McClure, P.
, Mancevski, V.
, Kopanski, J.
, Sitnitsky, I.
, LaBella, V.
, Dunn, K.
, Bresin, M.
, Rack, P.
and Vartanian, V.
(2010),
Conductive Nanotube-based Scanning Probe Microscopy Applications, International SEMATECH Manufacturing Initiative Confidential, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907145
(Accessed December 15, 2024)
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Conductive Nanotube-based Scanning Probe Microscopy Applications
Published
Author(s)
Paul McClure, Vladimir Mancevski, , Ilona Sitnitsky, Vincent LaBella, Kathleen Dunn, Matthew D. Bresin, Phillip D. Rack, Victor H. Vartanian
Citation
International SEMATECH Manufacturing Initiative Confidential
Pub Type
Others
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 29, 2010, Updated October 14, 2021