Shaw, G.
, Pratt, J.
, Gates, R.
and Reitsma, M.
(2006),
Use of Transfer Artifacts for Small Force Measurement, Proceedings of the Society for Experimental Mechanics Annual Meeting, St. Louis, MO
(Accessed March 21, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Use of Transfer Artifacts for Small Force Measurement
Published
Author(s)
, , ,
Abstract
In order for the atomic microscope (AFM) to be used in truly quantatitive studies, a basis within the international system of units (SI) must be established. In order to do this, the microfabricated cantilevers typically used for AFM force measurements must be calibrated in a fashion directly traceable to the SI. This study shows two separate techniques for doing so utilizing direct traceable measurement of force and displacement made on a microfabricated cantilever. The use of this cantilever as a transfer artifact for AFM is also examined.Proceedings Title
Proceedings of the Society for Experimental Mechanics Annual Meeting
Conference Dates
June 4-8, 2006
Conference Location
St. Louis, MO
Conference Title
Society for Experimental Mechanics Annual Meeting
Pub Type
Conferences
Keywords
calibration, force, metrology, nanotechnology, scanning probe microscopy
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 2006, Updated February 19, 2017