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PUBLICATIONS

SIM.EM-S5 Voltage, Current and Resistance Comparison

Published

Author(s)

Harold Sanchez, Lucas Di Lillo, Gregory Kyriazis, Rodrigo Ramos, Randolph Elmquist, Nien F. Zhang

Abstract

This paper reports the results of the second Interamerican Metrology System (SIM) comparison on calibration of digital multimeters, performed for strengthening the interaction among National Metrology Institutes (NMIs) and for establishing the degree of equivalence between those laboratories in accordance with the CIPM Mutual Recognition Agreement. From June 2007 to October 2009, four multimeters were used as traveling standards for measurements in eleven countries, with NIST-USA acting as pilot laboratory. Results for nine measurement points are presented as errors relative to a comparison reference value together with their uncertainty.
Proceedings Title
Conference on Precision Electromagnetic Measurements 2012
Conference Dates
June 30-July 6, 2012
Conference Location
Washington, DC, US
Pub Type
Conferences

Keywords

Comparison, multimeter, measurement error, measurement uncertainty
Metrology, Electronics and Advanced communications

Citation

Sanchez, H. , Di Lillo, L. , Kyriazis, G. , Ramos, R. , Elmquist, R. and Zhang, N. (2012), SIM.EM-S5 Voltage, Current and Resistance Comparison, Conference on Precision Electromagnetic Measurements 2012 , Washington, DC, US (Accessed October 20, 2025)

Issues

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Created May 31, 2012, Updated October 12, 2021
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