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Journals

Primary and Tertiary Structures of the Fab Fragment of a Monoclonal Anti-E-Selectin 7A9 Antibody That Inhibits Neutrophil Attachment to Endothelial Cells

May 8, 1998

Author(s)

A Rodriguez-Romero, O Almog, M Tordova, Z Randhawa, G L. Gilliland

Enzymes Harboring Unnatural Amino Acids: Mechanistic and Structural Analysis of the Enhanced Catalytic Activity of a Glutathione Transferase Containing 5-Fluorotryptophan

May 5, 1998

Author(s)

J F. Parsons, G Xiao, G L. Gilliland, R N. Armstrong

Indentation of Ceramics with Spheres: A Century After Hertz

May 4, 1998

Author(s)

Brian R. Lawn

In this article we review the nature and mechanics of damage induced in ceramics by spherical indenters, from the classical studies of Hertz over a century ago

The Far Infrared Spectrum of HOC1 Line Positions and Intensities

May 4, 1998

Author(s)

J.- M. Flaud, M Birk, G Wagner, J Orphal, S Klee, Walter J. Lafferty

The far infrared spectrum of HOC1 has been recorded at high resolution between 20 and 360 cm-1 by means of Fourier transform spectroscopy, and it was possible

Kinetically-Controlled Chemical Sensing Using Micromachined Structures

May 1, 1998

Author(s)

Stephen Semancik, Richard E. Cavicchi

Microdevices produced by machining silicon can offer a variety of control functionality on a miniature scale, 1.2 with general advantages connected to not only

Human Carboxyhemoglobin at 2.2 Angstrom Resolution: Structure and Solvent Comparisons of R-State, R2-State and T-State Hemoglobins

May 1, 1998

Author(s)

G B. Vasquez, X Ji, C Fronticelli, G L. Gilliland

Infrared Spectroscopic Studies of Wind-Tunnel Contamination

May 1, 1998

Author(s)

Angela R. Hight Walker, David F. Plusquellic, Gerald T. Fraser, A Weber, Walter J. Lafferty

Three infrared diagnostic techniques are developed to characterize chemical contamination in wind tunnels and shock tubes which can affect the reliability of

Polymorphous Crystallization and Diffraction of Threonine Deaminase from Escherichia Coli

May 1, 1998

Author(s)

David T. Gallagher, E. Eisenstein, K. Fisher, J. Zondlo, D. Chinchilla, H, D. Yu, Jonathan F. Dill, E. Winborne, K R. Ducote, G. Xiao, G.L. Gilliland

Nucleic Acid Base-pairing and N-methylacetamide Self-association in Chloroform: Affinity and Conformation

May 1, 1998

Author(s)

R Luo, M S. Head, J A. Given, M K. Gilson

Optical Absorption of Insulators and the Electron-Hole Interaction: An Ab Initio Calculation

May 1, 1998

Author(s)

L Benedict, Eric L. Shirley, Robert B. Bohn

We present a computationally efficient scheme to calculate the optical absorption of insulators from first principles, including the electron-hole interaction

Line Intensities for the 8-υm Bands of SO₂

May 1, 1998

Author(s)

Pamela M. Chu, S. J. Wetzel, Walter J. Lafferty, A. Perrin, J.- M. Flaud, Ph Arcas, G Guelachvili

Definitive Method Certification of Clinical Analytes in Lyophilized Human Serum: NIST Standard Reference Material (SRM) 909b

May 1, 1998

Author(s)

C. S. Phinney, Karen E. Murphy, Michael J. Welch, P M. Ellerbe, Stephen E. Long, Kenneth W. Pratt, Lorna T. Sniegoski, M. S. Rearick, Thomas W. Vetter, Robert D. Vocke Jr.

Determination of Methylmercury in Two Mussel Tissue Standard Reference Materials by Pre-Irradiation Separation and Neutron Activation Analysis

May 1, 1998

Author(s)

Elizabeth A. Mackey, D. A. Becker

Code Probability Distributions of A/D Converters with Random Input Noise

May 1, 1998

Author(s)

T. M. Souders

The specific architecture of an A/D converter influences the code probability distributions that result from random input noise. In particular, the ouput codes

Interlaboratory Comparison of Autoradiographic DNA Profiling Measurements: Precision and Concordance

May 1, 1998

Author(s)

David L. Duewer, S. A. Lalonde, R. A. Aubin, R. M. Fourney, D J. Reeder

An Automated Apparatus for Measuring Sound Speeds in Hazardous Gases

May 1, 1998

Author(s)

John J. Hurly

Nonlinear Ultrasonic Parameter in Quenched Martensitic Steels

May 1, 1998

Author(s)

Donna C. Hurley, Davor Balzar, P T. Purtscher, K W. Hollman

We have determined the nonlinear ultrasonic parameter Β and the ultrasonic longitudinal phase velocity {upsilion}L for a series of martensitic steel specimens

Temperature Dependent Terahertz Output from Semi-Insulating GaAs Photoconductive Switches

May 1, 1998

Author(s)

A G. Markelz, Edwin J. Heilweil

The temperature dependence of the terahertz (THz) output power and spectra from biased photoconductive switches was measured for several antenna gap widths and

Experimental and ab initio Study of the Infrared Spectra of Ionic Species Derived From PF5, PF3, and F3PO and Trapped in Solid Neon

May 1, 1998

Author(s)

C Lugez, Marilyn E. Jacox, Karl K. Irikura

When a Ne:PF 5 or a Ne:PF 3 is codeposited a 5 K with a beam of neon atoms that have been excited in a microwave discharge, the infrared spectrum of the

A Fast Pulse Oscilloscope Calibration System

May 1, 1998

Author(s)

J. P. Deyst, Nicholas Paulter, T. Daboczi, Gerard N. Stenbakken, T. M. Souders

A system is described for calibrating high-bandwidth oscilloscopes using pulse signals. The fast pulse oscilloscope calibration system (FPOCS) is to be used to

Molecular-Dynamics Study of Long-Lived Structures in a Fragile Glass-Forming Liquid

May 1, 1998

Author(s)

G Johnson, A I. Mel'cuk, H Gould, W Klein, Raymond D. Mountain

Sample-Angle Feedback for Diffraction Anomalous Fine-Structure Spectroscopy

May 1, 1998

Author(s)

J O. Cross, W Elam, V G. Harris, J P. Kirkland, Charles E. Bouldin, L B. Sorensen

Diffraction anomalous fine-structure (DAFS) experiments measure Bragg peak intensities as continuous functions of photon energy near a core-level excitation

An Infrared Study of H₈Si₈O₁₂ Cluster Adsorption on Si (100) Surfaces

May 1, 1998

Author(s)

J Eng, Krishnan Raghavachari, L M. Struck, Y J. Chabal, B E. Bent, M M. Banaszak-Holl, F R. McFeely, A M. Michaels, G W. Flynn, S B. Christman, E E. Chaban, G P. Williams, K Radermacher, S Mantl

Motivated by an ongoing controversy regarding the proper interpretation of x-ray photoelectron spectra of Si/SiO 2 interfaces derived from the adsorption of H

Atomic Hydrogen for the Formation of Abrupt Sb Doping Profiles in MBE-Grown Si

May 1, 1998

Author(s)

P E. Thompson, C Silvestre, M E. Twigg, G Jernigan, David S. Simons

Previously atomic hydrogen has been shown to be effective in reducing the segregation of Ge on Si[100] during solid source molecular beam epitaxygrowth. In this

Fabrication and Domain Imaging of Iron Magnetic Nanowire Arrays

May 1, 1998

Author(s)

D Tulchinsky, Michael H. Kelley, Jabez J. McClelland, R Gupta, Robert Celotta

Arrays of magnetic nanowires are fabricated by using a corrugated surface, produced by chromium atoms laser-focused in a one-dimensional standing wave, as a

Near-Field Antenna Measurements Using Nonideal Measurement Locations

May 1, 1998

Author(s)

Ronald C. Wittmann, Bradley Alpert, Michael H. Francis

Co on Stepped Cu(100) Surfaces: A Comparison of Experimental Data With Monte Carlo Growth Simulations

May 1, 1998

Author(s)

S T. Coyle, M Scheinfein, J L. Blue

Monte Carlo simulations of the growth of Co/Cu(100) in the presence of steps, terraces, and kinks were performed. The beginning stages of Co growth enhance the

The Influence of Elastomer Concentration on Toughness in Dispersions Containing Preformed Acrvlic Elastomeric Particles in an Epoxy Matrix

May 1, 1998

Author(s)

H Jianmei, D T. Raghavan, D Hoffman, Donald L. Hunston

The influence of toughener concentration on the fracture behavior of two-phase, rubber toughened epoxy is studied. To vary the concentration without altering

Imaging of semiconductor surface impurities by femtosecond near-field photoconductivity

May 1, 1998

Author(s)

W Schade, D L. Osborn, J Preusser, S R. Leone

Femtosecond pump-probe near-field photoconductivity is used to investigate the time response of surface impurities on a GaAsP diffusion type photodiode. At the

Electrical Linewidth Test Structures Fabricated in Mono-Crystalline Films for Reference-Material Applications

May 1, 1998

Author(s)

Michael W. Cresswell, Richard A. Allen, William F. Guthrie, Rathindra Ghoshtagore, Loren W. Linholm, J. J. Sniegowski

The physical widths of reference features incorporated into electrical linewidth test structures patterned in films of mono-crystalline silicon have been

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