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PUBLICATIONS

BRDF measurements of ultra-black materials with THz quantum cascade lasers

Published

Author(s)

Patrick McArdle, Bradley Pelz, Christopher Yung, Nathan Tomlin, John Lehman, Michelle Stephens

Abstract

In this work we describe the use of a THz quantum cascade laser (QCL) to perform bi-directional reflectance distribution (BRDF) measurements. In particular we are interested in the reflectance properties of ultra-black absorbers for use in detector devices. Understanding how much radiation reflection is occurring (Directional-Hemispherical reflectance (DHR)), and the angular distribution of reflected radiation are important in device design criteria and in reducing reflection uncertainties. A fully characterized BRDF can be used to fully determine the reflection characteristics, which is ideal for assessing and optimizing ultra-black coatings. In this work we will demonstrate our capacity to measure a THz BRDF with the final goal being the THz characterization of small area vertically aligned carbon nanotube (VACNT) microbolometers.
Proceedings Title
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVIII
Conference Dates
January 26-31, 2025
Conference Location
San Francisco, CA, US
Conference Title
SPIE: Photonics West
Pub Type
Conferences
Metrology

Citation

McArdle, P. , Pelz, B. , Yung, C. , Tomlin, N. , Lehman, J. and Stephens, M. (2025), BRDF measurements of ultra-black materials with THz quantum cascade lasers, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVIII, San Francisco, CA, US (Accessed October 10, 2025)

Issues

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Created March 19, 2025, Updated May 27, 2025
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