New Reference Standards and Artifacts for Nanoscale Physical Property Characterization

Published

January 1, 2006

Author(s)

Jon R. Pratt, John A. Kramar, Gordon A. Shaw, Richard S. Gates, Paul Rice, John M. Moreland

Abstract

This paper provides an overview of calibration artifacts being developed at the National Institute of Standards and Technology (NIST) that are intended to aid the accurate determination of nanoscale physical properties across a broad range of applications. We focus on three proposed reference standards: an SI traceable spring constant artifact for calibration of atomic force microscope cantilever stiffness in the nominal range between 0.02N/m and 0.2 N/m, a piezoresistive force sensor for SI calibration of micronewton level contact forces, and a torsional oscillator for the absolute measurement of thin-film magnetic moments on the order of 1 *A m^2.

Conference Dates

May 7-11, 2006

Conference Location

Boston, MA

Conference Title

NSTI Nanotechnology Conference and Trade Show 2006

Pub Type

Conferences

Keywords

Atomic force microscopy, cantilever spring constant measurement, magnetic moment measurement, standard references and practices.

Citation

Pratt, J. , Kramar, J. , Shaw, G. , Gates, R. , Rice, P. and Moreland, J. (2006), New Reference Standards and Artifacts for Nanoscale Physical Property Characterization, NSTI Nanotechnology Conference and Trade Show 2006, Boston, MA (Accessed March 3, 2025)