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We have developed and utilized p-polarized backside reflection absorption infrared spectroscopy (pb-RAIRS) to examine dielectrics between silicon substrates and
Streamlining and Bulletproofing the Standards Development Process In the increasingly complex semiconductor fabrication environment capturing and transferring
William C. Swann, Sarah L. Gilbert, Brian Washburn, Nathan R. Newbury
NIST research on near infrared frequency and wavelength references is presented. A new high accuracy wavelength calibration transfer standard, SRM 2519a, based
In 1998, Persily published a review of commercial and institutional building airtightness data that found significant levels of air leakage and debunked the
Samuel Benz, Charles J. Burroughs, Paul Dresselhaus, Nicolas Hadacek, Yonuk Chong
For the past 10 years NIST has been developing the next generation of voltage standard systems based on arrays of normal-metal barrier Josephson junctions. We
Anthony P. Hamins, Kevin B. McGrattan, Kuldeep R. Prasad, Alexander Maranghides, Therese P. McAllister
A large-scale fire experiment was conducted to assess the accuracy of a combination of gas and solid-phase models designed to predict the temperatures of
The purpose of this lecture is to assess the current state of our ability to simulate the consequences of a fire in a large building, and suggest some areas
Zhixin Hu, Arnaud Trouve, Y Utiskul, J G. Quintiere
This study is aimed at characterizing the dynamics of compartment fires under poorly ventilated conditions. The study considers four cases that correspond to
John E. Kitching, Svenja A. Knappe, Li-Anne Liew, P Schwindt, Vladislav Gerginov, V Shah, John Moreland, Alan Brannon, J Breitbarth, Z Popovic, Leo W. Hollberg
We describe recent efforts at NIST to develop microfabricated, chip-scale atomic frequency references based on microfabrication techniques commonly used in
We present a novel measure of fingerprint image quality, which can be used to estimate fingerprint match performance. This means presenting the matcher with
We consider the problem of computing the Hamming weight of an n-bit vector using a circuit with gates for addition and multiplication modulo 2 (alternatively
A procedure is presented that makes use of measured pressures to predict peak static responses of low buildings, for cases in which no wind tunnel model is
A procedure is described for the design of rigid buildings for wind loading. The procedure, based on the database-assisted design (DAD) approach, uses measured
Arvind K. Balijepalli, Thomas W. LeBrun, Cedric V. Gagnon, Yong-Gu Lee, Nicholas G. Dagalakis
In order to realize the flexibility optical trapping offers as a nanoassembly tool, we need to develop natural and intuitiveinterfaces to assemble large
With wireless capable devices becoming more and more accessible, there is an increasing need for standardization of wireless networking. One of the most
In semiconductor electronics applications, line edge and linewidth roughness are generally measured using a root mean square (RMS) metric. The true value of RMS
A committee of industry and government technology experts has completed a three-year effort to develop a set of specifications that consist of a unifying set of
We have implemented a quantum key distribution (QKD) system with polarization encoding at 850 nm over 1 km of optical fiber. The high-speed management of the
Paul Dresselhaus, Yonuk Chong, Nicolas Hadacek, Burm Baek, Michio Watanabe, Charles J. Burroughs, Samuel Benz
We have used MoSi2 barrier superconductor-normal-metal-superconductor (SNS) double stacked junctions to generate audio frequency ac waveforms with metrological
We have investigated arrays of bicrystal Josephson junctions for possible application in a quantized voltage noise source. In order to reduce the intrinsically