Levine, Z.
and Ravel, B.
(1999),
Identification of Materials in Integrated Circuit Interconnects Using X-Ray Absorption Near-Edge Spectroscopy, Applied Physics
(Accessed May 9, 2025)
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Identification of Materials in Integrated Circuit Interconnects Using X-Ray Absorption Near-Edge Spectroscopy
Published
Author(s)
, B D. Ravel
Citation
Applied Physics
Volume
85
Pub Type
Journals
Citation
Issues
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Created January 1, 1999, Updated February 17, 2017