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Search Publications

NIST Authors in Bold

Displaying 32076 - 32100 of 74291

Ionization of Silicon, Germanium, Tin and Lead by Electron Impact

March 30, 2007
Author(s)
Yong Sik Kim, Philip M. Stone
Cross sections for electron impact ionization of neutral atoms are important in modeling of low temperature plasmas and gases. Cross sections for ionization have been calculated for ionization from ground levels and low-lying metastable levels of Si, Ge

Development of the NIST Rocky Flats Soil Standard

March 29, 2007
Author(s)
Svetlana Nour, James J. Filliben, Kenneth G. Inn
The National Institute of Standards and Technology (NIST) Rocky Flats Soil-II Standard Reference Material (SRM) is being certified through a statistical analysis of results from an interlaboratory comparison of 14 laboratories from 4 countries. The mean

Face Recognition Vendor Test 2006 and Iris Challenge Evaluation 2006 Large-Scale Results

March 29, 2007
Author(s)
P J. Phillips, K W. Bowyer, P J. Flynn, Alice J. O'Toole, W T. Scruggs, Cathy L. Schott, Matthew Sharpe
The Face Recognition Vendor Test (FRVT) 2006 and Iris Challenge Evaluation (ICE) 2006 are independent U.S. Government evaluations of face and iris recognition performance. These evaluations were conducted simultaneously at NIST using the same test

Investigation of Radioactivity in Selected Drinking Water Samples From Maryland

March 29, 2007
Author(s)
Iisa Outola, Svetlana Nour, Hiromu Kurosaki, Kenneth G. Inn, J J. La Rosa, Larry L. Lucas, Peter Volkovitsky, Kevin Koepenick
In 2004, levels of radioactivity exceeding federal drinking water standards were found in two separate areas of Maryland through gross alpha and beta screening measurements. It was desired to know which radionuclides were responsible for the activity and

IPOG: A General Strategy for t-Way Software Testing

March 29, 2007
Author(s)
Yu Lei, Raghu N. Kacker, D. Richard Kuhn, Vadim Okun, James F. Lawrence
Most existing work on t-way testing has focused on 2-way (or pairwise) testing, which aims to detect faults caused by interactions between any two parameters. However, faults can also be caused by interactions involving more than two parameters. In this

Crystallization of Polyethylene Oxide Patterend by Nanoimprint Lithography

March 28, 2007
Author(s)
Brian C. Okerberg, Christopher L. Soles, Jack F. Douglas, Hyun Wook Ro, Alamgir Karim
The crystallization behavior of poly(ethylene oxide) (PEO) films patterned by nanoimprint lithography is studied. The imprinted PEO film consists of parallel lines, approximately 240 nm wide and 320 nm tall, on a 400 nm pitch with a residual layer of

A Preliminary Study of Peer-to-Peer Human-robot Interaction

March 27, 2007
Author(s)
Terrance Fong, Jean C. Scholtz, Julie Shah, Lorenzo Fluckiger, Clayton Kunz, David Lee, John Schreiner, Michael Siegel, Laura Hiatt, Illah Nourbakhsh, Reid Simmons, Robert Ambrose, Robert Burridge, Brian Antonishek, Magda Bugajska, Alan Schultz, Gregory Trafton
The Peer-toPeer Human-Robot interaction (P2P HRI) project is developing techniques to improve task coordination and collaboration between human and robot partners. Our work is motivated by the need to develop effective human-robot teams for space mission

EUV Spectroscopy of Highly Charged Xenon Ions Created Using an Electron Beam Ion Trap

March 27, 2007
Author(s)
K Fahy, E Sokell, G O'Sullivan, A Aguilar, Joshua M. Pomeroy, Joseph N. Tan, John D. Gillaspy
At the NIST Electron Beam Ion Trap (EBIT), extreme-ultraviolet spectra of xenon ions have been recorded using a flat-field spectrometer. The electron beam energy was varied from 180 eV to 8 keV and radiation from charge states Xe6+ to Xe43+ was observed

Metrology for High-Frequency Nanoelectronics

March 27, 2007
Author(s)
Thomas Mitchell (Mitch) Wallis, Atif A. Imtiaz, Hans Nembach, Paul Rice, Pavel Kabos
Two metrological tools for high frequency measurements of nanoscale systems are described: (i) tow/N-port analysis of nanoscale devices as well as (ii) near-field scanning microwave microscopy (NSMM) for materials characterization. Calibrated two/N-port

Comment on the CASIA v1 Iris Dataset

March 26, 2007
Author(s)
P J. Phillips, K W. Bowyer, P J. Flynn
The paper by Ma et al. [1] made a number of contributions to iris recognition including a novel iris recognition algorithm, a benchmark of standard approaches to iris recognition, and the establishment of an iris data set. The data set, Chinese Academy of

Differential magnetometry based on a diverging laser beam

March 25, 2007
Author(s)
Eleanor Hodby, Elizabeth A. Donley, John E. Kitching
We discuss a new, compact design for a chip-scale differential atomic magnetometer that uses a single diverging laser beam to both pump and multiply probe the alkali atoms.

Array Based Test Structure for Optical-Electrical Overlay Calibration

March 22, 2007
Author(s)
Byron J. Shulver, Richard A. Allen, Anthony Walton, Michael W. Cresswell, J. T. Stevenson, S Smith, Andrew S. Bunting, P. Durgapal, Alan Gundlach, Les I. Haworth, Alan W. Ross, Anthony J. Snell
The novel overlay test structure reported in this paper was purposely designed to serve as an application specific reference material. It features standard frame-in-frame optical overlay targets which are embedded in electrical test structures and

Broadband Electrical Characterization of Multiwalled Carbon Nanotubes and Contacts

March 22, 2007
Author(s)
Paul Rice, T. M. Wallis, Stephen E. Russek, Pavel Kabos
We have welded an individual multiwalled carbon nanotube (MWNT) onto a microlithographically-patterned coplanar waveguide (CPW) and measured the electrical response of the nanotube and the contacts from 100 MHz to 24 GHz. The MWNT was welded to the CPW in

Broadband Electrical Characterization of Multiwalled Carbon Nanotubes and Contacts

March 22, 2007
Author(s)
Thomas M. Wallis, Stephen E. Russek, Pavel Kabos, Paul Rice
The electrical response of an individual multiwalled carbon nanotube (MWNT) and its contacts, welded to a coplanar waveguide (CPW), was measured up to 24 GHz using a technique that removes environment effects. This is the first time MWNT contact effects

Extraction of Sheet Resistance and Linewidth from All-Copper ECD Test-Structures Fabricated from Silicon Preforms

March 22, 2007
Author(s)
Byron J. Shulver, Andrew S. Bunting, Alan Gundlach, Les I. Haworth, Alan W. Ross, A. J. Smith, Anthony J. Snell, J. T. Stevenson, Anthony Walton, Michael W. Cresswell, Richard A. Allen
Test Structures for the extraction of Electrical Critical Dimensions (ECD) and having all-copper features with no barrier metal films have been fabricated. The advantage of this approach is that electrical measurements provide a non-destructive method for

N-Nitrosation of Amines by NO 2 and NO: A Theoretical Study

March 22, 2007
Author(s)
Yi-Lei Zhao, Stephen L. Garrison, Carlos A. Gonzalez, William D. Thweatt, M Marquez
Gas-phase nitrosation implies an alternative non-ionic pathway different from the nitrosonium-nitrosation by acidification of nitrite. Electronic structure calculations discussed in this work suggest a free radical mechanism, in which NO2 abstracts a

Study of Test Structures for Use as Reference Material in Optical Critical Dimension Applications

March 22, 2007
Author(s)
Richard A. Allen, Heather Patrick, Michael Bishop, Thomas Germer, Ronald G. Dixson, William Gutherie, Michael W. Cresswell
Optical critical dimension (OCD) metrology has rapidly become an important technology in supporting the worldwide semiconductor industry. OCD relies on a combination of measurement and modeling to extract the average dimensions of an array of identical
Displaying 32076 - 32100 of 74291