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Comparison of Two Josephson Array Voltage Standard Systems Using a Set of Zener References

Published

Author(s)

Yi-hua Tang, Richard L. Steiner, June E. Sims

Abstract

It is possible to compare Josephson-array voltage systems to parts in 109 via multi-Zener reference interchanges and ultra-low thermal-emf switching. These techniques were used to achieve a Type A uncertainty of 6 nV/V (k=2) at the 1/-19 V level, and to establish that the agreement between the two systems fell within the estimated 4 nV/V Type B relative uncertainty (k = 2). The method is useful in checking system operation under normal measurement configurations and programmed control. Data also indicated that thermal-emfs greater than 25 nV have fluctuations that are not perfectly canceled by either of the two differing measurement algorithms.
Citation
IEEE Transactions on Instrumentation and Measurement
Volume
48
Issue
No. 2

Keywords

calibration algorithms, Josephson voltage standard, system inter-comparison

Citation

Tang, Y. , Steiner, R. and Sims, J. (1999), Comparison of Two Josephson Array Voltage Standard Systems Using a Set of Zener References, IEEE Transactions on Instrumentation and Measurement (Accessed April 24, 2024)
Created April 1, 1999, Updated February 17, 2017