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Comparison of Two Josephson Array Voltage Standard Systems Using a Set of Zener References
Published
Author(s)
Yi-hua Tang, Richard L. Steiner, June E. Sims
Abstract
It is possible to compare Josephson-array voltage systems to parts in 109 via multi-Zener reference interchanges and ultra-low thermal-emf switching. These techniques were used to achieve a Type A uncertainty of 6 nV/V (k=2) at the 1/-19 V level, and to establish that the agreement between the two systems fell within the estimated 4 nV/V Type B relative uncertainty (k = 2). The method is useful in checking system operation under normal measurement configurations and programmed control. Data also indicated that thermal-emfs greater than 25 nV have fluctuations that are not perfectly canceled by either of the two differing measurement algorithms.
Citation
IEEE Transactions on Instrumentation and Measurement
Volume
48
Issue
No. 2
Pub Type
Journals
Keywords
calibration algorithms, Josephson voltage standard, system inter-comparison
Citation
Tang, Y.
, Steiner, R.
and Sims, J.
(1999),
Comparison of Two Josephson Array Voltage Standard Systems Using a Set of Zener References, IEEE Transactions on Instrumentation and Measurement
(Accessed May 31, 2023)