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Electronics

Electromagnetics

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Displaying 1251 - 1275 of 1580

Calibrating On-Wafer Probes to the Probe Tips

December 1, 1992
Author(s)
Dylan F. Williams, Roger Marks
This paper investigates the accuracy of on-wafer scattering-parameter calibrations at the probe tips. Data show the extent to which certain probe-tip calibrations are consistent with one another and applicable to the characterization of devices or circuits

Interconnection Transmission Line Parameter Characterization

December 1, 1992
Author(s)
Roger Marks, Dylan Williams
This paper introduces a new method for the characterization of transmission lines fabricated on lossy or dispersive dielectrics. The method, which is more accurate than conventional techniques, is used to examine the resistance, inductance, capacitance

Planar Resistors for Probe Station Calibration

December 1, 1992
Author(s)
Dave K. Walker, Dylan F. Williams, Nicole Morgan
This paper investigates the effects of variations in sheet resistance, geometry, distance from the probe tip, and fabrication processes on the impedance of planar nickel-chromium resistors. Resistor reactance is a strong function of film resistance, but

A General Waveguide Circuit Theory

October 1, 1992
Author(s)
Roger Marks, Dylan F. Williams
This work generalizes and extends the classical circuit theory of electromagnetic waveguides. Unlike the conventional theory, the present formulation applies to all waveguides composed of linear, isotropic material, even those involving lossy conductors

Wafer Probe Transducer Efficiency

October 1, 1992
Author(s)
Dylan F. Williams, Roger Marks, Dave K. Walker, Fred R. Clague
Experimental evidence is presented that shows the conventional expression relating the transducer efficiency of a two-port to measured scattering parameters is incorrect when the characteristic impedance at one of the ports is complex. This evidence is
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