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The Effect of Annealing Thin Film Parylene C-Platinum Interfaces Characterized by Broadband Dielectric Spectroscopy

Published

Author(s)

Eugene Yoon, Angela Stelson, Nate Orloff, Chris Long, Jim Booth, Ellis Meng

Abstract

Thin film Parylene C has increasingly been employed as a substrate material with metals like platinum (Pt), especially in MEMS implantable devices. To assist in device design, broadband dielectric spectroscopy (up to 110 GHz) can characterize such materials with unique advantages unavailable in more-commonly used electrochemical impedance spectroscopy (up to 1 MHz). In this work, coplanar waveguides (CPWs) fabricated from electron-beam evaporated Pt coated with Parylene C were measured with broadband dielectric spectroscopy to characterize the effect of thermal annealing. We confirmed that annealing caused no significant changes in Parylene C permittivity (2.85±0.13 and 2.80±0.18 before and after annealing; respectively) and extended the upper frequency limit to 110 GHz for the known permittivity value. Pt resistivity was unexpectedly reduced by 20% from annealing. Results and implications herein may inform fabrication-related design considerations of implantable devices using thin film Parylene C and Pt metal with radio frequency (RF) applications such as wireless power and data transfer.
Proceedings Title
The Effect of Annealing Thin Film Parylene C-Platinum Interfaces Characterized by Broadband Dielectric Spectroscopy
Conference Dates
June 20-25, 2021
Conference Location
(Virtual) Attending from Los Angeles, CA, US
Conference Title
Transducers 2021: The 21st International Conference on Solid-State Sensors, Actuators and Microsystems

Keywords

Parylene C, Platinum, Thin film, Dielectric, Spectroscopy, Interfaces, Annealing, Thermoforming

Citation

Yoon, E. , Stelson, A. , Orloff, N. , Long, C. , Booth, J. and Meng, E. (2021), The Effect of Annealing Thin Film Parylene C-Platinum Interfaces Characterized by Broadband Dielectric Spectroscopy, The Effect of Annealing Thin Film Parylene C-Platinum Interfaces Characterized by Broadband Dielectric Spectroscopy, (Virtual) Attending from Los Angeles, CA, US, [online], https://doi.org/10.1109/Transducers50396.2021.9495440, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=931990 (Accessed December 10, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 6, 2021, Updated November 29, 2022