Wallace, W.
, Jacobson, D.
, Arif, M.
and Ioffe, A.
(1999),
Application of Neutron Interferometry to the Measurement of Thin Film Density, Applied Physics Letters
(Accessed June 18, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Application of Neutron Interferometry to the Measurement of Thin Film Density
Published
Author(s)
W E. Wallace, , , A I. Ioffe
Citation
Applied Physics Letters
Volume
74
Issue
3
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created December 31, 1998, Updated October 12, 2021