Shaw, G.
, Pratt, J.
, Gates, R.
and Reitsma, M.
(2006),
Use of Transfer Artifacts for Small Force Measurement, Proceedings of the Society for Experimental Mechanics Annual Meeting, St. Louis, MO
(Accessed October 10, 2025)
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Use of Transfer Artifacts for Small Force Measurement
Published
Author(s)
, , ,
Abstract
In order for the atomic microscope (AFM) to be used in truly quantatitive studies, a basis within the international system of units (SI) must be established. In order to do this, the microfabricated cantilevers typically used for AFM force measurements must be calibrated in a fashion directly traceable to the SI. This study shows two separate techniques for doing so utilizing direct traceable measurement of force and displacement made on a microfabricated cantilever. The use of this cantilever as a transfer artifact for AFM is also examined.Proceedings Title
Proceedings of the Society for Experimental Mechanics Annual Meeting
Conference Dates
June 4-8, 2006
Conference Location
St. Louis, MO
Conference Title
Society for Experimental Mechanics Annual Meeting
Pub Type
Conferences
Keywords
calibration, force, metrology, nanotechnology, scanning probe microscopy
Citation
Issues
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Created January 1, 2006, Updated February 19, 2017