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Conferences

Nano- and Atomic-Scale Length Metrology

Author(s)
Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, Ndubuisi George Orji, Shaw C. Feng, Michael W. Cresswell, Richard A. Allen, William F. Guthrie, Wei Chu
We discuss nano-scale length metrology of linewidth, step height, and line edge roughness (LER). These properties are of growing importance to the function and

Information Modeling and Model Implementation

Author(s)
Yung-Tsun Lee, Charles R. McLean, Yan Luo
Today?s manufacturing industry greatly relies on computer technology to support activities throughout a product?s life cycle. Effective and efficient

Topography Measurements and Applications

Author(s)
Jun-Feng Song, Theodore V. Vorburger
Based on auto- and cross-correlation functions (ACF and CCF), a new surface parameter called profile (or topography) difference, Ds, has been developed for

High Degree of Crystalline Perfection in Spontaneously Grown GaN Nanowires

Author(s)
Kristine A. Bertness, Alexana Roshko, Albert Davydov, Igor Levin, Mark D. Vaudin, Joy Barker, John B. Schlager, Norman Sanford, Larry Robins
We have grown a variety of isolated GaN nanowires using gas-source molecular beam epitaxy (MBE) and characterized their structural and optical properties. The

A Measurement-Based Multisine Design Procedure

Author(s)
M. Myslinski, Kate Remley, Michael McKinley, Dominique Schreurs, Bart Nauwelaers
This work presents a procedure to design a multisine with probability density function (PDF) similar to that of a measured realistic digitally modulated signal

Force Calibration Via Electrostatics

Author(s)
Jon R. Pratt, John A. Kramar, Gordon A. Shaw, Lee Kumanchik
We describe the electrical and length measurements necessary to realize micronewton forces in a fashion consistent with the International System of Units (SI)

Tailored Nanoscale Contrast Agents for Magnetic Resonance Imaging

Author(s)
Alexander J. Barker, Brant Cage, Stephen E. Russek, Ruchira Garg, R Shandas, Conrad Stoldt
Two potential molecular imaging vectors are investigated for material properties and magnetic resonance imaging (MRI) contrast improvement. Monodisperse

Electromagnetic Signatures of WLAN Cards and Network Security

Author(s)
Catherine A. Remley, Chriss A. Grosvenor, Robert T. Johnk, David R. Novotny, Paul D. Hale, Michael McKinley, Emmanouil Antonakakis, A Karygiannis
The proliferation of wireless devices and the availability of new wireless applications and services raise new privacy and security concerns. Although network

Three-dimensional Scanning Optical Tweezers

Author(s)
Thomas W. LeBrun, T W. Hwang, I Y. Park, Jun-Feng Song, Yong-Gu Lee, Nicholas G. Dagalakis, Cedric V. Gagnon, Arvind K. Balijepalli
There are several new tools for manipulating microscopic objects. Among them, optical tweezers (OT) has two distinguishing advantages. Firstly, OT can easily

High-Bandwidth Coaxial PWB Transmission Line Probe

Author(s)
Nicholas Paulter, Robert H. Palm, Dwight D. Barry
The design and test of a wide bandwidth (3 dB attenuation bandwidth > 20 GHz) , 50 ohm , coaxial probe for the electrical characterization of printed wiring
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