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Identification of Materials in Integrated Circuit Interconnects Using X-Ray Absorption Near-Edge Spectroscopy

Published

Author(s)

Zachary H. Levine, B D. Ravel
Citation
Applied Physics
Volume
85

Citation

Levine, Z. and Ravel, B. (1999), Identification of Materials in Integrated Circuit Interconnects Using X-Ray Absorption Near-Edge Spectroscopy, Applied Physics (Accessed February 23, 2024)
Created January 1, 1999, Updated February 17, 2017