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Chemistry

Analytical chemistry

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  • Published Date
Displaying 1401 - 1425 of 2094

Determination of Lipid Phase Transition Temperatures in Hybrid Bilayer Membranes

September 9, 2006
Author(s)
Neil A. Anderson, Lee J. Richter, John C. Stephenson, Kimberly A. Briggman
The main gel to liquid crystal (LC) phase transition temperature, Tm, of the lipid monolayers in hybrid bilayer membranes (HBMs) was investigated using vibrational sum frequency spectroscopy (VSFS). The unique sensitivity of VSFS to probe order/disorder

Depth Profiling Using C 60 + SIMS Deposition and Topography Development During Bombardment of Silicon

July 30, 2006
Author(s)
John G. Gillen, J Batteas, Chris A. Michaels, P Chi, John A. Small, Eric S. Windsor, Albert J. Fahey, Jennifer R. Verkouteren, W Kim
A C60+ primary ion source has been coupled to an ion microscope SIMS instrument to examine sputtering of silicon with an emphasis on possible application of C60+ depth profiling for high depth resolution SIMS analysis of silicon semiconductor materials

Ionic Liquids Database (ILThermo)

July 23, 2006
Author(s)
Qian Dong, Andrei F. Kazakov, Chris D. Muzny, Robert D. Chirico, Jason A. Widegren, Vladimir Diky, Joe W. Magee, Kenneth N. Marsh, Michael D. Frenkel
Ionic Liquids Database (ILThermo)is a free web research tool that allow users worldwide to access an up-to-data data collection from the publications on experimental studies of thermodynamic and transport properties of ionic liquids, as well as binary and

Enzyme Activity to Augment the Characterization of Tethered Bilayer Membranes

June 1, 2006
Author(s)
Gintaras Valincius, Duncan J. McGillivray, W. Febo-Ayala, David J. Vanderah, John J. Kasianowicz, Mathias Losche
The structural order of tethered lipid bilayers (tBLMs) on solid substrates, investigated with electrochemical impedance spectroscopy (EIS) and neutron reflectivity (NR), is further characterized by phospholipase activity. Whereas EIS and NR data indicate

Preparation and Characterization of a Suite of Ephedra-Containing Standard Reference Materials

June 1, 2006
Author(s)
Katherine E. Sharpless, D L. Anderson, J. M. Betz, Therese A. Butler, S. G. Capar, J. Cheng, C. Fraser, M. L. Gay, G. Gardner, D W. Howell, T. Ihara, J. W. Lam, Stephen E. Long, M. McCooeye, Elizabeth A. Mackey, W. R. Mindak, S. Mitvalsky, Karen E. Murphy, Karen W. Phinney, A. NguyenPho, Barbara J. Porter, M. C. Roman, Lane C. Sander, Mary B. Satterfield, C. Scriver, R. E. Sturgeon, Jeanice M. Brown Thomas, Robert D. Vocke Jr., Stephen A. Wise, Laura J. Wood, L. Yang, James H. Yen, G. C. Ziobro

k=2 and Other Sometimes Hidden Assumptions in Chemical Measurement Uncertainty Intervals

April 24, 2006
Author(s)
David L. Duewer, S L. Ellison, William F. Guthrie, D B. Hibbert, C Jackson, A Kallner, Stefan D. Leigh, Reenie M. Parris, Kenneth W. Pratt, Michele M. Schantz, Katherine E. Sharpless
A recent interlaboratory study that required individual analysts to estimate uncertainty intervals for their results revealed that some experienced chemical analysts have difficulty with measurement uncertainty calculations. To help validate assumptions
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