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Electronics

Semiconductors

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Displaying 801 - 825 of 1446

Physical Model for Random Telegraph Noise Amplitudes and Implications

June 12, 2012
Author(s)
Richard G. Southwick, Kin P. Cheung, Jason P. Campbell, Serghei Drozdov, Jason T. Ryan, John S. Suehle, Anthony Oates
Random Telegraph Noise (RTN) has been shown to surpass random dopant fluctuations as a cause for decananometer device variability, through the measurement of a large number of ultra-scaled devices [1]. The most worrisome aspect of RTN is the tail of the

Channel Length-Dependent Series Resistance?

June 10, 2012
Author(s)
Jason P. Campbell, Kin P. Cheung, Serghei Drozdov, Richard G. Southwick, Jason T. Ryan, Tony Oates, John S. Suehle
A recently developed series resistance (RSD) extraction procedure from a single nanoscale device is shown to be highly robust. Despite these virtues, the technique unexpectedly results in a channel length-dependent RSD which is observed across a wide range

LTB4 IS A SIGNAL RELAY MOLECULE DURING NEUTROPHIL CHEMOTAXIS

May 15, 2012
Author(s)
Philippe V. Afonso, Mirkka Janka-Junttila, Young Jong Lee, Colin P. McCann, Charlotte M. Oliver, Khaled A. Aamer, Wolfgang Losert, Marcus T. Cicerone, Carol A. Parent
Neutrophil recruitment to inflammation sites purportedly depends on sequential waves of chemoattractants. Current models propose that LTB4, a secondary chemoattractant secreted by neutrophils in response to primary chemoattractants such as formyl-peptides

Optimization of Imaging Polymer Based Scaffolds Using X-Ray Microcomputed Tomography

May 15, 2012
Author(s)
David E. Morris, Melissa L. Mather, Carl Simon Jr., John A. Crowe
The performance of polymer based scaffolds used in regenerative medicine is linked to their structural properties and as such strategies for structural characterization of scaffolds have been developed. X-ray microscopic computed tomography (X-ray micro CT

Frequency-selective contrast on variably doped p-type silicon with a scanning microwave microscope

May 14, 2012
Author(s)
Atif A. Imtiaz, Thomas M. Wallis, SangHyun S. Lim, H. Tanbakuchi, H-P Huber, A. Hornung, P. Hinterdorfer, J. Smoliner, F. Kienberger, Pavel Kabos
We report frequency dependent contrast in d(S11)/dV measurements of a variably doped p-type silicon sample in the frequency range from 2GHz to 18GHz. The measurements were conducted bys use of a scanning microwave microscope. The measurements were done at

Can We Get 3D CD Metrology Right?

April 19, 2012
Author(s)
Andras Vladar, John S. Villarrubia, Michael T. Postek, Petr Cizmar
Our world is three-dimensional, so are the integrated circuits (ICs), they have always been. In the past, for a long time, we’ve been very fortunate, because it was enough to measure the critical dimension (CD), the width of the resist line to keep IC

Scatterfield Microscopy of 22 nm Node Patterned Defects using Visible and DUV Light

April 4, 2012
Author(s)
Bryan M. Barnes, Martin Y. Sohn, Francois R. Goasmat, Hui Zhou, Richard M. Silver, Abraham Arceo
Smaller patterning dimensions and novel architectures are fostering research into improved methods of defect detection in semiconductor device manufacturing. This initial experimental study, augmented with simulation, evaluates scatterfield microscopy to

Dielectrophoretic Cell Capture on Polyester Membranes

April 2, 2012
Author(s)
Conni Hanke, Petra S. Dittrich, Darwin Reyes-Hernandez
A new system for dielectrophoretic cell capture on porous polyester (PET) membranes is presented. Conventional photolithographic techniques were used to fabricate gold microelectrodes on a PET membrane. We characterized these electrodes to proof that there

SEM imaging of ultra-high aspect ratio hole features

March 29, 2012
Author(s)
John S. Villarrubia, Aron Cepler, Benjamin D. Bunday, Bradley Thiel
In-line, non-destructive process control metrology of high aspect ratio (HAR) holes and trenches has long been a known gap in metrology. Imaging the bottoms of at-node size beyond 10:1 AR contact holes in oxide has not yet been demonstrated. Nevertheless

A Case Study on the Impact of Local Material Chemistry on the Mechanical Reliability of Packaged Integrated Circuits: Correlation of the Packaging Fallout to the Chemistry of Passivation Dielectrics in an Al-Cu System

March 19, 2012
Author(s)
Chukwudi A. Okoro, Yaw S. Obeng
In this paper, we use a variety of analytical techniques to examine the impact of local chemistry, and the mechanical properties, of the encapsulation dielectric films on the post-packaging device rejection rate of integrated circuit devices. A strong

Carbohydrate-Functionalized Surfactant Vesicles for Controlling Glycan Density

March 15, 2012
Author(s)
Monique A. Makos, Rebecca A. Zangmeister
We report on the development of a method for rapidly characterizing the glycan binding properties of lectins. Catanionic surfactant vesicles were prepared that spontaneously formed in water and remained stable at room temperature for months. By varying the
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