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Metrology

Electrical / electromagnetic metrology

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  • Published Date
Displaying 176 - 200 of 458

Method for Ensuring Accurate AC Waveforms with Programmable Josephson Voltage Standards

June 1, 2013
Author(s)
Charles J. Burroughs, Alain Rufenacht, Samuel Benz, Paul Dresselhaus
The amplitudes of stepwise-approximated sine waves generated by programmable Josephson voltage standards (PJVS) are not intrinsically accurate because the transitions between the quantized voltages depend on numerous conditions. We have developed a method

A Digital-to-Analog Converter with a Voltage Standard Reference

July 1, 2012
Author(s)
Alain Rufenacht, Charles J. Burroughs, Samuel Benz, Paul Dresselhaus
Commercially available 20-bit digital to analog converters (DACs) have the potential to impact the field of low frequency voltage metrology. We measured a linearity of ±6 µV (±0.6 µV/V full scale) over the 10 V range for such a DAC with a Zener voltage

Flat frequency response in the electronic measurement of the Boltzmann constant

July 1, 2012
Author(s)
Jifeng Qu, Samuel Benz, Yang Fu, Jianqiang Zhang, Horst Rogalla, Alessio Pollarolo
A new quantum voltage calibrated Johnson noise thermometer (JNT) was developed at NIM to demonstrate the electrical approach that determines the Boltzmann constant k by comparing electrical and thermal noise power. A measurement with integration period of

Improved performance of the ECCS experiment at PTB

July 1, 2012
Author(s)
Hansjoerg Scherer, Benedetta Camarota, Mark W. Keller, Sergey Lotkhov
Recent improvements on the ECCS experiment at PTB are reported. A 5-junction single-electron R-pump is shown to shuttle electrons with a relative transfer error of 5×10 -8. Moreover, the relative uncertainty of the setup for the cryogenic capacitor voltage

Electron Counting Capacitance Standard with an improved five-junction R-pump

November 7, 2011
Author(s)
Benedetta Camarota, Hansjoerg Scherer, Sergey Lotkhov, Gerd-Dietmar Willenberg, Franz Josef Ahlers, Mark W. Keller
The Electron Counting Capacitance Standard currently pursued at PTB, aims at the closure of the Quantum Metrological Triangle with a final precision of a few parts in 10 7. This paper reports the considerable progress recently achieved with a new

Design of the NIST 10V programmable Josephson voltage standard system

January 13, 2011
Author(s)
Charles J. Burroughs, Paul Dresselhaus, Alain Rufenacht, David I. Olaya, Mike Elsbury, Yi-hua D. Tang, Samuel Benz
NIST has developed and implemented a new Programmable Josephson Voltage Standard (PJVS) that operates at 10 V. This next-generation system is optimized for both dc metrology and stepwise-approximated ac voltage measurements for frequencies up to a few

Reduced Nonlinearity Effect on the Electronic Measurement of the Boltzmann Constant

January 10, 2011
Author(s)
Jifeng Qu, Samuel Benz, Alessio Pollarolo, Horst Rogalla
NIST has developed a quantum voltage noise source (QVNS) calibrated Johnson noise thermometer (JNT) to provide a new electronic measurement technique for determining the Boltzmann constant. Improvements in electronics and synthesized noise waveforms have

Development of a Four-channel System for Johnson Noise Thermometry

December 30, 2010
Author(s)
Alessio Pollarolo, Chiharu Urano, Paul Dresselhaus, Jifeng Qu, Horst Rogalla, Samuel Benz
Long integration time is necessary to reach low uncertainty when measuring temperature through Johnson Noise Thermometry (JNT). The main goal of the NIST JNT experiment is to achieve a 6×10-6 relative uncertainty in the measurement of the water triple

Calibrated nanoscale capacitance measurements using a scanning microwave microscope

November 2, 2010
Author(s)
H P. Hubner, M. Moertelmaier, Pavel Kabos, M. Fenner, C Rankl, Atif A. Imtiaz
A scanning microwave microscope (SMM) for spatially resolved capacitance measurements in the attofarad-to-femtofarad regime is presented. The system is based on the combination of an atomic force microscope (AFM) and a performance network analyzer (PNA

Design of the NIST 10 V programmable Josephson voltage standard system

June 13, 2010
Author(s)
Charles J. Burroughs, Paul Dresselhaus, Alain Rufenacht, Mike Elsbury, Samuel Benz
NIST has developed and implemented a new Programmable Josephson Voltage Standard (PJVS) that operates at 10 V. This next-generation system is optimized for both dc metrology and stepwise-approximated ac voltage measurements for frequencies up to a few

Development and investigation of intrinsically shunted junction series arrays for ac Josephson voltage standards

June 13, 2010
Author(s)
Johannes Kohlmann, Franz Mueller, Oliver F. kieler, D. Schleussner, B Egeling, Ralf Behr, David I. Olaya, Paul Dresselhaus, Samuel Benz
Different types of intrinsically shunted Josephson junctions have been developed and inves¬tigated for ac voltage standard applications at PTB. The first type for generation of voltages up to 10 V is driven by a 70 GHz sinusoidal microwave signal and

Development of a Four-channel System for Johnson Noise Thermometry

June 13, 2010
Author(s)
Alessio Pollarolo, Jifeng Qu, Horst Rogalla, Paul Dresselhaus, Samuel Benz
Long integration time is necessary to reach low uncertainty when measuring temperature through Johnson Noise Thermometry (JNT). The main goal of the NIST JNT experiment is to achieve a 6 10-6 relative uncertainty in the measurement of the water triple

Establishing an ac Josephson voltage standard at NRC

June 13, 2010
Author(s)
Piotr S. Filipski, M. Boecker, Samuel Benz, Charles J. Burroughs
NRC recently established an AC Josephson Voltage Standard (ACJVS) system based on a NIST pulse-driven Josephson-junction array. This paper describes the efforts undertaken at NRC and the experience that was gained. An experimental method of measuring

Reduced Nonlinearities in the NIST Johnson Noise Thermometry System

June 13, 2010
Author(s)
Jifeng Qu, Samuel Benz, Alessio Pollarolo, Horst Rogalla
Improved electronics and synthesized noise waveforms for the NIST quantum-voltage-standard- calibrated Johnson noise thermometer (JNT) have lead to reduced uncertainty in the temperature measurement. Recent measurements show that some of the distortion in

NEW DESIGNS FOR HIGH-RESISTANCE STANDARD RESISTORS

May 1, 2010
Author(s)
Andrew J. Dupree, Dean G. Jarrett
Discussed are the efforts undertaken at the National Institute of Standards and Technology to create a new set of high-resistance standards (specifically the 10 MΩ to 100 MΩ range) using newer more stable film-type resistors. The history of film-type
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