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NIST Authors in Bold

Displaying 1226 - 1250 of 2521

Identifying and Estimating Cybersecurity Risk for Enterprise Risk Management

December 17, 2025
Author(s)
Stephen Quinn, Nahla Ivy, Matthew Barrett, Larry Feldman, Greg Witte, Robert Gardner
This document supplements NIST Interagency Report (IR) 8286, Integrating Cybersecurity and Enterprise Risk Management (ERM), by providing additional detail regarding risk guidance, identification, and analysis. This report offers examples and information

Fiscal Year 2024 Annual Report for NIST Cybersecurity and Privacy Program

April 28, 2025
Author(s)
Patrick O'Reilly, Kristina Rigopoulos
Throughout Fiscal Year 2024 (FY 2024) — from October 1, 2023, through September 30, 2024 — the NIST Information Technology Laboratory (ITL) Cybersecurity and Privacy Program successfully responded to numerous challenges and opportunities in security and

A graph-theoretic approach to analyzing decoding failures of BIKE

October 25, 2024
Author(s)
Sarah Arpin, Tyler Raven Billingsley, Daniel Rayor Hast, Jun Bo Lau, Ray Perlner, Angela Robinson
… in the NIST Post-Quantum Standardization process, at the 20-bit security level using graph-theoretic approaches. We … size r = 587, the decoder reaches a fixed point within 7 iterations. We then consider the corresponding Tanner …

Renewable Standard Reference Material for the Detection of TP53 Mutations

October 12, 2021
Author(s)
C D. O'Connell, L A. Tully, J E. Devaney, M A. Marino, J P. Jakupciak, Donald H. Atha
It is important to have standards for use in mutation detection systems to monitor the sensitivity of mutation detection and the possible introduction of errors during amplification and separation procedures. We have developed 12 plasmid clones containing

Tailoring the High-K Gate Dielectric/Sillicon Interface for CMOS Applications

October 12, 2021
Author(s)
Y S. Lin, R Puthenkovilakam, J P. Chang, C P. Bouldin, Igor Levin, Nhan Van Nguyen, Y Sun, P Pianetta, T Conard, W Vandervorst, V Venturo, S Selbrede
… of difference} 1.3 nm and a dielectric constant of 20.5 with leakage current of 3.2 x 10 -3 A/cm 2 at 1.5V. the … the overall dielectric constant was reduced to 15.7. For NH 3 annealing, ZrO 2 underwent nitridation and the …

Response Time Impact of Smoke Alarms

September 9, 2021
Author(s)
Stanley W. Gilbert, Thomas Cleary, Paul A. Reneke, Richard Peacock, David Butry
… without an alarm, having a fire at night adds on average 20.5 (± 0.024). Smoke alarms are more effective at night, …

Post-Quantum Cryptography and 5G Security: Tutorial

May 15, 2019
Author(s)
T. Charles Clancy, Robert W. McGwier, Lidong Chen
The Fifth Generation (5G) mobile broadband standards make a fundamental shift in cryptography. Prior generations based their security and privacy principally on symmetric key cryptography. The Subscriber Identity Module (SIM) and its successors contain a

Millimeter-Wave Propagation Channels vs. Synthetic Beamwidth

December 7, 2018
Author(s)
Roy Sun, Camillo A. Gentile, Jelena Senic, Peter G. Vouras, Peter B. Papazian, Nada T. Golmie, Catherine A. Remley
… path loss of an optimized beam-center orientation is over 20 dB smaller than other beam-center orientations. The impact …

Towards superconductivity in p-type delta-doped Si/Al/Si heterostructures

July 30, 2018
Author(s)
Aruna N. Ramanayaka, Hyun Soo Kim, Joseph A. Hagmann, Roy E. Murray, Ke Tang, Neil M. Zimmerman, Curt A. Richter, Joshua M. Pomeroy, Frederick Meisenkothen, Huairuo Zhang, Albert Davydov, Leonid A. Bendersky
… measurements yield a maximum hole mobility of 20 cm2/V/s at a carrier density 1.39 × 10^14 holes/cm2, which …
Displaying 1226 - 1250 of 2521
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