Microstructure-Controlled Multilayer PZT Actuators: Effects of Cyclic Actuation on Crystallographic Structure

Published

November 28, 2005

Author(s)

Jens Mueller, Stephanie A. Hooker, Davor Balzar

Abstract

In this study, multilayered PbTixZr1-xO3 (PZT) samples (produced at sintering temperatures in the range of 1175 degrees C ¿ 1325 degrees C) were electrically fatigued by long-term exposure (10⁶ cycles) to electric fields and the parameters of initial and remnant polarization were estimated. Changes in the crystallographic microstructure as a function of sintering temperature T_s were examined by scanning electron microscopy (SEM) and X-ray diffraction (XRD) to gain insight on fatigue mechanisms and their prevention. Results showed that domain wall movement was facilitated in samples processed at lower T_s (less than 1250 degrees C), and that such samples were more resistant to electrical fatigue.

Proceedings Title

2005 MRS Fall Meeting Proceedings

Conference Dates

November 28-December 2, 2005

Conference Location

Boston, MA, USA

Conference Title

2005 MRS Fall Meeting

Pub Type

Conferences

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DOI Link

Keywords

electrical fatigue, microstructure, PZT

Citation

Mueller, J. , Hooker, S. and Balzar, D. (2005), Microstructure-Controlled Multilayer PZT Actuators: Effects of Cyclic Actuation on Crystallographic Structure, 2005 MRS Fall Meeting Proceedings, Boston, MA, USA, [online], https://doi.org/10.1557/PROC-0888-V08-03 (Accessed October 17, 2025)