Levine, Z.
and Ravel, B.
(1999),
Identification of Materials in Integrated Circuit Interconnects Using X-Ray Absorption Near-Edge Spectroscopy, Applied Physics
(Accessed March 22, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Identification of Materials in Integrated Circuit Interconnects Using X-Ray Absorption Near-Edge Spectroscopy
Published
Author(s)
, B D. Ravel
Citation
Applied Physics
Volume
85
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1999, Updated February 17, 2017