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Physics

Radiation

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Displaying 201 - 225 of 259

Measurements and Standards for Bulk-Explosive Detection

May 31, 2012
Author(s)
Lawrence T. Hudson, Fred B. Bateman, Paul M. Bergstrom, Frank Cerra, Jack L. Glover, Ronaldo Minniti, Stephen M. Seltzer, Ronald E. Tosh
Due to the ease of assembly and leveraged disruptive effect, the improvised explosive device (IED) is the method of choice of today’s terrorist. With more than ten thousand IED incidents annually, and global expenditures for aviation and commercial

Probing the Water Content in Polymer Electrolyte Fuel Cells Using Neutron Radiography

May 8, 2012
Author(s)
Daniel S. Hussey, Jeffrey Mishler, Yun Wang, Rangachary Mukundan, Jacob Spendelow, Rodney Borup
This in-situ study examines the water content in polymer electrolyte fuel cells (PEFCs) using neutron radiography. Various conditions such as different polytetraflouroethylene (PTFE) loadings in the gas diffusion media including the micro-porous layer (MPL

Ultra-Small-Angle X-ray Scattering-X-ray Photon Correlation Spectroscopy: A New Measurement Technique for in-situ Studies of Equilibrium and Nonequilibrium Dynamics

May 1, 2012
Author(s)
Fan Zhang, Andrew J. Allen, Lyle E. Levine, Jan Ilavsky, Gabrielle G. Long
Ultra-small-angle X-ray scattering—X-ray photon correlation spectroscopy (USAXS-XPCS) is a novel measurement technique for the study of equilibrium and slow nonequilibrium dynamics in disordered materials. This technique fills an existing gap between the

Response of large area avalanche photodiodes to low energy X-rays

April 30, 2012
Author(s)
Thomas R. Gentile, Uwe Arp, M J. Bales, R Farrell
For an experiment to study neutron radiative beta-decay, we operated large area avalanche photodiodes (APDs) at liquid nitrogen temperature to detect X-rays with energies between 0.2 keV and 15 keV. Whereas there are numerous reports of X-ray spectrometry

Technical Note on Unexpected Bias in NIST 4p Ionization Chamber Measurements

April 4, 2012
Author(s)
Michael P. Unterweger, Ryan P. Fitzgerald
The NIST 4π pressurized ionization chamber “A” (PIC “A”) has been the mainstay for secondary calibrations of liquid and gaseous gamma-ray emitting sources for the last 40-45 years. It has also been the main instrument used to measure the half-lives of

Extending transmission crystal x-ray spectroscopy to moderate-intensity laser driven sources

March 17, 2012
Author(s)
Lawrence T. Hudson, J. Y. Mao, L. M. Chen, John F. Seely, L. Zhang, Y. Q. Sun, X. X. Lin, J. Zhang
We present spectroscopic measurements of characteristic Kα and Kβ emissions from Mo targets irradiated by a 100 fs, 200 mJ, Ti: sapphire laser with intensity of 1017 W/cm2 to 1018 W/cm2 per pulse. This research pursues novel x-ray sources for medical

Laboratories New to the ICRM

March 4, 2012
Author(s)
Lisa R. Karam, Marios J. Anagnostakis, Arunas Gudelis, Pujadi Marsoem, Alexander Mauring, Gatot Wurdiyanto, Ulku Yucel
The Scientific Committee of the ICRM decided, for the 2011 Conference, to present laboratories that are at a key developmental stage in establishing, expanding or applying radionuclide metrology capabilities. The expansion of radionuclide metrology

Determination of Low-Level Sulfur Concentrations by Isotope Dilution Multi-Collector Inductively Couple Plasma Mass Spectrometry (D-MC-ICPMS) Using 33S Spike and Internal Normalization for Mass Bias Correction

February 28, 2012
Author(s)
Jacqueline L. Mann, Robert D. Vocke Jr., William R. Kelly
An isotope dilution (ID) multi-collector inductively coupled plasma mass spectrometry (MC-ICPMS) method combined with an internal normalization approach for mass bias correction has been used to determine low-level sulfur (S) concentrations in a

Absolute measurements of x-ray backlighter sources at energies above 10 keVa)

February 1, 2012
Author(s)
Lawrence T. Hudson, B.R. Maddox, H.S. Parks, B A. Remington, C. Chen, S Chen, S. T. Prisbrey, A. Comley, C A. Back, C. Szabo, John F. Seely, Uri Feldman, Stephen M. Seltzer, M. J. Haugh, Z. Ali
Line emission and broadband x-ray sources with x-ray energies above 10 keV have been investigated using a range of calibrated x-ray detectors for use as x-ray backlighters in high energy density (HED) experiments. The conversion efficiency of short- and

Optimization of the TES-bias circuit for a multiplexed microcalorimeter array

January 27, 2012
Author(s)
William B. Doriese, Bradley K. Alpert, Joseph W. Fowler, Gene C. Hilton, Alex S. Hojem, Kent D. Irwin, Carl D. Reintsema, Daniel R. Schmidt, Greg Stiehl, Daniel S. Swetz, Joel N. Ullom, Leila R. Vale
In the detector-bias circuit of a transition-edge-sensor (TES) microcalorimeter, the TES-shunt resistor (Rsh) and the thermal conductance to the cryogenic bath (G) are often considered to be interchangeable knobs with which to control detector speed

Effect of Neutron Irradiation on Dosimetric Properties of the TLD-600H (Lif6:Mg,Cu,P)

November 1, 2011
Author(s)
Alexander A. Romanyukha, Ronaldo Minniti, M. Moscovitch, Alan Keith Thompson, F. Trompier, Ronald Colle, A Sucheta, S. P. Voss, L. A. Benevides
Ideally, dosimeters should measure the dose without their dosimetric properties being affected by the radiation type being measured. Industry-wide occupational radiation workers that can be potentially exposed to neutron radiation fields are routinely

Pinhole X -ray camera photos of an ECR ion source plasma

November 1, 2011
Author(s)
Lawrence T. Hudson, Sandor Biri, E Takacs, R. Racz, J. Palinkas
A 70 micrometer pinhole and an X-ray CCD camera in single photon counting mode were used to obtain spatially and spectral resolved images of an electron cyclotron resonance (ECR) ion source generated plasma. The method has good spatial resolution as well

The NIST EUV facility for advanced photoresist qualification using the witness-sample test

August 29, 2011
Author(s)
Steven E. Grantham, Charles S. Tarrio, Shannon B. Hill, Lee J. Richter, J. van Dijk, C. Kaya, N. Harned, R. Hoefnagels, M. Silova, J. Steinhoff
Before being used in an extreme-ultraviolet (EUV) scanner, photoresists must first be qualified to ensure that they will not excessively contaminate the scanner optics or other parts of the vacuum environment of the scanner. At the National Institute of
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