NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

NIST Pubs

The Structure of a Moderate-Scale Methanol Pool Fire

Author(s)
Anthony P. Hamins, Andrew Lock
A series of measurements was made to characterize the structure of a moderate-sized methanol pool fire steadily burning in a quiescent environment. Time

Impact of NIST Laboratory Outputs on Innovation

Author(s)
Gary W. Anderson Jr.
The National Institute of Standards and Technology’s (NIST) mission is to “promote U.S. innovation and industrial competitiveness.” To meet this mission, NIST

NIST Impact on Patenting

Author(s)
Gary W. Anderson Jr.
The National Institute of Standards and Technology’s (NIST) mission is to “promote U.S. innovation and industrial competitiveness.” To meet this mission, NIST

Measuring Temperature in Emission Testing Micro-chambers

Author(s)
Dustin G. Poppendieck, Edwin Guillermo, Havishk Tripathi
ASTM subcommittee D22.05 on Indoor Air is working to finalize WK40293: Standard Test Method for Estimating Chemical Emissions from Spray Polyurethane Foam (SPF)

Making Email Trustworthy

Author(s)
Scott W. Rose, Larry Feldman, Gregory A. Witte
This bulletin summarizes the information presented in NIST SP 800-177: Trustworthy Email. This publication gives recommendations and guidelines for enhancing

Report on the May 2016 ASTM E57.02 instrument runoff at NIST, Part 2 - NIST realization of test procedures and uncertainties in the reference lengths

Author(s)
Balasubramanian Muralikrishnan, Prem K. Rachakonda, Katharine M. Shilling, Vincent D. Lee, Christopher J. Blackburn, Daniel S. Sawyer, Geraldine S. Cheok, Luc Cournoyer
There is ongoing activity within ASTM E57.02 working group WK43218 [1] to develop a documentary standard for point-to-point distance performance evaluation of

Nanolithography Toolbox

Author(s)

Bojan R. Ilic, Krishna Coimbatore Balram, Daron A. Westly, Marcelo I. Davanco, Karen E. Grutter, Qing Li, Thomas Michels, Christopher H. Ray, Liya Yu, Neal A. Bertrand, Samuel M. Stavis, Vladimir A. Aksyuk, James A. Liddle, Brian A. Bryce, Nicolae Lobontiu, Yuxiang Liu, Meredith Metzler, Gerald Lopez, David Czaplewski, Leonidas Ocola, Pavel Neuzil, Vojtech Svatos, Slava Krylov, Christopher B. Wallin, Ian J. Gilbert, Kristen A. Dill, Richard J. Kasica, Kartik A. Srinivasan, Gregory Simelgor, Juraj Topolancik

The Nanolithography Toolbox

Author(s)
Krishna Coimbatore Balram, Daron Westly, Marcelo I. Davanco, Karen E. Grutter, Qing Li, Thomas Michels, Christopher H. Ray, Richard Kasica, Christopher B. Wallin, Ian J. Gilbert, Brian A. Bryce, Gregory Simelgor, Juraj Topolancik, Nicolae Lobontiu, Yuxiang Liu, Pavel Neuzil, Vojtech Svatos, Kristen A. Dill, Neal A. Bertrand, Meredith Metzler, Gerald Lopez, David Czaplewski, Leonidas Ocola, Kartik Srinivasan, Samuel Stavis, Vladimir Aksyuk, James Alexander Liddle, Slava Krylov, Robert Ilic
This article describes a platform-independent software package for scripted lithography pattern layout generation and complex processing. The Nanolithography
Was this page helpful?