Use of Transfer Artifacts for Small Force Measurement
Gordon A. Shaw, Jon R. Pratt, Richard S. Gates, Mark Reitsma
In order for the atomic microscope (AFM) to be used in truly quantatitive studies, a basis within the international system of units (SI) must be established. In order to do this, the microfabricated cantilevers typically used for AFM force measurements must be calibrated in a fashion directly traceable to the SI. This study shows two separate techniques for doing so utilizing direct traceable measurement of force and displacement made on a microfabricated cantilever. The use of this cantilever as a transfer artifact for AFM is also examined.
Proceedings of the Society for Experimental Mechanics Annual Meeting
, Pratt, J.
, Gates, R.
and Reitsma, M.
Use of Transfer Artifacts for Small Force Measurement, Proceedings of the Society for Experimental Mechanics Annual Meeting, St. Louis, MO
(Accessed February 26, 2024)