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Journals

The Critical Evaluation of a Comprehensive Mass Spectral Library

Author(s)
P Ausloos, C L. Clifton, S G. Lias, Anzor I. Mikaia, Stephen Stein, Dmitrii Tchekhovskoi, O D. Sparkman, Vladimir G. Zaikin, D Zhu
A description of the methods used to build a high quality, comprehensive reference library of electron-ionization mass spectra is presented. Emphasis is placed...

Parallel Monte Carlo Simulation Using Desktop Computers

Author(s)
J H. Scott, Robert L. Myklebust, Dale Newbury
Monte Carlo simulation of electron scattering in solids has proven valuable to electron microscopists for many years. The electron trajectories, x-ray...

Software Certification: Testing and Measurement

Author(s)
S A. Wakid, D. Richard Kuhn, D Wallace
The focus of this article is on cost effective processes for measuring conformance, dependability, and performance of software as three key attributes of its...

Surface Growth in Laser-Focused Atomic Deposition

Author(s)
E Jurdik, T Rasing, K van, C Bradley, Jabez J. McClelland
We present calculations of surface growth in laser-focused nanostructure fabrication. We show that theoretical predictions of the structure profile s shape...

The NIST Calibration Services Virtual Library

Author(s)
Sally S. Bruce, W Trefzger
The National Institute of Standards and Technology (NIST) offers a variety of hundreds of calibration services to its customers as a part of its core mission...

Reflectance Standards at Ultraviolet Wavelengths

Author(s)
P Y. Barnes, E A. Early, Maria E. Nadal
Polytetrafluoroethylene (PTFE) is widely used in remote sensing applications requiring a diffuse reflectance standard for detector calibration. The bi...
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