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Conferences

Millimeter-Wave Highly-Multipath Channel Measurements

Author(s)
Alec J. Weiss, Joshua M. Kast, Robert D. Jones, Jeanne T. Quimby, Rodney W. Leonhardt, Benjamin F. Jamroz, Peter G. Vouras, Dylan F. Williams, Catherine A. Remley
We provide the frequency response of a high multipath propagation channel using a narrow beamwidth synthetic aperture measurement technique from 26.5 – 40 GHz.

Implementing Grain Traceability Standards: CART and Simulation

Author(s)
Frank H. Riddick, Evan K. Wallace, Scott Nieman, Joe Tevis, R. A. Ferreyra
To ensure food safety, food manufacturers need the ability to quickly identify and trace food products to all equipment and processes throughout the entire

TMPS: Ticket-Mediated Password Strengthening

Author(s)
John M. Kelsey, Dana Dachman-Soled, Meltem Sonmez Turan, Sweta Mishra
We introduce the notion of Ticket-Mediated Password Strengthening (TMPS), a technique for allowing users to derive keys from passwords while imposing a strict

A Science Gateway for Atomic and Molecular Physics

Author(s)
Barry I. Schneider, Klaus Bartschat, Oleg Zatsarinny, Igor Bray, Fernando Martin, Armin Scrinzi, Sudhakar Pamidighantam, Jonathan Tennyson, Jimena Gorfinkiel, Markus Klinker
We describe the creation of a new Atomic and Molecular Physics science gateway (AMPGateway). The gateway is designed to bring together a subset of the AMP

On Upper Bounds for D2D Group Size

Author(s)
David W. Griffith, Aziza Ben Mosbah
In this paper, we examine the Physical Sidelink Discovery Channel (PSDCH) for out-of-coverage (OOC) Device-to-Device (D2D) Long Term Evolution (LTE) networks

Enhancing LAA Co-existence Using MIMO Under Imperfect Sensing

Author(s)
Somayeh Mosleh, Yao Ma, Jason B. Coder, Erik Perrins, Lingjia Liu
To meet the ever growing wireless network demands, in terms of subscribers and data throughput, operating long term evolution (LTE) in unlicensed bands, also

DIGITAL TWIN FOR SMART MANUFACTURING: THE SIMULATION ASPECT

Author(s)
Guodong Shao, Sanjay Jain, Christoph Laroque, Loo Hay Lee, Peter Lendermann, Oliver Rose
The purpose of this panel is to discuss the state of the art in digital twin for manufacturing research and practice from the perspective of the simulation

Infrastructure for Model Based Analytics for Manufacturing

Author(s)
Sanjay Jain, Anantha Narayanan Narayanan, Yung-Tsun T. Lee
Multi-resolution simulation models of manufacturing system, such as the virtual factory, coupled with analytics offer exciting opportunities to manufacturers to