NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Electronics

Search Publications

Search Title, Abstract, Conference, Citation, Keyword or Author
  • Published Date
Displaying 251 - 275 of 690

Radio Frequency and Analog/Mixed-Signal Technologies

January 20, 2012
Author(s)
Herbert S. Bennett, John J. Pekarik
This 2011 roadmap for radio frequency and analog/mixed-signal (RF and AMS) technologies presents the challenges, technology requirements, and potential solutions for the basic technology elements (transistors and passive devices). RF and AMS technologies

Origin of Electrical Signals for Plasma Etching Endpoint Detection

November 18, 2011
Author(s)
Mark A. Sobolewski
Electrical signals are used for endpoint detection in plasma etching, but the origin of the electrical changes observed at endpoint is not known. They may be caused by changes in the gas-phase densities of etch products and reactants or by changes in

In Situ Gas Phase Diagnostics for Titanium Nitride Atomic Layer Deposition

October 14, 2011
Author(s)
James E. Maslar, William A. Kimes, Brent A. Sperling
This report describes the performance of a technique for the simultaneous, rapid measurement of major gas phase species present during titanium nitride thermal atomic layer deposition involving tetrakis(dimethylamido) titanium (TDMAT) and ammonia. In this

Radiation, Multimode Propagation, and Substrate Modes in W-Band CPW Calibrations

October 10, 2011
Author(s)
Dylan F. Williams, Franz-Joseph Schmuckle, Ralf Dorner, G.N. Phung, Wolfgang Heinrich, Uwe Arz
We investigate the degradation of the accuracy of coplanar waveguide calibration standards at higher frequencies due to multi-mode propagation, substrate modes, and radiation. Based on a typical calibration substrate, we investigate these effects and their

In Situ Gas Phase Measurements During Metal Alkylamide Atomic Layer Deposition

July 12, 2011
Author(s)
James E. Maslar, William A. Kimes, Brent A. Sperling
Metal alkylamide compounds, such as tetrakis(ethylmethylamido) hafnium (TEMAH), represent a technologically important class of metalorganic precursors for the deposition of metal oxides and metal nitrides via atomic layer deposition (ALD) or chemical vapor

Stable isotope-labeling of DNA repair proteins, and their purification and characterization

July 1, 2011
Author(s)
M Miral Dizdar, Pawel Jaruga, Prasad T. Reddy, Bryant C. Nelson, Mark S. Lowenthal
Reduced DNA repair capacity is associated with increased risk for a variety of disease processes including carcinogenesis. Thus, DNA repair proteins have the potential to be used as important predictive, prognostic and therapeutic biomarkers in cancer and

Fluid interactions with metafilm/metasurfaces for tuning, sensing, and microwave assisted chemical processes

May 25, 2011
Author(s)
Joshua A. Gordon, Christopher L. Holloway, James C. Booth, James R. Baker-Jarvis, David R. Novotny, Sung Kim, Yu Y. Wang
In this paper we demonstrate tunability of a metafilm, which is the two-dimensional equivalent of a metamaterial, also referred to as a metasurface, by changing the permittivity in a micro-fluidic channel that interacts with the metafilm. Numerical

Noise-Parameter Measurements with a Reflection Type Phase Shifter

November 1, 2010
Author(s)
Dazhen Gu, Dave K. Walker, James P. Randa
We report a miniaturized phase shifter operating in the frequency range from 5 GHz to 7 GHz for noise-parameter extraction. Such a tunable solid-state unit represents a significant reduction in the size and mass as a source-pull component, compared to its

Editorial: Message From the Outgoing Editors

September 10, 2010
Author(s)
Dylan F. Williams
Some four years ago, we took the responsibility for editing this TRANSACTIONS. Our editorial duties have now ended. It has been a privilege and honor to serve our readers and our authors.

Conductive Carbon Nanotubes for Semiconductor Metrology

August 10, 2010
Author(s)
Joseph J. Kopanski, Victor H. Vartanian, Vladimir Mancevski, Phillip D. Rack, Ilona Sitnitsky, Matthew D. Bresin
This paper presents an evaluation of e-beam assisted deposition and welding of conductive carbon nanotube (c-CNT) tips for electrical scanning probe microscope measurements. Variations in CNT tip conductivity and contact resistance during fabrication were

REFLECTIVITY STUDIES OF PASSIVE MICROWAVE CALIBRATION TARGETS AND ABSORPTIVE MATERIALS

July 30, 2010
Author(s)
Dazhen Gu, Amanda Cox, Derek A. Houtz, Dave K. Walker, James P. Randa, Robert L. Billinger
We report the characterization of blackbody reflections as a part of the recent progress on the development of brightness standards for microwave remote sensing at National Institute of Standards and Technology (NIST).Three blackbody targets at variable

Examining the True Effectiveness of Loading a Reverberation Chamber

July 29, 2010
Author(s)
Jason Coder, John M. Ladbury, Christopher L. Holloway, Kate Remley
In this paper we explore how placing the same amount of absorber in different locations within a reverberation chamber can have different loading effects. This difference can have a significant impact on measurement reproducibility, both for measurements

COMPARISON OF NEAR-FIELD METHODS AT NIST K. MacReynolds, M.H. Francis and D. Tamura

July 14, 2010
Author(s)
Katherine MacReynolds, Michael H. Francis, Douglas T. Tamura
A comparison of the planar, spherical and cylindrical near-field techniques was completed at the National Institute of Standards and Technology (NIST) for a Ku-band Cassegrain reflector antenna. This paper discusses the measurement results for the near-to

Calibration service for instruments that measure laser beam diameter

July 1, 2010
Author(s)
Shao Yang
This document describes the calibration service for instruments that measure laser beam diameter. An overview of the measurement procedures, measurement system, and uncertainty analysis is presented. A sample measurement report is included in this document
Was this page helpful?