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NIST is using SNS Josephson junctions as the basis of quantum voltage metrology. Planar junction technology limits the voltage and bandwidth of these systems
James Booth, S. Y. Lee, Kenneth Leong, J. H. Lee, J. Lim, H. N. Lee, B. Oh, S. H. Moon
Thin films of the newly discovered superconductor MgB 2 show promise for a number of different electronic applications. In order to evaluate the suitability of
We report on the development of a microwave power limiter based on high temperature superconductor technology. The power limiter takes the form of a 50 Ω
We demonstrate how nonlinear effects in high temperature superconducting thin films can be quantified based on a current-dependent penetration depth λ(J). Using
Carl D. Reintsema, James A. Beall, Steven Deiker, W.Bertrand (Randy) Doriese, Gene C. Hilton, Kent D. Irwin, Sae Woo Nam, Leila R. Vale, Joel Ullom, Yizi Xu, Joern Beyer, Martin Huber
The development of time-domain SQUID multiplexers enables the integration of superconducting transition-edge sensors (TES) into arrays of thousands of elements
A Bartels, Nathan R. Newbury, Kristin L. Corwin, I Thomann, Leo W. Hollberg, Scott Diddams
We report a scheme to generate a phase-coherent optical frequency comb extending from 0.6 υm to 1.4 υm wavelength by actively linking the Ti:sapphire and Cr
ramics are hard, brittle, and chemically inert under most environments. They wear by abrasion and fracture. Since brittle fracture is very sensitive to stress
Rui-Hua Xie, L Jensen, Garnett W. Bryant, J Zhao, V H. Smith
Bonding, electric (hyper) polarizability; vibrational and magnetic properties of heterofullerene C 48B 12 are studied by first-principles calculations. Infrared
Stable gases produced in SiH 4 and H 2-SiH 4, capacitively-coupled RF discharges, operated at typical device-production conditions, were investigated by
The purpose of this paper is to define standard methods for effective and efficient image-based dimensional metrology for microlithography applications in the
William M. Pitts, E Braun, Richard D. Peacock, Henri E. Mitler, Erik L. Johnsson, Paul A. Reneke, L G. Blevins
Temperature measurements have been made for natural-gas and heptane fires in a reduced-scale enclosure using a variety of bare-bead and aspirated thermocouples
This paper begins with a historical review of flashing lights and physical measurement of flashing lights since the time the Blondel-Rey equation was developed
Martin Y. Chiang, J He, R Song, Alamgir Karim, Wen-Li Wu, Eric J. Amis
A high-throughput combinatorial approach to edge delamination test is proposed to map the failure of adhesion as a function of both temperature and film
Martial Michel, Vincent M. Stanford, O P. Galibert
Pervasive Computing environments range from basic mobile point of sale terminal systems, to rich Smart Spaces with many devices and sensors such as lapel
A Padilla, D. R. Munoz, Timothy P. Quinn, R. A. Rorrer
A Hertzian-based contact model of the friction between the welding wire and the wire liner has been developed to predict the wire pulling force for gas metal
T M. Padilla, D. R. Munoz, Timothy P. Quinn, R. A. Rorrer
A Hertzian based contact model of the friction between the welding wire and the wire liner has been developed to predict the wire pulling force for gas metal
Y I. Baranov, Gerald T. Fraser, Walter J. Lafferty, B Mate, A A. Vigasin
Laboratory studies of the mid and near infrared collision-induced absorption bands of O 2 are reviewed, with an emphasis on the 6.4 m and 1.27 m bands and on Ar
Y I. Baranov, Gerald T. Fraser, Walter J. Lafferty, A A. Vigasin
Absorption spectra of pure CO 2 have been recorded in the vicinity of the 2675 cm -1 Fermi triad for temperatures between 211 K and 296 K. The 2υ 1, υ 1 + 2υ 2
A number of modeling and simulation tools have been developed and more are being developed for emergency response applications. The available simulation tools
B Bunday, M R. Bishop, John S. Villarrubia, Andras Vladar
The measurement of line-edge roughness (LER) has recently become a major topic of concern in the litho-metrology community and the semiconductor industry as a
B Bunday, M R. Bishop, John S. Villarrubia, Andras Vladar
The measurement of line-edge roughness (LER) has recently become a major topic of concern in the litho-metrology community and the semiconductor industry as a
Marylyn H. Bennett, Angela Guerry, Ronald G. Dixson, Michael T. Postek, Theodore V. Vorburger
The in-line and at-line measurement tools for critical dimension (CD) metrology in semiconductor manufacturing are technologically advanced instruments that
Nathan R. Newbury, Kristan L. Corwin, Scott Diddams, Brian Washburn, J M. Dudley, S. Coen, R Windeler
Supercontinua generated in microstructure fiber can exhibit significant excess amplitude noise. We present experimental and numerical studies of the origins of
Gerard N. Stenbakken, Thomas L. Nelson, Bryan C. Waltrip, David I. Bergman
In response to industry requests to have calibration services for distorted power instrumentation, NIST is developing a new sampling system to provide this
The growing and immediate threat of biological and chemical weapons has placed urgency on the development of chemical and biological warfare agent (CWA/BWA) and