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Prashanth Jaganmohan, Bala Muralikrishnan, Meghan Shilling, Ed Morse
With steadily increasing use in dimensional metrology applications, especially for delicate parts and those with complex internal features, X-ray computed tomography (XCT) has transitioned from a medical imaging tool to an inspection tool in industrial
Bala Muralikrishnan, Prashanth Jaganmohan, Meghan Shilling, Ed Morse
In two prior National Institute of Standards and Technology (NIST) Journal of Research publications (Parts I and II) [1,2], we presented test procedures to detect instrument geometry errors in industrial cone beam X-ray computed tomography (XCT) systems
A central paradigm in flow cytometry is the one-time optical interrogation of cells, a practice that has limited the ability to address important questions associated with reproducibility and repeatability of measurements. Serial flow cytometry has
This publication is a synopsis of an invited presentation by Nandita Abhyankar, presented to the International EPR Society in September 2021. The synopsis describes the advantages of planar inverse anapole microresonators for improving the sensitivity of
Jay H. Hendricks, Zeeshan Ahmed, Daniel Barker, Kevin O. Douglass, Stephen Eckel, James A. Fedchak, Nikolai Klimov, Jacob Edmond Ricker, Julia Scherschligt
The NIST on a Chip (NOAC) program's central idea is the idea that measurement technology can be developed to enable metrology to be performed "outside the National Metrology Institute" by the crea-tion of deployed and often miniaturized standards. These
Carlos R. Beauchamp, Johanna Camara, Jennifer Carney, Steven J. Choquette, Kenneth D. Cole, Paul C. DeRose, David L. Duewer, Michael Epstein, Margaret Kline, Katrice Lippa, Enrico Lucon, John L. Molloy, Michael Nelson, Karen W. Phinney, Maria Polakoski, Antonio Possolo, Lane C. Sander, John E. Schiel, Katherine E. Sharpless, Michael R. Winchester, Donald Windover
The National Institute of Standards and Technology (NIST), formerly the National Bureau of Standards, was established by the U.S. Congress in 1901 and charged with establishing a measurement foundation to facilitate U.S. and international commerce. NIST
Joshua Alexander, Stephanie Trippel, Randall Wagner, Steve Armstrong
Hearing aids are commonly fit with ear canals partially or fully open—a condition that increases the risk of acoustic feedback. Feedback limits the audiometric fitting range of devices by limiting usable gain. To guide clinical decision making and device
Corey Rae McRae, Joshua Combes, Gregory Stiel, Haozhi Wang, Sheng Xiang Lin, David P. Pappas, Josh Mutus
As the field of superconducting quantum computing approaches maturity, optimization of single-device performance is proving to be a promising avenue toward large-scale quantum computers. However, this optimization is possible only if performance metrics
Kristina Kvashnina, Yoshiyuki Amemiya, Dibyendu Bhattacharyya, Ingolf Lindau, Andrew J. Allen
This is an Editorial for the Journal of Synchrotron Radiation (JSR) to inform all readers, authors and supporters about the coming transition of the journal to become fully open access. All papers submitted to JSR after 1 October 2021, will be for open
A precision laser-based comparison calibration method for laboratory standard microphones is described that uses reference microphones calibrated by the pressure reciprocity method. Electrical drive current and diaphragm velocity are measured while the
Yaw S. Obeng, Brian J. Nablo, Darwin Reyes-Hernandez, Dianne L. Poster, Michael T. Postek
Microwave (MW) sensing offers noninvasive, real-time detection of the electromagnetic properties of biological materials via the highly concentrated electromagnetic fields, for which advantages include wide bandwidth, small size, and cost-effective
Dianne L. Poster, C Cameron Miller, Richard Martinello, Norman Horn, Michael T. Postek, Troy Cowan, Yaw S. Obeng, John J. Kasianowicz
The National Institute of Standards and Technology (NIST) hosted an international workshop on ultraviolet-C (UV-C) disinfection technologies on January 14 – 15, 2020 in Gaithersburg, Maryland in collaboration with the International Ultraviolet Association
David Deisenroth, Sergey Mekhontsev, Brandon Lane, Leonard M. Hanssen, Ivan Zhirnov, Vladimir Khromchenko, Steven Grantham, Daniel Cardenas-Garcia, Alkan Donmez
This paper describes advances in measuring the characteristic spatial distribution of surface temperature and emissivity during laser-metal interaction under conditions relevant for laser powder bed fusion (LPBF) additive manufacturing processes. Detailed
Eugene Yoon, Angela Stelson, Nate Orloff, Chris Long, Jim Booth, Ellis Meng
Thin film Parylene C has increasingly been employed as a substrate material with metals like platinum (Pt), especially in MEMS implantable devices. To assist in device design, broadband dielectric spectroscopy (up to 110 GHz) can characterize such
Nathan Castro, Greta Babakhanova, Jerry Hu, Kyriacos Athanasiou
Traditional testing methods have helped to elucidate and correlate the structure-function relationship of natural tissues and have guided the development of promising tissue-engineered medical products. From a manufacturing standpoint, such assays have
Ann Chiaramonti Debay, Baptiste Gault, Julie Cairney, Michael P. Moody, Oana Cojocaru-Miredin, Patrick Stender, Renelle Dubosq, Christoph Freysoldt, Surendra Kumar Makineni, Tong Li
Atom probe tomography (APT) provides three-dimensional compositional mapping with sub-nanometre resolution. The sensitivity of APT is in the range of parts per million for all elements, including light elements such as hydrogen, carbon or lithium, enabling
Iosif Isaakovich Shinder, Michael R. Moldover, James Filla, Aaron Johnson, Vladimir B. Khromchenko
NIST calibrates anemometers as a function of airspeed vector and turbulence intensity (Tu). The vector capability (sometimes called '3D') is particularly important for calibrating multi-hole differential-pressure probes that are often used to quantify
Jodie Gail Pope, Aaron Johnson, James Filla, Vern E. Bean, Michael R. Moldover, Joey Boyd, Christopher J. Crowley, Iosif Isaakovich Shinder, Keith A. Gillis, John D. Wright
We describe the 15 kg/s water flow calibration standard operated by the Fluid Metrology Group of the National Institute of Standards and Technology (NIST) to calibrate liquid flow meters for customers. The 15 kg/s standard is a dynamic, gravimetric, liquid
Argon cluster ions have enabled molecular depth profiling to unprecedented depths, with minimal loss of chemical information or changes in sputter rate. However, for deep depth profiles of organic films using the gas cluster ion source (> 10 µm of
The NIST policy on metrological traceability (NIST P 5800.00, which became effective on May 31st, 2019) is transcribed and supplemented with a review of relevant terminology and with a list of frequently asked questions and answers. This list updates and
NIST Handbook 44 was first published in 1949, having been preceded by similar handbooks of various designations and in several forms, beginning in 1918. NIST Handbook 44 is published in its entirety each year following the Annual Meeting of the National
The 104th Annual Meeting of the National Conference on Weights and Measures (NCWM) was held July 14 - 18, 2019, at the Hyatt Regency Milwaukee Hotel, Milwaukee, Wisconsin. The theme of the meeting was "Assuring Equity in the Marketplace: NIST and NCWM
Yanping Zhu, Matthew Klegseth, Yi Bao, Matthew Hoehler, Lisa Choe, Genda Chen
This study explores an instrumentation strategy using distributed fiber optic sensors to measure strain and temperature through the concrete volume in large-scale structures. Single-mode optical fibers were deployed in three 12.8 m long steel and concrete
Jay H. Hendricks, Zeeshan Ahmed, Daniel Barker, Stephen Eckel, James A. Fedchak, Nikolai Klimov, Julia Scherschligt
At the core of the NIST on a Chip (NoAC) program is the idea that measurement technology can be developed to enable metrology to be done "outside the National Metrology Institute" by virtue of deployed and often miniaturized standards (that can also serve
Joshua A. Taillon, Thomas F. Bina, Raymond L. Plante, Marcus W. Newrock, Gretchen Greene, June W. Lau
This work introduces NexusLIMS, an electron microscopy laboratory information management system designed and implemented by the Office of Data and Informatics and the Materials Science and Engineering Division at NIST for a multi-user electron microscopy