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NIST Pubs

Proceedings of the 2009 Workshop on Innovative Fire Protection

Author(s)
Anthony P. Hamins, Francine K. Amon, Jason D. Averill, Nelson P. Bryner, David T. Butry, Rick D. Davis, Richard G. Gann, Jeffrey W. Gilman, Samuel L. Manzello, Randall J. McDermott, William E. Mell, Nathan D. Marsh
The Innovative Fire Protection Workshop was held at the National Institute of Standards and Technology (NIST) on June 4 and 5, 2009. The 70 participants...

Overlap-Based Cell Tracker

Author(s)
Joe Chalfoun, Antonio Cardone, Alden A. Dima, Michael Halter, Daniel P. Allen
In order to facilitate the extraction of quantitative data from live cell image sets, automated image analysis methods are needed. This paper presents an...

Overview of the TREC 2008 Blog Track

Author(s)
Ian M. Soboroff, Iadh Ounis, Craig Macdonald
The Blog track explores the information seeking behaviour in the blogosphere. The track was introduced in 2006 [1], with a main pilot search task, namely the...

NIST Framework and Roadmap for Smart Grid Interoperability Standards, Release 1.0

Author(s)
George W. Arnold, David A. Wollman, Gerald FitzPatrick, Dean Prochaska, David Holmberg, David H. Su, Allen R. Hefner Jr., Nada T. Golmie, Tanya L. Brewer, Mark Bello, Paul A. Boynton
Under the Energy Independence and Security Act (EISA) of 2007, the National Institute of Standards and Technology (NIST) is assigned "primary responsibility to...

Cryptographic Key Management Workshop Summary - June 8-9, 2009

Author(s)
Elaine B. Barker, Dennis K. Branstad, Santosh Chokhani, Miles E. Smid
On June 8 and 9, 2009, NIST held a Cryptographic Key Management (CKM) Workshop at its Gaithersburg, Maryland, campus that attracted approximately 80 people...

NIST Time and Frequency Bulletin

Author(s)
Eyvon Petty
The Time and Frequency Bulletin provides information on performance of time scales and a variety of broadcasts (and related information) to users of the NIST...

Nanoscale Measurements With the TSOM Optical Method

Author(s)
Ravikiran Attota
A novel through-focus scanning optical microscope (TSOM - pronounced as 'tee-som') technique that produces nanometer dimensional measurement sensitivity using a...
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