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Metrological Traceability Frequently Asked Questions and NIST Policy
Published
Author(s)
Sally Bruce, Antonio Possolo, Robert Watters
Abstract
The NIST policy on metrological traceability (NIST P 5800.00, which became effective on May 31st, 2019) is transcribed and supplemented with a review of relevant terminology and with a list of frequently asked questions and answers. This list updates and amplifies a similar list originally prepared by a team organized and led by Richard Kayser, which was published in the World Wide Web, and comprises questions about: metrological traceability in general; establishing metrological traceability; NIST and NIST's role in metrological traceability; NIST products and services; and international aspects of traceability.
Bruce, S.
, Possolo, A.
and Watters, R.
(2021),
Metrological Traceability Frequently Asked Questions and NIST Policy, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.TN.2156, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=932360
(Accessed October 13, 2025)