Tang, Y.
, Steiner, R.
and Sims, J.
(1999),
Comparison of Two Josephson Array Voltage Standard Systems Using a Set of Zener References, IEEE Transactions on Instrumentation and Measurement
(Accessed July 17, 2025)
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Comparison of Two Josephson Array Voltage Standard Systems Using a Set of Zener References
Published
Author(s)
, ,
Abstract
It is possible to compare Josephson-array voltage systems to parts in 109 via multi-Zener reference interchanges and ultra-low thermal-emf switching. These techniques were used to achieve a Type A uncertainty of 6 nV/V (k=2) at the 1/-19 V level, and to establish that the agreement between the two systems fell within the estimated 4 nV/V Type B relative uncertainty (k = 2). The method is useful in checking system operation under normal measurement configurations and programmed control. Data also indicated that thermal-emfs greater than 25 nV have fluctuations that are not perfectly canceled by either of the two differing measurement algorithms.Citation
IEEE Transactions on Instrumentation and Measurement
Volume
48
Issue
No. 2
Pub Type
Journals
Keywords
calibration algorithms, Josephson voltage standard, system inter-comparison
Citation
Issues
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Created April 1, 1999, Updated February 17, 2017