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This editorial column in the Newsletter describes a recent "EMC for the Smart Grid" workshop held at Connectivity Week 2010 in Santa Clara, CA. The text is
This article is part of a series on Professional Development for NCSLI and Metrology Trainers. This article presents guidance on the five steps of adult
Sustainable manufacturing (SM) broadly implies the development of innovative manufacturing sciences and technologies that span the life cycle of products and
Paul McClure, Vladimir Mancevski, Joseph Kopanski, Ilona Sitnitsky, Vincent LaBella, Kathleen Dunn, Matthew D. Bresin, Phillip D. Rack, Victor H. Vartanian
Paul R. Garabedian, a leader in the field of computational science, passed away on May 13th, 2010, at his home in Manhattan at the age of 82 after a long battle
The micromechanics community has developed a large set of tools for measuring the properties of micro- and nano-scaled materials. These new tools have been
Despite the potential for high-speed communications, stringent regulatory mandates on Ultra-Wideband (UWB) emission have hindered its commercial success. By
Ian M. Soboroff, Craig Macdonald, Rodrygo Santos, Iadh Ounis
The TREC Blog track aims to explore information seeking behaviour in the blogosphere, by building reusable test collections for blog-related search tasks. Since
Catherine A. Remley, Christopher L. Holloway, william F. Young
The National Institute of Standards and Technology (NIST) has just released the sixth in a series of NIST technical notes (TN) on radio signal penetration of
James P. Cline, David R. Black, David L. Gil, Albert Henins, Donald A. Windover
The fundamental parameters approach (FPA) as implemented in TOPAS is investigated for analyses of conventional X-ray powder diffraction (XRPD) data. The FPA
This article is part of a series on Professional Development for NCSLI and Metrology Trainers. This article presents guidance on writing learning objectives for
Rajmohan Madhavan, Elena R. Messina, Angel P. Del Pobil
The Technical Committee on Performance Evaluation and Benchmarking for Robotic and Automation Systems (TC-PEBRAS) was approved at the Technical Activities Board
Jiann Yang, Thomas Cleary, D L. Urban, Gary A. Ruff, William Sheredy, Zeng-guang Yuan, G W. Mulholland
This is the final report of a research project entitled Smoke Aerosol Measurements Experiment (SAME). Smoke and/or fire detection in the spacecraft is crucial
Aaron M. Forster, Aurelien Blond, Donald L. Hunston
The inclusion of phase-separated rubber particles in a brittle thermoset matrix has been shown to increase the Mode I fracture energies for a wide range of
Sara E. Mason, Anne M. Chaka, Thomas P. Trainor, Christopher Iceman
The ability to apply existing density functional theory-based modeling techniques to timely research problems in environmental chemistry is demonstrated by an {
Electrodeposition is a key fabrication process used in the state-of-the-art multilevel Cu metallization of microelectronic interconnects from transistor to
The National Institute of Standards and Technology (NIST) has deployed Reference Material (RM) scaffolds for tissue engineering: a series of well-characterized
A Rostapshov, D Martin, D A. Branning, E Dauler, S Thomas, Alan L. Migdall, N Boeuf, Andreas Muller
A series of photos of parametric downconversion are presented in movie format to help illustrate and understand the mechanics of parametric downconversion and
A redefinition to replace the last remaining artifact based SI unit, the kilogram, may occur as early as 2011. This article presents a short summary of the
Because they enable true interoperability, information exchange standards can help manufacturers reduce cost and improve product quality, but only if the
Maynard S. Dewey, Kevin J. Coakley, David M. Gilliam, G. Greene, A. Laptev, Jeffrey S. Nico, William M. Snow, F. E. Wiefeldt, A. Yue
In the most accurate cold neutron beam determination of the neutron lifetime based on the absolute counting of decay protons, the largest uncertainty was
Atomic Force Microscopy (AFM) is a widely used technique for imaging surfaces and measuring properties at the micro and nano-scales; however, the accuracy and
Dylan F. Williams, Arkadiusz C. Lewandowski, Denis X. LeGolvan, Ronald A. Ginley
The National Institute of Standards and Technology (NIST) has just introduced a fully electronic measurement verification system for microwave vector-network
Jaroslaw Grobelny, Frank W. DelRio, Pradeep Namboodiri, Doo-In Kim, Vincent A. Hackley, Robert F. Cook
In this assay protocol, procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imaging and height measurement via