Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Quantitative Surface Analysis of Fe-Ni Alloy Films by XPS, AES and SIMS

Published

Author(s)

David S. Simons, K. J. Kim, John G. Gillen, D Moon, H Jin, H Kang
Citation
Surface and Interface Analysis
Volume
39
Issue
8

Keywords

surface quantification, Fe-Ni Alloy, ICP-MS, C60 SIMS, isotope dilution method

Citation

Simons, D. , Kim, K. , Gillen, J. , Moon, D. , Jin, H. and Kang, H. (2007), Quantitative Surface Analysis of Fe-Ni Alloy Films by XPS, AES and SIMS, Surface and Interface Analysis (Accessed May 29, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 21, 2007, Updated February 19, 2017