McArdle, P.
, Pelz, B.
, Yung, C.
, Tomlin, N.
, Lehman, J.
and Stephens, M.
(2025),
BRDF measurements of ultra-black materials with THz quantum cascade lasers, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVIII, San Francisco, CA, US
(Accessed June 21, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
BRDF measurements of ultra-black materials with THz quantum cascade lasers
Published
Author(s)
, , , , ,
Abstract
In this work we describe the use of a THz quantum cascade laser (QCL) to perform bi-directional reflectance distribution (BRDF) measurements. In particular we are interested in the reflectance properties of ultra-black absorbers for use in detector devices. Understanding how much radiation reflection is occurring (Directional-Hemispherical reflectance (DHR)), and the angular distribution of reflected radiation are important in device design criteria and in reducing reflection uncertainties. A fully characterized BRDF can be used to fully determine the reflection characteristics, which is ideal for assessing and optimizing ultra-black coatings. In this work we will demonstrate our capacity to measure a THz BRDF with the final goal being the THz characterization of small area vertically aligned carbon nanotube (VACNT) microbolometers.Proceedings Title
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVIII
Conference Dates
January 26-31, 2025
Conference Location
San Francisco, CA, US
Conference Title
SPIE: Photonics West
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created March 19, 2025, Updated May 27, 2025