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Metrology

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Displaying 1 - 25 of 2739

Ultra-High Speed Printing Regime in Laser Powder Bed Fusion of Highly Reflective Metals

April 5, 2026
Author(s)
Natalya Kublik, Laura Duenas Gonzalez, David Deisenroth, zhengtao gan, Bruno Azeredo
Additive manufacturing of highly reflective metals, such as copper and aluminum, often entail excessive energy losses, especially in laser powder bed fusion (LPBF). To compensate for reflected losses, high powered lasers and low scan speeds (i.e., ≤ 0.8 m

Accurate Volume Determination for Low Gas Flow Standards

March 17, 2026
Author(s)
Jodie Pope, Christopher Crowley, Max Low, John Wright, Aaron Johnson
The National Institute of Standards and Technology (NIST) has developed the Semiconductor Low Flow Standard (SLowFlowS), a new rate-of-rise (RoR) gas flow standard capable of measuring flows as low as 0.01 standard cm³/min. SLowFlowS incorporates two

Advancing evanescent light scattering microscopy for single-particle characterization of gene delivery nanoparticles

March 4, 2026
Author(s)
Jagat Budhathoki, Gregory Cooksey, Matthew DiSalvo, Thomas Germer, Peter Bajcsy, Edward Kwee, Aaron Goldfain, Alexander Peterson
Precise and reproducible single-nanoparticle characterization is essential for advancing gene therapy, where viral vectors encapsulating therapeutic genes must be evaluated under formulation-relevant conditions. We present a label-free optical platform

2025 NIST Summary of U.S. Legal Metrology Activities

February 17, 2026
Author(s)
Loren Minnich, Gloria Lee, John McGuire, Jan Konijnenburg, Isabel Baucom, Juana Williams, Katrice Lippa, David Sefcik
The NIST Office of Weights and Measures (OWM) presents its second issue of the 2024 NIST Annual Summary of U.S. Legal Metrology Activities report. This report includes a summary of changes made to NIST Handbook 44 (2026) Specifications, Tolerances and

NIST Handbook 44: Specifications, Tolerances and Other Technical Requirements for Weighing and Measuring Devices (2026 Ed.)

January 5, 2026
Author(s)
Loren Minnich, Gloria Lee, Juana Williams, Isabel Baucom, Jan Konijnenburg, John McGuire, Katrice Lippa
NIST Handbook 44 includes specifications, tolerances, and other technical requirements for weighing and measuring devices. These requirements are intended to encourage the design, installation, testing, and use of weighing and measuring devices that

NIST Handbook 133: Checking the Net Contents of Packaged Goods (2026 Ed.)

December 29, 2025
Author(s)
John McGuire, David Sefcik, Loren Minnich, Elizabeth Benham, Isabel Baucom, Katrice Lippa
This handbook has been prepared as a procedural guide for the compliance testing of net content statements on packaged goods. Compliance testing of packaged goods is the determination of the conformance results of packaging, distribution, and sale of

Chirped magneto-optical trap of molybdenum

December 12, 2025
Author(s)
Sai Naga Manoj Paladugu, Nickolas Pilgram, Stephen Eckel, Eric Norrgard
We have directly loaded a cryogenic beam of molybdenum atoms into a magneto-optical trap. By chirping the detuning of the trapping lasers, we were able to enhance the number of atoms loaded into the trap by more than a factor of 2. We optimize the trapped

Environmental Measurements: A Needs Assessment

November 19, 2025
Author(s)
Julia Marrs, David Allen, Gerald Fraser
A summary is provided of the presentations, discussion, and findings from a two-and-a-half-day workshop on environmental measurements focusing on needs for new measurement science and measurement standards to support the characterization of ecological

Relating Human and AI-based Detection Limits in SEM Dimensional Metrology

October 25, 2025
Author(s)
Peter Bajcsy, Pushkar Sathe, Andras Vladar
Background: The nanoscale measurements of critical dimensions in semiconductor manufacturing rely on scanning electron microscopy (SEM) and SEM image analyses. The acquisition of SEM images requires a low primary electron beam current and a low dose of the

Leveraging the revised International System of Units: Torque from the fundamental constants

September 17, 2025
Author(s)
Zane Comden, Stephan Schlamminger, Frank Seifert, Kumar Arumugam, Chandra Shahi, David Newell, Leon Chao
Calibration of tools designed to apply known torques such as torque wrenches and torque screwdrivers requires a chain of traceable standards to the definition of the kilogram in the International System of Units (SI). This traceability chain presently

Report on the May 2025 NIST Measurement Week: Realization of an OSAC draft Interim Performance Assessment for Terrestrial Laser Scanners Used by Law Enforcement Agencies

September 17, 2025
Author(s)
Balasubramanian Muralikrishnan, Katharine Shilling, Mary Gregg, Vincent Lee, Jason Keller, Erin Casey, Eugene Liscio, Bryon O'Neil, Mike Russ, Toby Terpstra
This report describes a terrestrial laser scanner (TLS) testing event, the NIST Measurement Week, held at the National Institute of Standards and Technology (NIST) during the week of May 12-16, 2025. The Crime Scene Investigation and Reconstruction (CSIR)

Multi-facility comparison of InGaAs trap detector responsivity for optical fiber power

September 1, 2025
Author(s)
Kyle Rogers, Jeanne Houston, Zeus Ruiz Gutierrez, Matthew Spidell, Padraic Aither, Marty Gould, John Lehman
The absolute responsivity of an optical detector in a trap configuration has been investigated in the interest of high-accuracy fiber-coupled measurements for commercial optical fiber power meters and fiber-coupled single-photon detector calibrations. The

Material Needs and Measurement Challenges for Advanced Semiconductor Packaging: Understanding the Soft Side of Science

August 27, 2025
Author(s)
Ran Tao, Polette Centellas, Stian Romberg, Anthony Kotula, Gale Holmes, Amanda Forster, Christopher Soles, Bob Allen, Edvin Cetegen, William Chen, Jeff Gotro, Mark Poliks
This perspective builds upon insights from the National Institute of Standards and Technology (NIST)-organized workshop, "Materials and Metrology Needs for Advanced Semiconductor Packaging Strategies," held at the 35th annual Electronics Packaging

From ultra-noisy to ultra-stable: optimization of the optoelectronic laser lock

August 24, 2025
Author(s)
Takuma Nakamura, Yifan Liu, Naijun Jin, Haotian Cheng, Charles McLemore, Nazanin Hoghooghi, Peter Rakich, Franklyn Quinlan
We demonstrate thermal noise-limited direct locking of a semiconductor DFB laser to a sub-1 mL volume, ultrastable optical cavity, enabling extremely compact and simple ultrastable laser systems. Using the optoelectronic laser locking method, we realize
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