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Journals

Migdall Responds

Author(s)
Alan L. Migdall
I thank Duane Jaecks for pointing out earlier origins of the first of the correlated photon metrology applications described in my article - absolute detector

The Local Structure of Ferroelectric Pb1-xGexTe

Author(s)
Bruce D. Ravel, Eric J. Cockayne, K M. Rabe
The narrow band-gap semiconductor Pb_{1-x}Ge_xTe has a low-temperature ferroelectric rhombohedral phase whose average structure is a distorted rock salt

Tensile Creep and Rupture of Silicon Nitride

Author(s)
Ralph Krause, William E. Luecke, J French, B Hockey, Sheldon M. Wiederhorn
We have characterized the tensile creep, rupture lifetime, and cavitation behavior of a commercial, gas-pressure-sintered silicon nitride in the temperature

Acoustic Study of Texture in Polycrystalline Brass

Author(s)
K Foster, S L. Fairburn, R G. Leisure, Sudook A. Kim, Davor Balzar, G A. Alers, H M. Ledbetter
Resonant ultrasonic spectroscopy was used to measure the orthorhombic elastic constants of rolled, polycrystalline plates of Cu, Cu - 5% Zn, and Cu - 15% Zn

Specular Electron Scattering in Metallic Thin Films

Author(s)
William F. Egelhoff Jr., P J. Chen, Cedric J. Powell, D Parks, F Serpa, Robert McMichael, D Martien, A. E. Berkowitz
Specular electron scattering at the surface of metallic thin films is an important phenomenon for a class of magnetic multilayers known as giant

Measurements and Predictions of Light Scattering by Coatings

Author(s)
Theodore V. Vorburger, Egon Marx, M E. McKnight, Maria Nadal, P Y. Barnes, Alan Keith Thompson, Michael Galler, Fern Y. Hunt, Mark R. VanLandingham
We show comparisons between calculations and measurements of angle-resolved light scattering distributions from clear dielectric, isotropic coatings. The
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