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Journals

The NIST Watt Balance: Progress Toward Monitoring the Kilogram

April 1, 1997

Author(s)

Richard L. Steiner, Andrew Gillespie, K Fujii, Edwin R. Williams, David B. Newell, Alain Picard, Gerard N. Stenbakken, P. T. Olsen

Low-Voltage Standards in the 10 Hz to 1 MHz Range

April 1, 1997

Author(s)

Nile M. Oldham, S. Avramov, Mark E. Parker, Bryan C. Waltrip

Exploring the Low-Frequency Performance of Thermal Converters Using Circuit Models and a Digitally Synthesized Source

April 1, 1997

Author(s)

Nile M. Oldham, Mark E. Parker, Barry A. Bell, S. Avramov

A New Refractometer by Combining a Variable Length Vacuum Cell and a Double-Pass Michelson Interferometer

April 1, 1997

Author(s)

K Fujii, Edwin R. Williams, Richard L. Steiner, David B. Newell

Recent Results and Future Challenges for the NIST Charged-Capacitor Experiment

April 1, 1997

Author(s)

Neil M. Zimmerman, J. L. Cobb, Alan F. Clark

Automated Guarded Bridge for Calibration of Multimegohm Standard Resistors from 10 M? to 1 T?

April 1, 1997

Author(s)

Dean G. Jarrett

Compensation for Geometrical Variations in Coplanar Waveguide Probe-Tip Calibration

April 1, 1997

Author(s)

Dave K. Walker, Dylan F. Williams

We show how coplanar-waveguide probe-tip scattering parameter calibrations performed in one coplanar waveguide conductor geometry may be adjusted for

Line-Reflect-Match (LRM) Calibration Technique for the Dual Six-Port ANA

April 1, 1997

Author(s)

Ronald A. Ginley

NIST/NCI Micronutrients Measurement Quality Assurance Program: Measurement Repeatabilities and Reproducibilities for Fat-Soluble Vitamin-Related Compounds in Human Sera

April 1, 1997

Author(s)

David L. Duewer, Jeanice M. Brown Thomas, Margaret C. Kline, William A. MacCrehan, R Schaffer, Katherine E. Sharpless, Willie E. May, J A. Crowell

Interlaboratory verification of silicon nitride tensile creep properties

April 1, 1997

Author(s)

William E. Luecke, Sheldon M. Wiederhorn

Five laboratories tested NIST-supplied, pin-loaded, 76-mm-long tensile creep specimens at 1400 degrees C under a 150 MPa load using flag-based, laser

Micromagnetic Computational Standard Problem (Abstract)

April 1, 1997

Author(s)

Robert D. McMichael, Michael J. Donahue

Proposed solutions to a standard problem in micromagnetics that were collected anonymously from a number of researchers using a variety of computational

Water in Crystal Contacts: Retention of Bridging Waters

April 1, 1997

Author(s)

David T. Gallagher, G L. Gilliland

Surface Plasmon Resonance Imaging Measurements of Electrostatic Biopolymer Adsorption onto Chemically Modified Gold Surfaces

April 1, 1997

Author(s)

C. E. Jordan, R. M. Corn

Glass and Dimensional Metrology

April 1, 1997

Author(s)

Theodore D. Doiron

Ordinary glass, even good optical quality glass, will shrink up to 20 micrometers/meter over the first few years after its manufacture. Gages made of glass are

High-Speed Grinding - Fundamentals and State of the Art in Europe, Japan, and the USA

April 1, 1997

Author(s)

F Klocke, E Brinksmeier, Christopher J. Evans, T Howes, I Inasaki, E Minke, H Tonshoff, J A. Webster, D Stuff

This paper describes the technological basis and the current state of the art in the field of high speed grinding. The technological fundamentals of high speed

Performance Analysis Tool for Scanning Electron Microscopes Used in Semiconductor Metrology

April 1, 1997

Author(s)

Michael T. Postek, Andras Vladar, M P. Davidson

Scanning electron microscopes (SEM) are being utilized extensively in the production environment, and these instruments are approaching full automation. Once a

Vertical-Cavity Surface-Emitting Lasers with Low-Ripple Optical Pumping Windows

April 1, 1997

Author(s)

K. J. Knopp, David H. Christensen, J. R. Hill

Surface roughness and height-height correlations dependence on thickness of YBaCuO thin films

April 1, 1997

Author(s)

Basil Blank, M E. Bijlsma, R. Moerman, H Rogalla, F. J. Stork, Alexana Roshko

For high T c superconducting multilayer applications, smooth interfaces between the individual layers are required. However, in general, e.g., YBaCuO grows in a

Development of Thin-Film Multijunction Thermal Converters at NIST

April 1, 1997

Author(s)

Joseph R. Kinard Jr., Donald B. Novotny, Thomas E. Lipe Jr., D. X. Huang

Focused Microwave-assisted Extraction of Polycyclic Aromatic Hydrocarbons in Open Cell from Reference Materials (Sediment, Soil, Air Particulate)

April 1, 1997

Author(s)

M. Letellier, H. Budzinski, P. Garrigues, Stephen Wise

Nonreciprocal Differential Detection Method for Scanning Kerr-Effect Microscopy

April 1, 1997

Author(s)

Thomas J. Silva, Anthony B. Kos

NIST Comparison of the Quantized Hall Resistance and the Realization of the SI Ohm Through the Calculable Capacitor

April 1, 1997

Author(s)

Anne-Marie Jeffery, Randolph Elmquist, Lai H. Lee, John Q. Shields, Ronald F. Dziuba

An Active High-Voltage Divider with 20 ?V/V Uncertainty

April 1, 1997

Author(s)

O. Petersons, Gerald FitzPatrick, Eric D. Simmon

Alignment Uncertainties of the NIST Watt Experiment

April 1, 1997

Author(s)

Andrew Gillespie, K Fujii, David B. Newell, P. T. Olsen, Alain Picard, Richard L. Steiner, Gerard N. Stenbakken, Edwin R. Williams

Magnetization Reversal and Coercive Force in Ultrathin Films with Perpendicular Surface Anisotropy: Micromagnetic Theory

April 1, 1997

Author(s)

Huibin Zhu, Xiaoyu X. Li

Nonlinear Optical Investigations of Magnetic Heterostructures

April 1, 1997

Author(s)

T. M. Crawford, Charles T. Rogers, Thomas J. Silva, Y K. Kim

A Seven-Junction Electron Pump: Design, Fabrication, and Operation

April 1, 1997

Author(s)

Mark W. Keller, John M. Martinis, A. H. Steinbach, Neil M. Zimmerman

A Compact Transportable Josephson Voltage Standard

April 1, 1997

Author(s)

Stuward L. Kupferman, Clark A. Hamilton, G. Naujoks, A. Vickery

AC Josephson Voltage Standard: Progress Report

April 1, 1997

Author(s)

Clark A. Hamilton, Charles J. Burroughs, Samuel Benz, Joseph R. Kinard Jr.

Progress toward a Josephson voltage standard for fast dc measurements and accurate ac waveform systhesis is described. A superconductor-normal-superconductor

Laser Ionization Mass Spectrometry Measurements of Arsenic Sticking and Incorporation During GaAs (100) Homoipataxy

April 1, 1997

Author(s)

Lisa S. Ott, S M. Casey, S R. Leone

The fluxes of Ga, As 4 and As 2 desorbed or scattered from a GaAs (1 0 0) surface are monitored with laser single-photon ionization time-of-flight mass

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