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Conferences

Stability Measurements of the Ca and Yb Optical Frequency Standards

January 1, 2006

Author(s)

Christopher W. Oates, Hoyt c, Yann Le Coq, Zeb Barber, Tara M. Fortier, Jason Stalnaker, Scott A. Diddams, Leo W. Hollberg

Increasing the Modulation Depth of the WWVB Time Code to Improve the Performance of Radio Controlled Clocks

January 1, 2006

Author(s)

John P. Lowe, Ken C. Allen

The NIST Time Measurement and Analysis Service

January 1, 2006

Author(s)

Michael A. Lombardi, Andrew N. Novick

The Role of LORAN Timing in Telecommunications,

January 1, 2006

Author(s)

Michael A. Lombardi, Chuck Norman, William J. Walsh

Legal and Technical Requirements for Time and Frequency Metrology

January 1, 2006

Author(s)

Michael A. Lombardi

Power Dependence of the Shift Caused by Spurious Spectral Components in Atomic Fountain

January 1, 2006

Author(s)

F Levi, Jon H. Shirley, Thomas P. Heavner, Dai Yu, Steven R. Jefferts

Spectroscopy of ¹⁷⁴Yb in a one-dimensional optical lattice

January 1, 2006

Author(s)

C Hoyt, Zeb Barber, Christopher W. Oates, A. V. Taichenachev, V. I. Yudin, Leo W. Hollberg

TheoH Bias-Removal Method

January 1, 2006

Author(s)

David A. Howe, J Mcgee-taylor, Tiffany Tassett

Frequency Biases in Pulsed Atomic Fountain Frequency Standards Due to Spurious Components in the Microwave Spectrum

January 1, 2006

Author(s)

Thomas P. Heavner, Jon H. Shirley, F Levi, Dai Yu, Steven R. Jefferts

Low Phase Noise Amplifier and Oscillator Using Feed-Forward Technique at 10 GHz

January 1, 2006

Author(s)

Archita Hati, Craig W. Nelson, David A. Howe

Comparison of AM noise in commercial amplifiers and oscillators at X-band

January 1, 2006

Author(s)

Archita Hati, David A. Howe, Craig W. Nelson

Towards Sub-10^-16 Trans-Continental GPS Carrier-Phase Frequency Transfer: a Simulation Study

January 1, 2006

Author(s)

C Hackman, Judah Levine

Optical Metrology for LEDs and Solid State Lighting

January 1, 2006

Author(s)

Yoshihiro Ohno

A Spectrally Tunable LED Sphere Source Enables Accurate Calibration of Tristimulus Colorimeters

January 1, 2006

Author(s)

Irena Fryc, Steven W. Brown, Yoshihiro Ohno

Uncertainties of Spectral Responsivity Measurements

January 1, 2006

Author(s)

George P. Eppeldauer, G Sauter, J L. Gardner

Development of the NIST Detector-based Color Temperature Scale

January 1, 2006

Author(s)

George P. Eppeldauer, Yoshihiro Ohno

Measuring Color Quality of Light Sources

January 1, 2006

Author(s)

Wendy L. Davis

Evaluation of Colour Difference Formulae for Colour Rendering Metrics

January 1, 2006

Author(s)

Wendy L. Davis, Yoshihiro Ohno

Development of a Color Quality Scale

January 1, 2006

Author(s)

Wendy L. Davis, Yoshihiro Ohno

NIST ²²²Rn emission standards

January 1, 2006

Author(s)

Peter Volkovitsky

High speed photon counting techniques for broadband quantum key distribution

January 1, 2006

Author(s)

Daniel Rogers, Joshua C. Bienfang, A Mink, B J. Hershman, A Nakassis, X Tang, L Ma, D H. Su, Carl J. Williams, Charles W. Clark

Free space quantum cryptography in the H-alpha Fraunhofer window

January 1, 2006

Author(s)

Daniel Rogers, Joshua C. Bienfang, A Mink, B J. Hershman, A Nakassis, X Tang, L Ma, D H. Su, Carl J. Williams, Charles W. Clark

EUV testing of multilayer mirrors: critical issues

January 1, 2006

Author(s)

Shannon B. Hill, I Ermanoski, Steven E. Grantham, Charles S. Tarrio, Thomas B. Lucatorto, T. E. Madey, Sasa Bajt, M Chandhok, P Yan, Obert Wood, S Wurm, N V. Edwards

A Bayesian approach to tomography of multiply scattered beams, ed. by A. Bouman, E.L. Miller and I. Pollack

January 1, 2006

Author(s)

Zachary H. Levine

Narrow band EUV multilayer coating for the MOSES rocket,

January 1, 2006

Author(s)

S M. Owens, J S. Gum, Charles S. Tarrio, S Grantham, J A. Dvorak, B Kjornrattanawanich, R Keski kuha, R J. Thomas, C C. Kankelborg

Enhanced Capabilities of the NIST Fiber Probe for Microfeature Metrology

January 1, 2006

Author(s)

Bala Muralikrishnan, Jack A. Stone Jr., John R. Stoup

We have previously reported work in the area of fiber probe development at NIST for micro feature measurement. This probe, which we refer to as the Fiber...

Quantitative, Interactive Measurement of Tissue Engineering Scaffold Structure Using Immersive Visualization

January 1, 2006

Author(s)

Jeffrey Fagan, Erik K. Hobbie, Brian Landi, Idan Mandelbaum, Vardhan Bajpai, Barry J. Bauer, Kalman D. Migler, Jeffrey R. Simpson, Angela R. Hight Walker, Ryan Raffaelle

At NIST, we are using new approaches to better understand and quantify the structure of tissue engineering scaffolds. This approach uses immersive visualization...

Quantum Key Distribution System Operating at Sifted key Rate Over 4 Mbits/s

January 1, 2006

Author(s)

X Tang, L J. Ma, Alan Mink, T Nakassis, Haitan Xu, B J. Hershman, Joshua Bienfang, D Su, R F. Bosivert, Charles W. Clark, Carl J. Williams

Correlation of Topography Measurements of NIST SRM 2460 Standard Bullets by Four Techniques

January 1, 2006

Author(s)

Jun-Feng Song, Theodore V. Vorburger, Thomas Brian Renegar, Hyug-Gyo Rhee, A Zheng, L Ma, John M. Libert, Susan M. Ballou, B Bachrach, K Bogart

Three optical instruments including an interferometric microscope, a Nipkow disk confocal microscope and a laser scanning confocal microscope are used for the...

Nano- and Atomic-Scale Length Metrology

January 1, 2006

Author(s)

Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, Ndubuisi George Orji, Shaw C. Feng, Michael W. Cresswell, Richard A. Allen, William F. Guthrie, Wei Chu

We discuss nano-scale length metrology of linewidth, step height, and line edge roughness (LER). These properties are of growing importance to the function and...

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