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Jeanita Pritchett, Katrice A Lippa, Mary Bedner, Carolyn Q Burdette, Johanna E Camara, David L Duewer, Brian E Lang, Michael A Nelson, Antonio Possolo, Jeanice Brown Thomas, Lane C Sander, Lorna T Sniegoski, Susan S Tai
Paul E. Black, Mark L. Badger, Barbara Guttman, Elizabeth N. Fong
The call for a dramatic reduction in software vulnerability is heard from multiple sources, recently from the February 2016 Federal Cybersecurity Research and
The NIST Digital Manufacturing Certificate (DMC) Toolkit is a toolkit designed specifically to provide certification -- digital signature using software and
Statistical properties such as the spectral density and spatial coherence of boundary layer turbulence affect bluff body aerodynamics and structural responses
This paper gives the 2014 self-consistent set of values of the constants and conversion factors of physics and chemistry recommended by the Committee on Data
This bulletin summarizes the information presented in NIST SP 800-178: A Comparison of Attribute Based Access Control (ABAC) Standards for Data Service
The National Institute of Standards and Technology (NIST) is commencing the implementation of certain statistical procedures, namely errors-in-variables
David Urbina, Jairo Giraldo, Alvaro Cardenas, Junia Valente, Mustafa Faisal, Niles O. Tippenhauer, Justin Ruths, Rick Candell, Heinrik Sandberg
Monitoring the "physics" of control systems to detect attacks is a growing area of research. In its basic form a security monitor creates time-series models of
Craig Blue, Larry Brown, Yoel Fink, Nick Justice, Michael Liehr, Tom McDermott, Ed Morris, Shawn P. Moylan
The Manufacturing USA program is composed of the collective of all of the manufacturing innovation institutes and a supporting Network. The Network serves the
As an exploratory analysis, demographic data from the 2000 Census and 2011 American Community Survey at the Zone Improvement Plan (ZIP) code level are used in
[Superseded by NIST SP 800-160 (November 2016, including updates as of 01-03-2016)] With the continuing frequency, intensity, and adverse consequences of cyber
Steven D. Phillips, Craig M. Shakarji, Alessandro Balsamo, Michael Krystek, Edward P. Morse
This paper discusses the recently published 2016 (third edition) of ISO 1. While the value of the standard reference temperature remains unchanged at 20 C
The National Institute of Standards and Technology (NIST) workshop on Software Measures and Metrics to Reduce Security Vulnerabilities (SwMM-RSV) was held on
Long-Term Evolution (LTE) supporting Device-to-Device (D2D) communication is a feature introduced in 3rd Generation Partnership Project (3GPP) release 12. D2D
NIST developed this NISTIR as a reference guideline for small businesses. This document is intended to present the fundamentals of a small business information
The workshop occurred on 12 July 2016 at National Institute of Standards and Technology (NIST). The workshop's object was software as a product. 20 position