of 1184

Proximity-associated errors in contour metrology

March 31, 2010
Author(s)
John S. Villarrubia, Ronald G. Dixson, Andras Vladar
In contour metrology the CD-SEM (critical dimension scanning electron microscope) assigns a continuous boundary to extended features in an image. The boundary is typically assigned as a simple function of the signal intensity, for example by a brightness

Certification of Drugs of Abuse in a Human Serum Standard Reference Material: SRM 1959

March 24, 2010
Author(s)
Susan S. Tai, Jocelyn L. Prendergast, Lorna T. Sniegoski, Michael J. Welch, Karen W. Phinney, Nien F. Zhang
A new Standard Reference Material (SRM) for drugs of abuse in human serum (SRM 1959) has been developed. SRM 1959 is a frozen human serum material fortified with seven drugs of abuse, benzoylecgonine (BZE), methadone (METH), methamphetamine (MAMP)

Fourier Transform Spectrometry with a Near Infrared Supercontinuum Source

May 1, 2009
Author(s)
Chris A. Michaels, Tony Masiello, Pamela M. Chu
Optical fiber based supercontinuum light sources combine the brightness of lasers with the broad bandwidth of incandescent lamps and thus are promising candidates for sources in spectroscopic applications requiring high brightness and broad bandwidth. Near

Preparation and Characterization of Patchy Particles

November 14, 2008
Author(s)
Thuy Chastek, Steven D. Hudson, Vincent A. Hackley
The self-assembled organization of partilces depends on the symmetry of their interactions, and strides are being made in producing nanoaparticles of controlled shape and functionalization. This paper describes the use of particles adsorption to control

Measurement of 100 nm and 60 nm Particle Standards by Differential Mobility Analysis

August 1, 2006
Author(s)
George W. Mulholland, Michelle K. Donnelly, Robert C. Hagwood, S R. Kukuck, Vincent A. Hackley, D Y. Pui
The peak particle size and expanded uncertainties (95 % confidence interval) for two new particle calibration standards are measured as 101.60 nm ? 1.02 nm and 60.68 nm ? 0.59 nm. The particle samples are polystyrene spheres suspended in filtered

Phase Formation, Crystal Chemistry, and Properties in the Magnetic Dielectric System Bi 2 O 3- Fe 2 O 3- Nb 2 O 5

June 22, 2006
Author(s)
M W. Lufaso, Terrell A. Vanderah, I M. Pazos, Igor Levin, Juan C. Nino, Virgil Provenzano, Peter K. Schenck, Robert S. Roth
Subsolidus phase relations have been determined for the Bi2O3-Fe2O3-Nb2O5 system in air (900-1075 C). Three new ternary phases were observed Bi3Fe0.5Nb1.5O9 with an Aurivillius-type structure, and two phases with approximate stoichiometries Bi17Fe2Nb31O106

Fast Setting CPC-Chitosan Composite: Mechanical Properties and Dissolution Rates

March 16, 2006
Author(s)
Limin Sun, Hockin D. Xu, Shozo Takagi, Laurence C. Chow
… as the fraction of mass loss vs. immersion time from 7 d to 28 d. The CPC-chitosan composite with 20 wt% chitosan … rates (fraction of mass loss per day, wt%/d) were 1.05 for CPC control and 1.08 for CPC-chitosan. In summary, a …

Extinguishment of Cup-Burner Flames in Low Gravity

January 1, 2005
Author(s)
F Takahashi, Gregory T. Linteris, V Katta
… environments were:Experiment Computation Air/1g/1 atm (15.7 0.6) % 14.5 % (16.1 %) Air/1g/0.7 atm (15.4 0.5) % 13.5 % 30 % O2/1g/1 atm (34.0 1.2) % 31.0 % 30 % O2/1g/0.7 atm (32.4 1.1) % 29.9 % 21 % O2/ g/1 atm (21.4 0.7) % 19.1 …

Certification of a Polystyrene Synthetic Polymer, SRM 2888

November 1, 2003
Author(s)
Charles M. Guttman, William R. Blair, B M. Fanconi, R J. Goldschmidt, William E. Wallace, S Wetzel, David L. VanderHart
… M w of SRM 2888 was determined by light scattering to be 7.19 x 10 +3 g/mol with a sample standard deviation of 0.14 x … by NMR analysis of the end groups and found to be 7.05 x 10 +3 g/mol with an estimated expanded uncertainty of …

NbN Film Development for PHEB Devices

September 1, 2002
Author(s)
Eyal Gerecht, V. A. Bhupathiraju, Erich N. Grossman, Jeffrey W. Nicholson, Fernando Rodriguez-Morales, Dazhen Gu, Sigfrid Yngvesson
We have developed a process for fabricating a thin NbN film at the National Institute of Standards and Technology in Boulder, CO. A two-fold approach can be taken. The first is to maximize the critical temperature of the superconducting device (growing
Displaying 951 - 975 of 1184
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