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Conferences

High Sensitivity Measurements of the Scattering Dispersion of Phantoms using Spectral Domain Optical Coherence Tomography

January 26, 2006

Author(s)

Shellee D. Dyer, Tasshi Dennis, Paul A. Williams, Lara Roberson, Shelley M. Etzel, Robert J. Espejo, Thomas Germer, T E. Milner

We demonstrate a novel technique to determine the size of Mie scatterers with high sensitivity. Our technique is based on spectral domain optical coherence

Noise model for polarization-sensitive Optical Coherence Tomography

January 26, 2006

Author(s)

Paul A. Williams, Nate J. Kemp, David Ives, Jesung Park, Dwelle C. Jordan, H. Grady Rylander, Thomas E. Milner

Characterizing and quantifying noise sources in birefringence imaging with polarization-sensitive optical coherence tomography (PS-OCT) is necessary for the

A Novel Hemispherical Spectro-Polarimetric Scattering Instrument for Skin Lesion Imaging

January 22, 2006

Author(s)

Bruno Boulbry, Thomas A. Germer, J C. Ramella-Roman

We present a novel spectro-polarimetric instrument based on hemispherical backscattering for the assessment of superficial skin lesions. The system is capable

Development of a solid-state 100 mK refrigerator for user-supplied microelectronics

January 4, 2006

Author(s)

Nathan A. Tomlin, William Duncan, James A. Beall, Gene C. Hilton, Kent D. Irwin, Dan Schmidt, Joel Ullom

Solid-state refrigerators based on normal metal/insulator/superconductor tunnel junctions are now a practical means of cooling from pumped 3He bath temperatures

Discrete Fourier Series Approximation to Periodic Solutions of Autonomous Delay Differential Equations

January 2, 2006

Author(s)

David E. Gilsinn

We begin this expository essay by reviewing with examples what a typical engineer already knows about statistics. We then consider a central question in

A Single Discharge Study of Micro-EDM

January 1, 2006

Author(s)

Shawn P. Moylan

Micro-Electro-Discharge Machining (micro-EDM) is gaining in popularity within the micro- and meso-scale machining community. The process is very well suited to

The Effect of Gaussian Filter Long Wavelength Cutoff in Topography Comparisons and Measurements

January 1, 2006

Author(s)

Jun-Feng Song, Lijun Ma, Theodore V. Vorburger

Five parameters are used for 2D and 3D topography comparisons and measurements, those include two correlation parameters Ds and CCFmax , and three surface

Recent Developments in the Standardization and Testing of Laser Trackers

January 1, 2006

Author(s)

Daniel S. Sawyer, Steven D. Phillips, Bruce R. Borchardt, William T. Estler

Calibration Reproductibility Test for NIST's No. 3581 Standard Rockwell Diamond Indenter

January 1, 2006

Author(s)

Jun-Feng Song, Samuel R. Low III, A Zheng

Standard Rockwell diamond indenter plays an important role for a worldwide unified Rockwell hardness scale. In 1994, NIST established a microform calibration

Optimizing Machining Processes for Precision: An Example using calculated cutting forces

January 1, 2006

Author(s)

Richard L. Rhorer

A common machining problem is to find the maximum material rate possible by adjusting the cutting speed, width of cut, and depth of cut for a given process

Mini-Fizeau Interferometer for Curvature Sensing in the NIST Geometry Measuring Machine

January 1, 2006

Author(s)

Quandou (. Wang, Ulf Griesmann

We describe the design of a miniature Fizeau interferometer, which is intended to be an accurate curvature sensor for the NIST Geometry Measuring (GEMM), which

Calibration of Microfabricated Cantilevers for SI-Traceable Small Force Measurement

January 1, 2006

Author(s)

Gordon A. Shaw, Jon R. Pratt, John A. Kramar

A procedure is described by which the spring constant of a microfabricated cantilever beam can be calibrated for the measurement of small forces in an atomic

SI Realization of Small Forces Using an Electrostatic Force Balance

January 1, 2006

Author(s)

Jon R. Pratt, John A. Kramar

We describe the realization of micronewton forces in a fashion consistent with the International System of Units (SI) using the National Institute of Standards

2005 Conference on IEEE-1588 Standard for a Precision Clock Synchronization Protocol for Networked Measurement and Control Systems

January 1, 2006

Author(s)

Kang B. Lee, Hans Weibel, Dirk Mohl, J C. Eidson

The Third IEEE 1588 conference was hosted by the Zurich University of Applied Sciences in Winterthur, Switzerland on October 10-12, 2005. The National Institute

Use of Transfer Artifacts for Small Force Measurement

January 1, 2006

Author(s)

Gordon A. Shaw, Jon R. Pratt, Richard S. Gates, Mark Reitsma

In order for the atomic microscope (AFM) to be used in truly quantatitive studies, a basis within the international system of units (SI) must be established. In

New Reference Standards and Artifacts for Nanoscale Physical Property Characterization

January 1, 2006

Author(s)

Jon R. Pratt, John A. Kramar, Gordon A. Shaw, Richard S. Gates, Paul Rice, John M. Moreland

This paper provides an overview of calibration artifacts being developed at the National Institute of Standards and Technology (NIST) that are intended to aid

A Regenerative Frequency Comb

January 1, 2006

Author(s)

Huascar Ascarrunz, F L. Walls, Hati a, Craig W. Nelson, David A. Howe

High Throughput Measurement of Peel of a Pressure Sensitive Adhesive

January 1, 2006

Author(s)

P M. McGuiggan, James J. Filliben

The peel force of a pressure sensitive adhesive (PSA) tape is measured on a surface that varied linearly in temperature. As the tape is peeled from the surface

A Flexible System Framework for a Nanoassembly Cell Using Optical Tweezers

January 1, 2006

Author(s)

Arvind K. Balijepalli, Thomas W. LeBrun, Satyandra K. Gupta

The optical tweezers instrument is a unique tool for directed assembly of nanocomponents. In order to function as a viable nanomanufacturing tool, a software

Trapped Atomic Ions and Quantum Information Processing

January 1, 2006

Author(s)

David J. Wineland, Dietrich G. Leibfried, James C. Bergquist, R B. Blakestad, John J. Bollinger, Joseph W. Britton, J Chiaverini, Ryan Epstein, David Hume, Wayne M. Itano, John D. Jost, E Knill, Jeroen Koelemeij, Christopher Langer, R Ozeri, Rainer Reichle, Till P. Rosenband, T Schaetz, Piet Schmidt, Signe Seidelin, Nobuyasu Shiga, Janus Wesenberg

Absolute Optical Frequency Measurements with a Fractional Uncertainty at 1 {?} 10^-15

January 1, 2006

Author(s)

Jason Stalnaker, Scott A. Diddams, Kyoungsik Kim, Leo W. Hollberg, Thomas P. Heavner, Steven R. Jefferts, F Levi, Thomas E. Parker, James C. Bergquist, Wayne M. Itano, M J. Jensen, Luca Lorini, W Oskay, Tara M. Fortier