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Conferences

Progress Towards a Precision Measurement of the Neutron Lifetime Using Magnetically Trapped Ultracold Neutrons

January 1, 2006

Author(s)

P.-N. Seo, Kevin Coakley, J M. Doyle, F H. DuBose, R Golub, E Korobkina, S K. Lamoreaux, Hans Pieter Mumm, C M. O'Shaughnessy, G R. Palmquis, A K. Thompson, Grace L. Yang, L Yang, Paul R. Huffman

As part of an on-going program utilizing magnetically trapped ultracold neutrons (UCNs,) we are developing a technique that offers the possibility of improving

Enhanced Capabilities of the NIST Fiber Probe for Microfeature Metrology

January 1, 2006

Author(s)

Bala Muralikrishnan, Jack A. Stone Jr., John R. Stoup

We have previously reported work in the area of fiber probe development at NIST for micro feature measurement. This probe, which we refer to as the Fiber

Joint Rate Adaptation and Channel-Adaptive Relaying in 802.11 Ad Hoc Networks

January 1, 2006

Author(s)

Michael R. Souryal, Nader Moayeri

Channel-adaptive relaying has recently been proposed as a means to exploit spatial and temporal diversity in multihop ad hoc networks with fading. In

Quantitative, Interactive Measurement of Tissue Engineering Scaffold Structure Using Immersive Visualization

January 1, 2006

Author(s)

Jeffrey Fagan, Erik K. Hobbie, Brian Landi, Idan Mandelbaum, Vardhan Bajpai, Barry J. Bauer, Kalman D. Migler, Jeffrey R. Simpson, Angela R. Hight Walker, Ryan Raffaelle

At NIST, we are using new approaches to better understand and quantify the structure of tissue engineering scaffolds. This approach uses immersive visualization

Non-Linear Dielectric Testing at High AC Voltages Using Waveforms and Harmonics

January 1, 2006

Author(s)

Jan Obrzut, K Kano

Complex impedance and non-linear response was measured for high-dielectric composite films at AC voltages using a waveform technique. With decreasing dielectric

Quantum Key Distribution System Operating at Sifted key Rate Over 4 Mbits/s

January 1, 2006

Author(s)

X Tang, L J. Ma, Alan Mink, T Nakassis, Haitan Xu, B J. Hershman, Joshua Bienfang, D Su, R F. Bosivert, Charles W. Clark, Carl J. Williams

An Ontology Architecture for Standards Integration and Conformance in Manufacturing

January 1, 2006

Author(s)

Laurent Deshayes, Sebti Foufou, Michael Gruninger

Standards reflect consensus on the semantics of terms. When used to communicate, whether between people or software systems, standards ensure the communication

Correlation of Topography Measurements of NIST SRM 2460 Standard Bullets by Four Techniques

January 1, 2006

Author(s)

Jun-Feng Song, Theodore V. Vorburger, Thomas Brian Renegar, Hyug-Gyo Rhee, A Zheng, L Ma, John M. Libert, Susan M. Ballou, B Bachrach, K Bogart

Three optical instruments including an interferometric microscope, a Nipkow disk confocal microscope and a laser scanning confocal microscope are used for the

A System for Performing Content-Based Searches on a Database of Mechanical Assemblies

January 1, 2006

Author(s)

A S. Deshmukh, M V. Karnik, Satyandra K. Gupta, Ram D. Sriram

The increased use of 3D CAD systems by product development organizations has resulted in large databases of assemblies; this explosion of assembly data will

Nano- and Atomic-Scale Length Metrology

January 1, 2006

Author(s)

Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, Ndubuisi George Orji, Shaw C. Feng, Michael W. Cresswell, Richard A. Allen, William F. Guthrie, Wei Chu

We discuss nano-scale length metrology of linewidth, step height, and line edge roughness (LER). These properties are of growing importance to the function and

Information Modeling and Model Implementation

January 1, 2006

Author(s)

Yung-Tsun Lee, Charles R. McLean, Yan Luo

Today?s manufacturing industry greatly relies on computer technology to support activities throughout a product?s life cycle. Effective and efficient

Topography Measurements and Applications

January 1, 2006

Author(s)

Jun-Feng Song, Theodore V. Vorburger

Based on auto- and cross-correlation functions (ACF and CCF), a new surface parameter called profile (or topography) difference, Ds, has been developed for

High Degree of Crystalline Perfection in Spontaneously Grown GaN Nanowires

January 1, 2006

Author(s)

Kristine A. Bertness, Alexana Roshko, Albert Davydov, Igor Levin, Mark D. Vaudin, Joy Barker, John B. Schlager, Norman Sanford, Larry Robins

We have grown a variety of isolated GaN nanowires using gas-source molecular beam epitaxy (MBE) and characterized their structural and optical properties. The

Source-Assisted Direction Estimation Inside Buildings

January 1, 2006

Author(s)

Kamran Sayrafian, D Kaspar

We have implemented a quantum key distribution (QKD) system with polarization encoding at 850 nm over 1 km of optical fiber. The high-speed management of the

A Measurement-Based Multisine Design Procedure

January 1, 2006

Author(s)

M. Myslinski, Kate Remley, Michael McKinley, Dominique Schreurs, Bart Nauwelaers

This work presents a procedure to design a multisine with probability density function (PDF) similar to that of a measured realistic digitally modulated signal

A Multi-Phasic Continuum Damage Mechanics Model of Mechanically Induced Increased Permeability in Tissues

December 30, 2005

Author(s)

Brian O'Neill, Timothy P. Quinn, Victor F. Frankel, King C. Li

Recently, we have reported enhanced permeability of tissues due to in vivo treatment with pulsed high intensity focused ultrasound (pHIFU). This new therapy has

Tailored Nanoscale Contrast Agents for Magnetic Resonance Imaging

December 30, 2005

Author(s)

Alexander J. Barker, Brant Cage, Stephen E. Russek, Ruchira Garg, R Shandas, Conrad Stoldt

Two potential molecular imaging vectors are investigated for material properties and magnetic resonance imaging (MRI) contrast improvement. Monodisperse

Multiscale Modeling of Germanium Quantum Dots in Silicon

December 30, 2005

Author(s)

Vinod Tewary, David T. Read

A method is described for multiscale modeling of a quantum dot in a semiconductor containing a free surface. The method is based upon the use of the lattice

Electromagnetic Signatures of WLAN Cards and Network Security

December 21, 2005

Author(s)

Catherine A. Remley, Chriss A. Grosvenor, Robert T. Johnk, David R. Novotny, Paul D. Hale, Michael McKinley, Emmanouil Antonakakis, A Karygiannis

The proliferation of wireless devices and the availability of new wireless applications and services raise new privacy and security concerns. Although network

Electromagnetic Signatures of Wireless Local Area Network Cards: Implementation Issues and Detection in the Presence of Interferers

December 21, 2005

Author(s)

K. Remley, Robert Johnk, Tom T. Karygiannis, Emmanouil Antonakakis

This work investigates a measurement method for detecting the radio-frequency electromagnetic characteristics of an individual 802.11b wireless local-area

The Role of Semantic Roles in Disambiguating Verb Senses

December 19, 2005

Author(s)

Hoa T. Dang, Martha S. Palmer

We describe an automatic Word Sense Disambiguation (WSD) system that disambiguates verb senses using syntactic and semantic features that encode information

Assessment of Resolution and Dynamic Range for Digital Cinema

December 12, 2005

Author(s)

Charles D. Fenimore, A I. Nikolaev

The proponents of digital cinema seek picture quality exceeding that of the best film-based presentation. Quantifying the performance of systems for the

Microhotplate-Based Sensor Platform for Submicron SoC Designs

December 9, 2005

Author(s)

Muhammad Y. Afridi, Allen R. Hefner Jr., Jon C. Geist, Colleen E. Hood, Ankush Varma, Bruce Jacob

Silicon Nanowire Field Effect Transistor Test Structures Fabricated by Top-down Approaches

December 9, 2005

Author(s)

Sang-Mo Koo, Qiliang Li, Monica D. Edelstein, Curt A. Richter, Eric M. Vogel

Three-dimensional Scanning Optical Tweezers

December 5, 2005

Author(s)

Thomas W. LeBrun, T W. Hwang, I Y. Park, Jun-Feng Song, Yong-Gu Lee, Nicholas G. Dagalakis, Cedric V. Gagnon, Arvind K. Balijepalli

There are several new tools for manipulating microscopic objects. Among them, optical tweezers (OT) has two distinguishing advantages. Firstly, OT can easily

High-Bandwidth Coaxial PWB Transmission Line Probe

December 5, 2005

Author(s)

Nicholas Paulter, Robert H. Palm, Dwight D. Barry

The design and test of a wide bandwidth (3 dB attenuation bandwidth > 20 GHz) , 50 ohm , coaxial probe for the electrical characterization of printed wiring