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Journals

Impediments to Software Engineering Technology Transfer

Author(s)
M V. Zelkowitz, D Wallace, D W. Binkley
Although the need to transition new technology to improve the process of developing quality software products is well understood, the computer software industry

Characterization and Applications of On-Wafer Diode Noise Sources

Author(s)
Lawrence P. Dunleavy, James P. Randa, Dave K. Walker, Robert L. Billinger, John Rice
A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of
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