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Joseph T. Hodges, A. Cygan, Piotr Maslowski, Katarzyna E. Bielska, S. Wojtewicz, J. Domyslawska, Hisashi Abe, R.S. Trawinski, R. Ciurylo
We describe a high sensitivity and high spectral resolution laser absorption spectrometer based upon the frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) technique. We used the Pound-Drever-Hall (PDH) method to lock the probe laser to the high
David R. Black, Donald A. Windover, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of instrument performance of powder diffractometers. This report describes SRM 660b, the third generation of this
Abstract. A framework of increasing complexity is developed to describe the mechanics of adhesion and its reverse, de-adhesion or separation, during indentation contact cycles. The importance of the indentation probe stiffness in determination of system
Carl G. Simon Jr., Kaushik Chatterjee, Limin Sun, Laurence C. Chow, Marian F. Young
Current methods for combinatorial and high-throughput (CHT) screening of cell-material interactions utilize a two-dimensional (2D) format where cells are presented on flat materials surfaces [1]. However, cell response in 3D scaffolds is more
Carl G. Simon Jr., Kaushik Chatterjee, Laurence C. Chow, Limin Sun, Marian F. Young
There is a need to improve rapid methods for screening cell-biomaterial interactions. Current methods employ a flat 2D format even though 3D scaffolds are more representative of the tissue environment in vivo and cells are responsive to topological
James C. Booth, Nathan D. Orloff, Jordi Mateu, Michael D. Janezic, Matthew Rinehart, James A. Beall
We describe the design, fabrication, and evaluation of a new on-wafer measurement platform for the rapid, quantitative determination of the complex permittivity of nL fluid volumes over the frequency range from 10 MHz - 40 GHz. Our measurement platform
Douglas T. Smith, Stuart T. Smith, Bartosz K. Nowakowski
This paper presents a discussion of the design features of a precision indentation platform for measuring indents with traceable uncertainties at the nanometer scale. In particular, the goal of the instrument is to simultaneously measure penetration
Modeling scanning electron microscope (SEM) and scanning ion microscope images has recently become necessary, because of its ability to provide repeatable images with a priori determined parameters. Modeled artificial images have been used in evaluation of
Shujiang Yang, Mohammed Lach-hab, Iosif I. Vaisman, Estela Blaisten-Barojas, Xiang Li, Vicky L. Karen
This work provides assignment of framework type for 1391 zeolite crystal entries in the Inorganic Crystal Structure Database (ICSD). Additionally, a proposed framework type is provided for a set of 27 zeolite crystals with geometrical distortions and a set
Ian M. Anderson, Michael D. Anderson, Andrew A. Herzing, Colby Heideman, Raimar Rostek, David C. Johnson
An ultra-low thermal conductivity compound with the ideal formula [(PbSe)1.00]1[MoSe2]1 has been successfully crystallized across a range of compositions. The lattice parameters varied from 12.41 Å to 12.75 Å and the quality of the observed 00ℓ diffraction
Katharine M. Mullen, Victor L. Krayzman, Igor Levin
The pair distribution function (PDF), as determined from total x-ray or neutron scattering, is a valuable probe of atomic arrangements in nanoparticles. Structural information in such experimental PDF data is convoluted with the effects of particle shape
Hiroyoshi Momida, Eric J. Cockayne, Naoto Umezawa, Takahisa Ohno
First-principles calculations were used to compute the dielectric permittivities of hypothetical [La,Sc]2O3 solid solutions in the cubic (bixbyite) and hexagonal La2O3 phases. Dielectric enhancement is predicted at small Sc concentrations due to the
Chin J. Chiang, Thomas M. Wallis, Dazhen Gu, Atif A. Imtiaz, Pavel Kabos, Paul T. Blanchard, Kristine A. Bertness, Norman A. Sanford, Kichul Kim, Dejan Filipovic
A GaN nanowire (NW) Schottky contact was characterized up to 10 GHz. Using a calibration procedure and circuit model a capacitance-voltage (CV) curve was obtained, from which a carrier concentration was calculated for the first time. These results
Derek D. Hass, H. Zhao, Tabbetha A. Dobbins, Andrew J. Allen, Andrew Slifka, H. N. Wadley
A high pressure, electron-beam directed-vapor deposition process has been used to deposit partially stabilized zirconia containing 7 % yttria by mass at deposition pressures of 7.5 Pa to 23 Pa. Anisotropic ultra-small-angle X-ray scattering (USAXS) was
Paul Constantino, James J. Lee, H Chai, Bernhard Zipfel, Charles Ziscovici, Brian R. Lawn, Peter Lucas
Fossil hominin tooth enamel often exhibits antemortem edge chipping (Robinson 1954; Tobias 1967; Wallace 1973). Here we apply a simple fracture equation to estimate peak bite forces from the sizes of such chips. This equation, previously validated by
David R. Black, Donald A. Windover, Albert Henins, David L. Gil, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certify a variety of standard reference materials (SRM) to address specific aspects of instrument performance for divergent beam diffractometers. This report describes SRM 640d, the fifth generation
John H. Lehman, Katherine E. Hurst, Gurpreet Singh, Elisabeth Mansfield, John D. Perkins, Christopher L. Cromer
Carbon nanotubes are known to have high thermal conductivity, and in bulk form, a topology that could constitute the matrix of an inhomogeneous solid. Among the promised applications of carbon nanotubes is a composite material that is practical for thermal
Michael S. Gaither, Frank W. DelRio, Richard S. Gates, Edwin R. Fuller, Robert F. Cook
A new test specimen has been developed for micro-scale tensile strength measurements, allowing direct assessment of surface effects on strength. Specimens were formed by deep reactive ion etching, tested with instrumented indentation, and test results
One failure mode of all-ceramic crown restorations is radial cracking at the cementation surface, from occlusally-induced flexure of the stiffer crown layer on the softer dentin underlayer. We hypothesize that such failure may be substantially mitigated by
Bruce D. Ravel, C. Scorzato, D. P. Siddons, S. D. Kelly, S. R. Bare
A four-channel ionization chamber has been designed, constructed and tested. This ionization chamber allows X-ray absorption spectra to be collected in transmission from up to four samples simultaneously. This results in spectra that are free of systematic
Ngoc Nguyen, Polly Berseth, Qiyin Lin, Catalin Chiritescu, D.G. Cahill, Anastassios Mavrokefalos, Li Shi, Paul Zschack, Michael D. Anderson, Ian M. Anderson, David C. Johnson
Turbostratically disordered tungsten diselenide (WSe2) thin films with as few as two c-axis-oriented (basal plane) structural units were synthesized from modulated elemental reactants. By varying the number of elemental W-Se bilayers deposited, the
Joseph C. Woicik, D. Giubertoni, G. Pepponi, S. Gennaro, M. Bersani, M. A. Sahiner, S. P. Kelty, M. Kah, K. J. Kirkby, R. Doherty, M. A. Foad, F. Meirer, C. Streli, P. Pianetta
The use of non-equilibrium annealing approaches can produce a very high level of arsenic electrical activation in Si but subsequent thermal treatments between 500 and 800 C easily deactivate the dopant to a level one order of magnitude below the solid
Shujiang Yang, Mohammed Lach-hab, Estela Blaisten-Barojas, Xiang Li, Vicky L. Karen
Heulandite and clinoptilolite form the most abundant family of natural zeolite crystals. The topology of both of them is characterized by the framework type HEU. Despite many studies on these crystals, the mineral assignment to a zeolite as heulandite or
Jennifer L. Klamo, Peter K. Schenck, Peter G. Burke, Kao-Shuo Chang, Martin L. Green
Combinatorial library films of HfO2-TiO2-Y2O3, a high-k dielectric system, grown by pulsed laser deposition, exhibit visible boundary lines separating amorphous and crystalline phases. By changing processing space parameters, specifically substrate
Michael S. Gaither, Frank W. DelRio, Richard S. Gates, Edwin R. Fuller, Robert F. Cook
Micro- and nano-electromechanical systems are typically formed via lithographic and etching processes that leave residual surface features, stresses, and chemistry that ultimately control component strength and device reliability. Here, we describe a new