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Conferences

Power Dependence of the Shift Caused by Spurious Spectral Components in Atomic Fountain

January 1, 2006

Author(s)

F Levi, Jon H. Shirley, Thomas P. Heavner, Dai Yu, Steven R. Jefferts

Spectroscopy of ¹⁷⁴Yb in a one-dimensional optical lattice

January 1, 2006

Author(s)

C Hoyt, Zeb Barber, Christopher W. Oates, A. V. Taichenachev, V. I. Yudin, Leo W. Hollberg

TheoH Bias-Removal Method

January 1, 2006

Author(s)

David A. Howe, J Mcgee-taylor, Tiffany Tassett

Frequency Biases in Pulsed Atomic Fountain Frequency Standards Due to Spurious Components in the Microwave Spectrum

January 1, 2006

Author(s)

Thomas P. Heavner, Jon H. Shirley, F Levi, Dai Yu, Steven R. Jefferts

Low Phase Noise Amplifier and Oscillator Using Feed-Forward Technique at 10 GHz

January 1, 2006

Author(s)

Archita Hati, Craig W. Nelson, David A. Howe

Comparison of AM noise in commercial amplifiers and oscillators at X-band

January 1, 2006

Author(s)

Archita Hati, David A. Howe, Craig W. Nelson

Towards Sub-10^-16 Trans-Continental GPS Carrier-Phase Frequency Transfer: a Simulation Study

January 1, 2006

Author(s)

C Hackman, Judah Levine

Optical Metrology for LEDs and Solid State Lighting

January 1, 2006

Author(s)

Yoshihiro Ohno

A Spectrally Tunable LED Sphere Source Enables Accurate Calibration of Tristimulus Colorimeters

January 1, 2006

Author(s)

Irena Fryc, Steven W. Brown, Yoshihiro Ohno

Uncertainties of Spectral Responsivity Measurements

January 1, 2006

Author(s)

George P. Eppeldauer, G Sauter, J L. Gardner

Development of the NIST Detector-based Color Temperature Scale

January 1, 2006

Author(s)

George P. Eppeldauer, Yoshihiro Ohno

Measuring Color Quality of Light Sources

January 1, 2006

Author(s)

Wendy L. Davis

Evaluation of Colour Difference Formulae for Colour Rendering Metrics

January 1, 2006

Author(s)

Wendy L. Davis, Yoshihiro Ohno

Development of a Color Quality Scale

January 1, 2006

Author(s)

Wendy L. Davis, Yoshihiro Ohno

NIST ²²²Rn emission standards

January 1, 2006

Author(s)

Peter Volkovitsky

High speed photon counting techniques for broadband quantum key distribution

January 1, 2006

Author(s)

Daniel Rogers, Joshua C. Bienfang, A Mink, B J. Hershman, A Nakassis, X Tang, L Ma, D H. Su, Carl J. Williams, Charles W. Clark

Free space quantum cryptography in the H-alpha Fraunhofer window

January 1, 2006

Author(s)

Daniel Rogers, Joshua C. Bienfang, A Mink, B J. Hershman, A Nakassis, X Tang, L Ma, D H. Su, Carl J. Williams, Charles W. Clark

EUV testing of multilayer mirrors: critical issues

January 1, 2006

Author(s)

Shannon B. Hill, I Ermanoski, Steven E. Grantham, Charles S. Tarrio, Thomas B. Lucatorto, T. E. Madey, Sasa Bajt, M Chandhok, P Yan, Obert Wood, S Wurm, N V. Edwards

A Bayesian approach to tomography of multiply scattered beams, ed. by A. Bouman, E.L. Miller and I. Pollack

January 1, 2006

Author(s)

Zachary H. Levine

Narrow band EUV multilayer coating for the MOSES rocket,

January 1, 2006

Author(s)

S M. Owens, J S. Gum, Charles S. Tarrio, S Grantham, J A. Dvorak, B Kjornrattanawanich, R Keski kuha, R J. Thomas, C C. Kankelborg

Enhanced Capabilities of the NIST Fiber Probe for Microfeature Metrology

January 1, 2006

Author(s)

Bala Muralikrishnan, Jack A. Stone Jr., John R. Stoup

We have previously reported work in the area of fiber probe development at NIST for micro feature measurement. This probe, which we refer to as the Fiber

Quantitative, Interactive Measurement of Tissue Engineering Scaffold Structure Using Immersive Visualization

January 1, 2006

Author(s)

Jeffrey Fagan, Erik K. Hobbie, Brian Landi, Idan Mandelbaum, Vardhan Bajpai, Barry J. Bauer, Kalman D. Migler, Jeffrey R. Simpson, Angela R. Hight Walker, Ryan Raffaelle

At NIST, we are using new approaches to better understand and quantify the structure of tissue engineering scaffolds. This approach uses immersive visualization

Quantum Key Distribution System Operating at Sifted key Rate Over 4 Mbits/s

January 1, 2006

Author(s)

X Tang, L J. Ma, Alan Mink, T Nakassis, Haitan Xu, B J. Hershman, Joshua Bienfang, D Su, R F. Bosivert, Charles W. Clark, Carl J. Williams

Correlation of Topography Measurements of NIST SRM 2460 Standard Bullets by Four Techniques

January 1, 2006

Author(s)

Jun-Feng Song, Theodore V. Vorburger, Thomas Brian Renegar, Hyug-Gyo Rhee, A Zheng, L Ma, John M. Libert, Susan M. Ballou, B Bachrach, K Bogart

Three optical instruments including an interferometric microscope, a Nipkow disk confocal microscope and a laser scanning confocal microscope are used for the

Nano- and Atomic-Scale Length Metrology

January 1, 2006

Author(s)

Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, Ndubuisi George Orji, Shaw C. Feng, Michael W. Cresswell, Richard A. Allen, William F. Guthrie, Wei Chu

We discuss nano-scale length metrology of linewidth, step height, and line edge roughness (LER). These properties are of growing importance to the function and

Topography Measurements and Applications

January 1, 2006

Author(s)

Jun-Feng Song, Theodore V. Vorburger

Based on auto- and cross-correlation functions (ACF and CCF), a new surface parameter called profile (or topography) difference, Ds, has been developed for

Source-Assisted Direction Estimation Inside Buildings

January 1, 2006

Author(s)

Kamran Sayrafian, D Kaspar

We have implemented a quantum key distribution (QKD) system with polarization encoding at 850 nm over 1 km of optical fiber. The high-speed management of the

A Measurement-Based Multisine Design Procedure

January 1, 2006

Author(s)

M. Myslinski, Kate Remley, Michael McKinley, Dominique Schreurs, Bart Nauwelaers

This work presents a procedure to design a multisine with probability density function (PDF) similar to that of a measured realistic digitally modulated signal

High Rate Tensile Strength Measurements of Frangible Bullets Using a Kolsky Bar

January 1, 2006

Author(s)

S P. Mates, Richard L. Rhorer, S Banovic, Eric P. Whitenton, Richard J. Fields

The tensile strength of frangible bullets is measured by a high rate diametral compression test (DCT) performed with a Kolsky Bar. Frangible bullets, meant to

Force Calibration Via Electrostatics

January 1, 2006

Author(s)

Jon R. Pratt, John A. Kramar, Gordon A. Shaw, Lee Kumanchik

We describe the electrical and length measurements necessary to realize micronewton forces in a fashion consistent with the International System of Units (SI)

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