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Electronics

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Displaying 226 - 250 of 690

Graphene as Transparent Electrode for Direct Observation of Hole Photoemission from Silicon to Oxide

March 27, 2013
Author(s)
Rusen Yan, Qin Zhang, Oleg A. Kirillov, Wei Li, James I. Basham, Alexander G. Boosalis, Xuelei X. Liang, Debdeep Jena, Curt A. Richter, Alan C. Seabaugh, David J. Gundlach, Huili G. Xing, Nhan V. Nguyen
The outstanding electrical and optical properties of graphene make it an excellent alternative as a transparent electrode. Here we demonstrate the application of graphene as collector material in internal photoemission (IPE) spectroscopy; enabling the

Organosilicate Polymer E-Beam Resists with High Resolution, Sensitivity and Stability

February 28, 2013
Author(s)
Christopher Soles, Richard Kasica, Hae-Jeong Lee, Jae H. Sim, Sung-Il Lee, Ki-Bum Kim, Hyun-Mi Kim, Do Y. Yoon
Hydrogen silsesquioxane (HSQ) is an attractive electron-beam (e-beam) resist for sub-20 nm lithography due to its high resolution, excellent line-edge-roughness (LER), and good plasma etch resistance. However, the sensitivity and long-term stability of HSQ

Nonlinear acoustic effects in multilayer ceramic capacitors

January 25, 2013
Author(s)
Ward L. Johnson, Sudook A. Kim, Timothy P. Quinn, Grady S. White
Nonlinear resonant acoustics was explored as an approach for nondestructively evaluating the susceptibility of BaTiO3-based multilayer ceramic capacitors to electrical failure during service. The acoustic nonlinearity was characterized through measurements

NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications

December 21, 2012
Author(s)
Bethany E. Hackett, Bradley Moore, Dennis G. Camell
NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications, presents the technical requirements and guidance for the accreditation of laboratories under the NVLAP Electromagnetic Compatibility and Telecommunications (ECT) LAP. It is

Direct Measurement of Intrinsic Dirac Point and Fermi level at Graphene/Oxide interface and Its Band Alignment by Cavity Enhanced Internal Photoemission

December 17, 2012
Author(s)
Kun Xu, Caifu Zeng, Qin Zhang, Rusen Yan, Peide Ye, Kang Wang, Alan C. Seabaugh, Huili G. Xing, John S. Suehle, Curt A. Richter, David J. Gundlach, Nhan V. Nguyen
We report the first direct measurement of the Dirac point, the Fermi level, and the work function of graphene by performing internal photoemission measurements on a graphene/SiO2/Si structure with a unique optical-cavity enhanced test structure. A complete

Third-Round Report of the SHA-3 Cryptographic Hash Algorithm Competition

November 15, 2012
Author(s)
Shu-jen H. Chang, Ray A. Perlner, William E. Burr, Meltem Sonmez Turan, John M. Kelsey, Souradyuti Paul, Lawrence E. Bassham
The National Institute of Standards and Technology (NIST) opened a public competition on November 2, 2007 to develop a new cryptographic hash algorithm - SHA-3, which will augment the hash algorithms specified in the Federal Information Processing Standard

Giant piezoelectricity in PMN-PT thin films: Beyond PZT

November 1, 2012
Author(s)
S. H. Baek, M. S. Rzchowski, Vladimir Aksyuk
Micro-electromechanical systems (MEMS) incorporating piezoelectric layers provide active transduction between electrical and mechanical energy, which enables highly sensitive sensors and low-voltage driven actuators surpassing the passive operation of

On the Nonlinearity of Maximum-length NFSR Feedbacks

August 14, 2012
Author(s)
Meltem Sonmez Turan
Linear Feedback Shift Registers (LFSRs) are the main building block of many classical stream ciphers; however due to their inherent linearity, most of the LFSR-based designs do not offer the desired security levels. In the last decade, using Nonlinear

Simple Test and Modeling of RFID Tag Backscatter

July 1, 2012
Author(s)
Daniel G. Kuester, David R. Novotny, Jeffrey R. Guerrieri, Aniwar Ibrahim, Zoya Popovic
We consider here worst-case analysis of backscatter from passive radio frequency identification (RFID) tags. The basis is a figure of merit "B" to relate link power at reader ports to tag circuit parameters. A minimum bound for received monostatic

SIM.EM-S5 Voltage, Current and Resistance Comparison

June 1, 2012
Author(s)
Harold Sanchez, Lucas Di Lillo, Gregory Kyriazis, Rodrigo Ramos, Randolph Elmquist, Nien F. Zhang
This paper reports the results of the second Interamerican Metrology System (SIM) comparison on calibration of digital multimeters, performed for strengthening the interaction among National Metrology Institutes (NMIs) and for establishing the degree of

A thickness-shear MEMS resonator employing electromechanical transduction through a coplanar waveguide

May 21, 2012
Author(s)
Ward L. Johnson, Thomas M. Wallis, Pavel Kabos, Eduard Rocas, Juan C. Collado Gomez, Li-Anne Liew, Albert Davydov, Alivia Plankis, Paul R. Heyliger
The design, modeling, fabrication, and characterization of a vibrationally trapped thickness-shear MEMS resonator is presented. This device is intended to avoid various limitations of flexural MEMS resonators, including nonlinearity, clamping losses

NIST Framework and Roadmap for Smart Grid Interoperability Standards, Release 2.0

February 16, 2012
Author(s)
George W. Arnold, Gerald FitzPatrick, David A. Wollman, Thomas L. Nelson, Paul A. Boynton, Galen H. Koepke, Allen R. Hefner Jr., Cuong Nguyen, Jeffrey A. Mazer, Dean Prochaska, Marianne M. Swanson, Tanya L. Brewer, Victoria Yan Pillitteri, David H. Su, Nada T. Golmie, Eric D. Simmon, Allan C. Eustis, David Holmberg, Steven T. Bushby, Michael D. Janezic, Ajitkumar Jillavenkatesa
The Energy Independence and Security Act (EISA) of 2007 requires that NIST develop a framework of standards for the Smart Grid. This document is the second release of the framework first published in January, 2010. It covers the activities and outputs of

A statistical study of de-embedding applied to eye diagram analysis

February 1, 2012
Author(s)
Paul D. Hale, Jeffrey A. Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M. Dienstfrey, Dylan F. Williams
We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any
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