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Journals

Strength of Silicon Containing Nanoscale Flaws

Author(s)
Antonia Pajares, Michael Chumakov, Brian R. Lawn
A study was made of the strength of highly polished silicon surfaces after nanoindentation with a Berkovich diamond. Strengths of the indented surfaces were...

Near-Threshold Photoassociation of 87Rb2

Author(s)
M Kemmann, R Mistrik, S Nussmann, H Helm, Carl J. Williams, Paul S. Julienne
Photoassociation of cold 87Rb (5s, fb+2) atom pairs is studied within 15 GHz of the dissociation limits 87Rb(5p3/2, fa) + 87Rb(5s, fb =2). Vibrational levels in...

Information Depth for Elastic-Peak Electron Spectroscopy

Author(s)
Aleksander Jablonski, Cedric J. Powell
We present a formalism for calculating the information depth (ID) for elastic-peak electron spectroscopy (EPES) in which a measurement is made of the intensity...

Towards reproducible SCM Image Interpretation

Author(s)
Joseph Kopanski, Jay F. Marchiando, Brian G. Rennex, David S. Simons, R P. Chaudhury
SCM images, and the two-dimensional (2-D) dopant profiles extracted from them, show poor reproducibility from laboratory to laboratory. Major factors...

Practical electron-tunneling refrigerator

Author(s)
Anna Clark, Anthony Williams, Steve Ruggiero, Marcel L. van den Berg, Joel N. Ullom
We demonstrate a thin-film, solid-state refrigerator based on the removal of hot electrons from a metal by quantum-mechanical tunneling. We have halved the...
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