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Journals

Abrasive Machining of Glass-Ceramics With a Dental Handpiece

July 1, 2000

Author(s)

X Dong, L Yin, S Jahanmir, L K. Ives, E D. Rekow

Machinable glass ceramics are used to prepare dental restorations with modern dental CAD/CAM systems. Unfortunately, little is understood about the influence of

MatML: An XML for Standardizing Web-Based Materials Property Data

July 1, 2000

Author(s)

E F. Begley, C P. Sturrock

Hypertext Markup Language (HTML) may be current lingua franca of the World Wide Web, but it is poorly suited for exchanging multidimensional data for any kind

Lattice Model of Living Polymerization. III. Evidence for Particle Clustering From Phase Separation Properties and Rounding of the Dynamical Clustering Transition

July 1, 2000

Author(s)

J Dudowicz, Karl Freed, Jack F. Douglas

Equilibrium polymerization is studied here as a prototype for clustering transitions that commonly occur in systems of interacting particles at equilibrium

Thermal Expansion Coefficients of Low-K Dielectric Films From Fourier Analysis of X-Ray Reflectivity

July 1, 2000

Author(s)

Charles E. Bouldin, William E. Wallace, G W. Lynn, S C. Roth, Wen-Li Wu

We determine the thermal expansion coefficient of a fluorinated poly (arylene ether) low-k dielectric film using Fourier analysis of x-ray reflectivity data

Observation of Monolayer and Bilayer Period RHEED Oscillations During Epitaxial Growth on Ge and Ge(100)

July 1, 2000

Author(s)

C L. Berrie, S R. Leone

Both monolayer and bilayer periods are observed during the growth of germanium on Ge(1 0 0) using reflection high-energy electron diffraction (RHEED)

The Effect of Parent Zero-Point Motion on the ND₂( ) Rotational State Distribution in the 193.3 nm Photolysis of ND₃

July 1, 2000

Author(s)

J P. Reid, R A. Loomis, S R. Leone

The vibrational and rotational product-state distributions of ND 2( 2A 1) has been probed following the photodissociation of ND 3 at 193.3 nm by time-resolved

Correction of Directional Errors For Radiometric and Photometric Standard Detectors

July 1, 2000

Author(s)

M Racz, George P. Eppeldauer

Single-Color Photoassociative Ionization of Ultracold Sodium: The Region from 0 to -5 GHz

July 1, 2000

Author(s)

A Amelink, Kevin Jones, Paul D. Lett, P Van der Straten, H G. Heideman

We have measured the rate of production of Na 2 + in collisions of ultracold Na atoms held in a magneto-optical trap (MOT) as a function of probe laser detuning

The Vibrational Spectra of Molecular Ions Isolated in Solid Neon. XVI. SO⁺₂, SO^-₂, and (SO₂)^-₂

July 1, 2000

Author(s)

D Forney, C B. Kellogg, Warren E. Thompson, Marilyn E. Jacox

When a Ne:SO 2 mixture is subjected to Penning ionization and/or photoionization by neon atoms in their first excited states, between 16.6 eV and 16.85 eV, and

Electron-Impact Total Ionization Cross Sections of SF_x (x = 1-5)

July 1, 2000

Author(s)

M A. Ali, Karl Irikura, Yong Sik Kim

Total cross sections for electron impact ionization are necessary quantities for numerical modeling of plasma chemistry and for quantitative mass-spectrometric

Crystal Structure of YbaK Protein from Haemophilus Influenzae (HI1434) at 1.8 Angstrom Resolution: Functional Implications

July 1, 2000

Author(s)

Huan Zhang, K Huang, Z Li, L Banerjei, K E. Fisher, N V. Grishin, Edward Eisenstein, O Herzberg

Structural genomics of proteins of unknown function most straightforwardly assists with assignment of biochemical activity when the new structure resembles that

Capability in Rockwell C Scale Hardness

July 1, 2000

Author(s)

Walter S. Liggett Jr, Samuel Low, David J. Pitchure, Jun-Feng Song

A measurement system is capable if it produces measurements with uncertainties small enough for demonstration of compliance with product specifications. To

Enterprise Resource Planning Systems in Manufacturing

July 1, 2000

Author(s)

Edward J. Barkmeyer Jr., Mary B. Algeo

Enterprise resource planning (ERP) systems are commercial applications that provide the backbone necessary to support the enterprise-wide integration of

Information Technology for Engineering and Manufacturing

July 1, 2000

Author(s)

James E. Fowler, Mark G. Carlisle

This paper summarizes material presented at Information Technology for Engineering & Manufacturing, a conference organized by NIST's Systems Integration for

Monitoring and Controlling Operations

July 1, 2000

Author(s)

Albert T. Jones, Evan K. Wallace, Yuehwern Yih

This work is a chapter in a forthcoming Handbook of Industrial Engineering. The chapter contains five sections. In addition to a short introduction and a

Web-Based System for Design Artifact Modeling

July 1, 2000

Author(s)

Simon Szykman, J Racz, Christophe Snowden, Ram D. Sriram

Modern engineering industry is relying more and more on the use of knowledge in product development. The NIST-Design Repository Project, at NIST, is working to

The Role of Standards in Innovation

July 1, 2000

Author(s)

Robert Allen, Ram D. Sriram

We review and explore the role of standards in innovation, with particular emphasis on the design and manufacturing processes. We begin by defining and

Design Repositories: Next-Generation Engineering Design Databases

July 1, 2000

Author(s)

Simon Szykman, Christophe Bochenek, J Racz, Ram D. Sriram

Summary of the NIST Design Repository Project, revised with some additional content on representation of function in computer-based design, and using XML to

Manufacturing Feature Recognition from Solid Models: A Status Report

July 1, 2000

Author(s)

Jung-Hyun Han, Mike Pratt, William Regli

Solid modeling refers to techniques for unambiguous representations of three-dimensional objects. Feature recognition is a sub-discipline focusing on the design

Agent Based Services for B2B Electronic Commerce

July 1, 2000

Author(s)

Yun Peng, Nenad Ivezic, Thomas R. Rhodes, N Fong

The potential of agent-based systems has not been realized yet, in part, because of the lack of understanding how the agent technology support industrial needs

Pressure-Induced Shift and Broadening of 1510-1540-nm Acetylene Wavelength Calibration Lines

July 1, 2000

Author(s)

William C. Swann, Sarah L. Gilbert

We have measured the pressure-induced shift for 15 lines of the υ 1 + υ 3 rotational-vibrational band of acetylene 12C 2H 2. These lines are useful as

Analysis of Leakage Currents and Impact on Off-State Power Consumption for CMOS Technology in the 100 nm Regime

July 1, 2000

Author(s)

W. K. Henson, N. Yong, S. Kubicek, Eric M. Vogel, J. J. Wortman, K. De Meyer, A. Naem

The off-state leakage currents have been investigated for sub 100 nm CMOS technology. The two leakage mechanisms investiaged in this work include the

C₃₀ Self-Assembled Monolayers on Silica, Titania, and Zirconia: HPLC Performance, Atomic Force Microscopy, Ellipsometry, and NMR Studies of Molecular Dynamics and Uniformity of Coverage

July 1, 2000

Author(s)

M. Pursch, D. L. Vanderhart, Lane C. Sander, Xiaohong Gu, T. H. Nguyen, Stephen Wise, Donald A. Gajewski

Microcalorimeter Energy-Dispersive Spectrometry Using a Low Voltage Scanning Electron Microscope

July 1, 2000

Author(s)

David A. Wollman, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, Norman F. Bergren, David A. Rudman, John M. Martinis, Dale Newbury

We describe the current performance of the prototype microcalorimeter energy-dispersive spectrometer (5cal EDS) developed at NIST for X-ray microanalysis. We

Calibration of a Calorimeter for Thermal Resistance Measurements of Advanced Insulation Panels

July 1, 2000

Author(s)

M W. Ellis, Arthur H. Fanney, Mark W. Davis

Insulation technologies are being developed to reduce the energy consumption associated with refrigerators, freezers, and the transport of refrigerated products

Transverse compressive stress effects on the critical current of Bi-2223/Ag tapes reinforced with pure Ag and oxide-dispersion-strengthened AgS.

July 1, 2000

Author(s)

E Bray, John (Jack) W. Ekin, Cameron C. Clickner, L J. Masur

We have measured the effect of transverse compressive stress on the critical current of two similar sets of Bi 2Sr 2Ca 2Cu 3O X (Bi-2223) tapes in a direct

Structural Information Mapping with Express-X

July 1, 2000

Author(s)

D B. Sanderson, Peter O. Denno

This paper provides an overview of the Express-X language, a language that provides structural information mapping of information modeled in EXPRESS schema. The

Fast Imaging of Hard X-Rays With a Laboratory Microscope

July 1, 2000

Author(s)

A S. Bakulin, S M. Durbin, Terrence J. Jach, J Pedulla

An improved x-ray microscope with a fully electronic CCD detector system has been constructed that allows improved laboratory-based microstructural

Public Key Infrastructures for the Financial Services Industry

June 21, 2000

Author(s)

William E. Burr, K L. Lyons-Burke

This paper addresses how financial institutions can use a Public Key Infrastructure (PKI) and some of the problems they may face in the process. PKI is an

Intersubunit Association Induces Unique Allosteric Dependence of the T127L CRP Mutant on pH

June 20, 2000

Author(s)

Y. Shi, S. Wang, Frederick P. Schwarz

The allosteric activation of the T127->L mutant of 3'-5' cyclic adenosine monophosphate (cAMP) receptor protein (CRP) by cAMP changes from an exothermic

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