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Four reference materials from NIST will help the U.S. Food and Drug Administration and Customs and Border Protection agencies assess whether imported salmon and
Researchers from NIST have developed hazelnut and almond flour reference materials that will help ensure accurate and consistent results for industry test kits.
Overview Capture of carbon dioxide from the air (direct air capture; DAC) combined with energy efficiency and carbon capture, utilization and storage (CCUS)
NIST is developing an integrated measurement services program for forensic and Cannabis (hemp and marijuana) laboratories to help ensure the quality of routine
Far-infrared (or terahertz/THz, ca. 25 to 300 micron wavelength) femtosecond pulsed laser and Fourier-transform infrared methods are employed to measure
Conventional techniques for analyzing chemical composition, such as infrared (IR) microscopy often miss critically important nanoscale details. To overcome this
Sang Hee Hong, Jessica L. Reiner, Mi Jang, Stacy Schuur, Gi Myung Han, John Kucklick, Won Joon Shim
Contamination status and characteristics of perfluorinated alkyl acids (PFAAs) including perfluorinated carboxylic acids (PFCAs) and perfluorinated sulfonic
Papa Amoah, zeinab Hassan, Pengtao Lin, Engelbert Redel, Helmut Baumgart, Yaw S. Obeng
We leverage thermal- and chemical-induced changes in microwave propagation characteristics (i.e., S-parameters) to compare ZnO and surface anchored metal
For hydrogen-deuterium exchange mass spectrometry (HDX-MS) to have an increased role in quality control of biopharmaceuticals, H for D back-exchange occurring
Christina Cecelski, Blaza Toman, Fong-Ha Liu, Juris Meija, Antonio Possolo
A model for errors-in-variables regression is described that can be used to overcome the challenge posed by mutually inconsistent calibration data. The model
The NIST Mass and Fragment Calculator is a program written in Visual Basic which calculates the mass of an input peptide or protein sequence along with m/z ions
CLIP is an analysis program for fluorescence lifetime images. It provides the user with the ability to fit or calculate the phasor plots for lifetime decays
The Nova NanoLab 600 (NNL600) is a Focused Ion Beam Scanning Electron Microscope equipped with spectroscopic detectors to allow elemental and phase measurements
The Bruker D8 defractometer is a general purpose X-ray diffraction system. The instrument features easy reconfiguration of the X-ray optics for a variety of
The ASPEX Personal SEM (PSEM) is a tungsten filament scanning electron microscope optimized for automated particle analysis. The system was designed with