Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 21426 - 21450 of 73697

Topological Insulator Bi2Se3 Nanowire High Performance Field-Effect Transistors

April 30, 2013
Author(s)
Hao Zhu, Curt A. Richter, Erhai Zhao, John E. Bonevich, William A. Kimes, Hyuk-Jae Jang, Hui Yuan, Abbas Arab, Oleg A. Kirillov, James E. Maslar, D. E. Ioannou, Qiliang Li
Topological insulators are unique electronic materials with insulating interiors but robust metallic surfaces. Device applications exploiting their remarkable properties, such as surface conduction of helical Dirac electrons, have so far been hampered by

TSV Reveal height and bump dimension metrology by the TSOM method

April 30, 2013
Author(s)
Ravikiran Attota, Haesung Park, Victor H. Vartanian, Ndubuisi G. Orji, Richard A. Allen
Through-focus scanning optical microscopy (TSOM) transforms conventional optical microscopes into truly 3D metrology tools for nanoscale- to- microscale dimensional analysis with nanometer-scale sensitivity. Although not a resolution enhancement method

Use of TSOM for sub-11 nm node pattern defect detection and HAR features

April 30, 2013
Author(s)
Ravikiran Attota, Abraham Arceo, Bunday Benjamin
In-line metrologies currently used in the semiconductor industry are being challenged by the aggressive pace of device scaling and the adoption of novel device architectures. In defect inspection, conventional bright field techniques will not likely be

Limits in Modeling Power Grid Topology

April 29, 2013
Author(s)
Brian D. Cloteaux
Because of their importance to infrastructure, a number of studies have examined the structural properties of power grids and have proposed random topological models of them. We examine the ability to create generalized models of power grid structure by

Wide Angle Polarization Analysis with Neutron Spin Filters

April 29, 2013
Author(s)
Qiang NMN Ye, Thomas R. Gentile, Jeffrey R. Anderson, Collin L. Broholm, WangChun Chen, Z DeLand, Ross W. Erwin, C. B. Fu, John E. Fuller III, Aaron V. Kirchhoff, J. A. Rodriguez-Rivera, V. Thampy, T G. Walker, Shannon Watson
We report substantial improvements in a compact wide angle neutron spin filter system that was recently employed on the Multi-Axis Crystal Spectrometer at the Center for Neutron Research at the U.S. National Institute of Standards and Technology. The

Frequency-agile, rapid scanning spectroscopy

April 28, 2013
Author(s)
Gar W. Truong, Kevin O. Douglass, Stephen E. Maxwell, Roger D. van Zee, David F. Plusquellic, Joseph T. Hodges, David A. Long
Challenging applications in trace gas analyses require high precision and acquisition rates.1-4 Many continuous-wave laser spectroscopy techniques exhibit significant sensitivity and potential;5 however, their scanning rates are slow because they rely upon

Optical two-way time and frequency transfer over free space

April 28, 2013
Author(s)
Fabrizio R. Giorgetta, William C. Swann, Laura C. Sinclair, Esther Baumann, Ian R. Coddington, Nathan R. Newbury
The transfer of high-quality time-frequency signals between remote locations underpins many applications, including precision navigation and timing, clock-based geodesy, long-baseline interferometry, coherent radar arrays, tests of general relativity and

Individual Ion Addressing with Microwave Field Gradients

April 26, 2013
Author(s)
Ulrich J. Warring, C. Ospelkaus, Yves Colombe, Robert Jordens, Dietrich G. Leibfried, David J. Wineland
Individual-qubit addressing is a prerequisite for many instances of quantum information processing. We present this capability on trapped ions with microwave near-fields delivered by electrode structures integrated into a microfabricated surface-electrode

Video-based Face Recognition via Joint Sparse Representation

April 26, 2013
Author(s)
P J. Phillips, Yi-Chen Chen, Vishal M. Patel, Sumit Shekar, Rama Chellappa
In video-based face recognition, a key challenge is in exploiting the extra information available in a video; e.g., face, body, and motion identity cues. In addition, different video sequences of the same subject may contain variations in resolution

Greenhouse Gas Emissions and Dispersion #2. Comparison of FDS Predictions with Gas Velocity Measurements in the Exhaust Duct of a Stationary Source

April 25, 2013
Author(s)
Kuldeep R. Prasad, Kevin Li, Elizabeth F. Moore, Rodney A. Bryant, Aaron N. Johnson, James R. Whetstone
The burning of fossil fuels remains a major source of greenhouse gases responsible for global warming and climate change. In order to reduce greenhouse gas emissions, it is imperative to develop a capability to accurately measure these emissions from point

NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications

April 25, 2013
Author(s)
Bethany E. Hackett, Bradley Moore, Dennis G. Camell
NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications, presents the technical requirements and guidance for the accreditation of laboratories under the NVLAP Electromagnetic Compatibility and Telecommunications (ECT) LAP. It is

Writing Guidelines for Requests for Proposals for Automated Fingerprint Identification Systems

April 25, 2013
Author(s)
Susan M. Ballou, Michael Garris, Anthony Clay, Joi Dickerson, Peter T. Higgins, Janet Hoin, Lisa Jackson, Mike Lesko, Joe Morrissey, Leo Norton, Beth Owens, Joe Polski, Melissa Taylor
This is one of a series of documents prepared by the Latent Print Automated Fingerprint Identification System (AFIS) Interoperability Working Group. The purpose of these documents is to provide guidance and a framework to those involved in the

MILK AND SERUM SRMs for MONITORING ORGANIC CONTAMINANTS IN HUMAN SAMPLES

April 24, 2013
Author(s)
Michele M. Schantz, Katherine E. Sharpless, Stephen A. Wise, Rebecca Heltsley, Jennifer Keller, John Kucklick, Stacy VanderPol, Stefan D. Leigh, Donald G. Patterson, Jr., Andreas Sjodon, Wayman E. Turner
Four new Standard Reference Materials (SRMs) have been developed to assist in the quality assurance required for human biomonitoring studies. These materials are SRM 1953 Organic Contaminants in Non-Fortified Human Milk, SRM 1954 Organic Contamiants in

Superfilling Damascene Trenches with Gold in Sulfite Electrolyte

April 24, 2013
Author(s)
Daniel Josell, Thomas P. Moffat
Superconformal Au deposition is demonstrated in a Na_(3)Au(SO_(3))_(2 -) Na_(2)SO-(3) based electrolyte using underpotential deposited (upd) Pb to catalyze the reduction of Au(SO_(3))_(2)^(3-). Micromolar additions of Pb^(2+) to the electrolyte give rise

Collisional-Radiative Modeling for Highly-Charged Ions of Tungsten

April 23, 2013
Author(s)
Yuri Ralchenko
We present an overview of the recent advances in collisional-radiative modeling of highly-charged ions of tungsten that are relevant to fusion research. The status of spectroscopic data for W ions is briefly discussed as well. Strategies and peculiarities
Displaying 21426 - 21450 of 73697
Was this page helpful?