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Displaying 1676 - 1700 of 2103

Quantitative Proteomic Profiling of Prematurely Senescent ARPE-19 Cells

January 1, 2001
Author(s)
Illarion Turko, Wei-Li Liao
Senescence of retinal pigment epithelial (RPE) cells is a crucial event in the pathogenesis of age-related macular degeneration (AMD). ARPE-19 is a nontransformed human RPE cell line that displays many differentiated properties typical of RPE in vivo. The

Sum Frequency Spectroscopy Studies of Adsorption of Additives on Metal/Electrolyte Interfaces

November 1, 2000
Author(s)
Clayton S. Yang, Lee J. Richter, Kimberly Briggman, John C. Stephenson, Thomas P. Moffat, Gery R. Stafford
In situ and ex situ VR-SFG studies of mercaptopropylsulfonate (MPSA) molecules adsorbed on metal/electrolyte interfaces prove the molecular conformation is sensitive to hydration. MPSA catalyses electrodeposition of copper interconnection for semiconductor

Low-Level (Submicromole) Environmental 14 C Metrology

October 1, 2000
Author(s)
Lloyd A. Currie, J D. Kessler, J V. Marolf, A. P. McNichol, D R. Stuart, J C. Donoghue, D. J. Donahue, William Burr, D Biddulph
Accelerator Mass Spectrometry (AMS) measurements of environmental 14C have been employed during the past decade at the several micromole level (10's of ug carbon), but advanced research in the atmospheric and marine sciences demands still higher

NIST Data Resources for X-Ray Photoelectron Spectroscopy

October 1, 2000
Author(s)
Cedric J. Powell
A short description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for X-Ray Photoelectron Spectroscopy (XPS). NIST currently has three databases available: an XPS Database (SRD 20), an Elastic

Assessment of Sensitivity Advances in Near-Field Raman Spectroscopy

September 1, 2000
Author(s)
Chris A. Michaels, C E. Dentinger, Lee J. Richter, D B. Chase, Richard R. Cavanagh, Stephan J. Stranick
Near-field Raman spectroscopy can be used to obtain images with both chemical specificity and the subwavelength spatial resolution of near-field scanning optical microscopy (NSOM). In the absence of signal intensification factors, such as surface
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