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PUBLICATIONS

Quantitative Surface Analysis of Fe-Ni Alloy Films by XPS, AES and SIMS

Published

Author(s)

David S. Simons, K. J. Kim, John G. Gillen, D Moon, H Jin, H Kang
Citation
Surface and Interface Analysis
Volume
39
Issue
8
Pub Type
Journals

Keywords

surface quantification, Fe-Ni Alloy, ICP-MS, C60 SIMS, isotope dilution method
Analytical chemistry and Composition and structure

Citation

Simons, D. , Kim, K. , Gillen, J. , Moon, D. , Jin, H. and Kang, H. (2007), Quantitative Surface Analysis of Fe-Ni Alloy Films by XPS, AES and SIMS, Surface and Interface Analysis (Accessed June 17, 2025)

Issues

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Created May 21, 2007, Updated February 19, 2017
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