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Periodic Table: Atomic Properties of the Elements. This is version 2, which incorporates previously published revisions of mass numbers for some stable isotopes.
Mention has already been made, in Section 5.1. Of the use of DNA-based techniques for control of microbiological DNA. In parallel to the work of ATCC the USA National Institute of Standards and Technology (NIST) developed three Standard Reference Materials
Adolfas K. Gaigalas, L. Li, O. Henderson, R F. Vogt, J. Barr, G E. Marti, J. Weaver, A. Schwartz
The use of fluorescence as an analytical technique has been growing over the last 20 years. A major factor in inhibiting more rapid growth has been the inability to make comparable fluorescence intensity measurements across laboratories. NIST recognizes
Mixing of fluids is a central component to innumerable operations in chemical processing on the plant floor and also in many laboratory operations. Most mixing applications simply require the efficient blending of fluids present in a single phase, such as
We explore the use of evanescent wave cavity ring-down spectroscopy (EW-CRDS) for water detection through a signal-to-noise ratio analysis. Cavity ring-down spectroscopy (CRDS) is an emerging optical absorption technique that employs the mean photon decay
We report measurements and a model of gas flow through a helical duct of rectangular cross section. The measurements on helium, nitrogen, argon, and sulfur hexafluoride yielded molar flow rates from observations of the rate of rise of pressure in a known
Measurement of 8-hydroxy-2'-deoxyguanosine (8-OH-dGuo) in DNA by high-performance liquid chromatography/mass spectrometry (HPLC/MS) was studied. A methodology was developed for separation by LC of 8-OH-dGuo from intact and modified nucleosides in DNA
This report summarizes the research and services provided by the Chemical Science and Technology Laboratory of the National Institute of Standards and Technology for Fiscal Year 2000. The report includes: a general overview of the laboratory's activities
This chapter describes microscopes and microprobes used for analysis of collected, individual particles. The instruments discussed are the light microscope, electron microscopes (scanning, environmental and transmission), electron microprobes, laser
E Landree, Terrence J. Jach, D Brady, A. Karamcheti, J Canterbury, W Chism, A C. Diebold
To achieve the future goals for logic device dielectric film thickness and composition metrology, a set of well-characterized calibration reference material standards are needed for validating real-time diagnostic techniques used during production. However
John G. Gillen, S V. Roberson, Albert J. Fahey, Marlon L. Walker, J Bennett, R Lareau
We are evaluating the use of polyatomic and cluster primary ion beams for characterization of semiconductor materials by secondary ion mass spectrometry using both magnetic sector and time-of-flight SIMS instruments. Primary ion beams of SF 5+, C 8- and