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Journals

An Activity Model for Factory Design and Improvement

Author(s)
Kiwook Jung, Sangsu Choi, Boonserm Kulvatunyou, Hyunbo Cho, Katherine C. Morris
Smart Manufacturing Systems (SMS) are envisioned to contain highly-automated and IT-driven production systems. To address the complexity that arises in such...

Determination of Closed Porosity in Rocks by Small-Angle Neuron Scattering

Author(s)
Jitendra Bahadur, Christian R. Medina, Lilin He, Yuri B. Melnichenko, John A. Rupp, Tomasz P. Blach, David F. Mildner
Small-angle neutron (SANS) and ultra small-angle neutron scattering (USANS) has been used to study a carbonate rock from a deep saline aquifer that is a...

Introduction to CFTT and CFReDS Projects at NIST

Author(s)
Jungheum Park, James R. Lyle, Barbara Guttman
Along with the development and propagation of Information & Communication Technology (ICT), digital evidence becomes more common and crucial to solving various...

Time in Cyber-Physical Systems

Author(s)
Marc A. Weiss, Sundeep Chandhoke, Hugh Melvin
Time is central to predicting, measuring and controlling properties of the physical world, and is one of the most important constraints distinguishing Cyber...

Security Fatigue

Author(s)
Brian C. Stanton, Sandra S. Prettyman, Mary F. Theofanos, Susanne M. Furman

Rapid and Accurate C-V Measurements

Author(s)
Jihong Kim, Pragya Shrestha, Jason Campbell, Jason Ryan, David M. Nminibapiel, Joseph Kopanski, Kin P. Cheung
We report a new technique for the rapid measurement of full capacitance-voltage (C-V) characteristic curves. The displacement current from a 100 MHz applied...

Measuring the reactivity of a silicon-terminated probe

Author(s)
Adam Sweetman, Julian Stirling, Philipp Rahe, Philip Moriarty
It is generally accepted that the exposed surfaces of silicon crystals are highly reactive due to the dangling bonds which protrude into the vacuum. However, it...
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